G01N21/636

Differential Excitation Raman Spectroscopy
20170299512 · 2017-10-19 ·

Raman instrumentation for detecting for the presence of a molecular species in a including: a source of radiation for pumping the sample; apparatus for controlling the frequency and pulse width of radiation from the pumping source; a Raman spectrometer including a detector and means for collecting scattered photons from the sample; a radiation source for probing the sample; means for directing radiation from the probing source to the sample; and means to interface the spectrometer with the source of radiation for pumping. The radiation source for probing is, preferably, a monochromatic light source emitting radiation in at least one of the group including UV, visible, and near infrared radiation and, preferably, in the range of 220-1080 nm. The photons collected from the sample include elastically and inelastically scattered photons, and the spectrometer further including means for rejecting the elastically scattered photons. The pumping source is a microwave source.

High temperature high pressure (HTHP) cell in sum frequency generation (SFG) spectroscopy for oil/brine interface analysis with salinity control system

A pressure cell includes a metal pressure chamber, a heating stage, disposed in the interior of the metal pressure chamber, that heats the liquid sample, a chamber pump, connected to the interior of the metal pressure chamber, that pressurizes the interior of the metal pressure chamber, a salinity control system including a membrane coupled to the sample inlet, where the membrane is configured to reduce a salinity level of the liquid sample, and a controller that controls the chamber pump, the salinity control system, and the heating stage to control a pressure of the interior of the metal pressure chamber, a salinity level of the liquid sample, and a temperature of the liquid sample, respectively. The metal pressure chamber includes a liquid sample holder, a removable lid, a window in the removable lid, a sample inlet, and a sample outlet.

SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
20170284939 · 2017-10-05 · ·

A spectroscopic measurement apparatus includes a light source, an integrator, a spectroscopic detector, and an analysis unit. The integrator includes an internal space in which a measurement object is disposed, a light input portion for inputting light to the internal space, a light output portion for outputting light from the internal space, a sample attachment portion for attaching the measurement object, and a filter attachment portion for attaching a filter unit. The filter unit has a transmission spectrum in which an attenuation rate for excitation light is larger than an attenuation rate for up-conversion light, and attenuates the light output from the light output portion. The analysis unit analyzes luminous efficiency of the measurement object on the basis of the transmission spectrum data and the spectroscopic spectrum data acquired by the spectroscopic detector.

Device and method for measuring and imaging second harmonic and multi-photon generation scattered radiation

Embodiments of the subject invention relate to a method and apparatus for performing measurements using multiphoton or second harmonic generation (SHG) scattered radiation from a sample including a turbid (scattering) medium includes providing a beam of laser pulses from a laser source having high pulse energies and a repetition rate; splitting the beam of laser pulses into two or more partial beams and focussing and overlaying the partial beams on a sample including the turbid medium; and detecting multiphoton and second harmonic radiation scattered from the sample.

FULL-FIELD BRILLOUIN MICROSCOPY SYSTEMS AND METHODS
20220042908 · 2022-02-10 ·

A full-field microscopy method for detection of Brillouin-scattered light includes illuminating a two-dimensional plane in a sample with interrogating light having a first wavelength. Light emitted from the two-dimensional plane can be collected. The emitted light comprises Brillouin-scattered light resulting from interaction of the interrogating light with the sample. The Brillouin-scattered light can have a second wavelength shifted from the first wavelength. The collected light can be passed through a spectrally-selective assembly comprising a gas or vapor illuminated by pumping light. After the spectrally-selective assembly, the Brillouin-scattered light from multiple points in the two-dimensional plane in the sample can be simultaneously detected by an electro-optical sensor. In some embodiments, the spectrally-selective assembly can be altered by changing a wavelength or polarization of the pumping light to allow acquisition of a Brillouin spectrum.

Apparatus for Digital Infrared Detection and Methods of Use Thereof
20170241908 · 2017-08-24 ·

An apparatus has a transducer with a storage phosphor that is chargeable to emit light of a first wavelength in response to an excitation light of a second wavelength from an object scene, wherein the second wavelength is longer than the first wavelength. A digital light sensor is disposed to accumulate energy from the emitted light of the transducer and to generate a signal according to the accumulated energy. A charging illumination source is configured to direct a pulsed charging illumination of a third wavelength, shorter than the first wavelength, to the storage phosphor. A control logic processor is in signal communication with the digital light sensor and the charging illumination source and controls synchronization of the timing of pulsed charging illumination and energy acquisition and readout of the digital light sensor.

System and method for determining second order nonlinear susceptibility of material

A system for determining a second-order nonlinear susceptibility of a material includes a laser light source, a polarization modulator, a light collector, a polarization detector and a controller. The controller can obtain the second-order nonlinear susceptibility of the sample to be tested according to the test data. The system for determining the second-order nonlinear susceptibility of a material can directly test a material (block or film) with a thickness of hundreds of nanometers, and draw a second-order nonlinear susceptibility fitting curve of the material according to the test results of the optical system.

EDGE-COMPUTING WITH ENHANCED STANDOFF SENSORS
20220038185 · 2022-02-03 ·

A system senses analytes through one or more sensors that detect or measure a physical characteristic. The one or more sensor generate a spectroscopic-data signal corresponding to the detection. An edge device communicatively couples the one or more sensors that communicatively couples a wide-area network coupling a cloud service. The edge device includes a data acquisition device that receives spectroscopic data signals from the one or more sensor and a processor that processes the spectroscopic-data signals to identify an analyte. The edge device also includes a transceiver that transmits data identifying the analytes to the cloud service.

METHOD AND SYSTEM FOR MICROSCOPY
20170219489 · 2017-08-03 ·

A method of microscopy is disclosed. The method comprises directing a pulse of a pump optical beam to form an optical spot on a substance and measuring changes in a temperature-dependent or photo-excited property of the substance. The method further comprises analyzing the measured changes to distinguish between information pertaining to the property at a portion of the spot, and information pertaining to the property at other portions of the spot. A largest diameter of the portion of the spot is optionally and preferably less than a central wavelength of the pump optical beam.

Method for imaging or spectroscopy with a non-linear interferometer

A system and method is provided for imaging and/or spectroscopy involving generation of a first signal field and a first idler field, illumination of the object with the first idler field, generation of second signal field and a second idler field, combination of the first and second idler fields, such that the two fields are indistinguishable, combination of the first and second signal fields, such that the two fields interfere, first measurement of the interfered signal field by a detection means, one or more additional measurements of the interfered signal field, wherein for each additional measurement a different phase shift is generated in the setup, and wherein all measurements are carried out within the stability time of the setup, and calculation of a phase function.