An optical property measurement apparatus includes a pulse formation unit, a waveform measurement unit, and an optical system. The pulse formation unit is capable of changing a temporal waveform of pulsed light in accordance with a type of optical property to be measured. The waveform measurement unit measures a temporal waveform of the pulsed light output from a measurement object after being incident on the measurement object. The optical system has an attenuation unit with an attenuation rate with respect to one wavelength component constituting the pulsed light larger than an attenuation rate with respect to another wavelength component constituting the pulsed light. The optical system is capable of switching between a first state in which the attenuation unit is arranged on an optical path of the pulsed light output from the measurement object and a second state in which the attenuation unit is not arranged on the optical path.

A method of identifying a viral compound, which includes modulating a narrow linewidth laser over a range of frequencies to provide a modulated optical signal that includes a single optical sideband, optically focusing the modulated optical signal with the single optical sideband at a viral sample to excite the viral sample and stimulate an emission of photons therefrom, and detecting amplification of the optical sideband emanating from the viral sample indicating an emission of photons at an acoustic resonance of the viral sample.

Methods and apparatus for obtaining 3D imaging of tissue involve scanning a focused laser beam in xz planes to obtain a set of xz plane images spaced apart in a y direction. The xz plane images are processed to correct distortions and motions and combined to provide 3D image data. Surface flatting is optionally performed. Imaging may be performed using a femtosecond (fs) laser beam. Different components of light returning from the tissue may be detected and processed to yield plural co-registered images using different imaging modalities, for example, reflective confocal microscopy (RCM), two photon fluorescence (TPF) and second harmonic generation (SHG).

Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.

The disclosed technology generally relates to characterization of semiconductor structures, and more particularly to optical characterization of high-k dielectric materials. A method includes providing a semiconductor structure comprising a semiconductor and a high-k dielectric layer formed over the semiconductor, wherein the dielectric layer has electron traps formed therein. The method additionally includes at least partially transmitting an incident light having an incident energy through the high-k dielectric layer and at least partially absorbing the incident light in the semiconductor. The method additionally includes measuring a nonlinear optical spectrum resulting from the light having the energy different from the incident energy, the nonlinear optical spectrum having a first region and a second region, wherein the first region changes at a different rate in intensity compared to the second region. The method further includes determining from the nonlinear optical spectrum one or both of a first time constant from the first region and a second time constant from the second region, and determining a trap density in the high-k dielectric layer based on the one or both of the first time constant and the second time constant.

An optical output system includes: a first laser that outputs first light which is a pulse laser in response to input of a first signal; a second laser that outputs second light which is a pulse laser in response to input of a second signal; and an arithmetic unit that inputs the first signal and the second signal to the first laser and the second laser, wherein the arithmetic unit repeatedly inputs the first signal and the second signal with switching a variable delay value, which is a difference between a timing to input the first signal to the first laser and a timing to input the second signal to the second laser, in a plurality of ways.

A multimodal signal acquisition device and method, and a laser image system are provided. The multimodal signal acquisition device is configured to acquire a multimodal signal generated by a laser pulse that irradiates a sample and includes an independent-channel acquisition module and a spectral signal processing device. The independent-channel acquisition module is provided with multiple independent spectral signal acquisition channels, each of which corresponds to a spectral signal of a specific spectral range in the multimodal signal. Each of the spectral signal acquisition channels acquires the multimodal signal, filters the corresponding spectral signal of the specific spectral range from the multimodal signal, and sends the spectral signal to the spectral signal processing device. The spectral signal processing device is configured to receive the spectral signal acquired by each of the spectral signal acquisition channels and perform imaging and superposed output of each spectral signal.

A method and apparatus for analyzing a substance is disclosed. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface (to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.

A pressure cell includes a metal pressure chamber, a heating stage, disposed in the interior of the metal pressure chamber, that heats the liquid sample, a chamber pump, connected to the interior of the metal pressure chamber, that pressurizes the interior of the metal pressure chamber, a salinity control system including a membrane coupled to the sample inlet, where the membrane is configured to reduce a salinity level of the liquid sample, and a controller that controls the chamber pump, the salinity control system, and the heating stage to control a pressure of the interior of the metal pressure chamber, a salinity level of the liquid sample, and a temperature of the liquid sample, respectively. The metal pressure chamber includes a liquid sample holder, a removable lid, a window in the removable lid, a sample inlet, and a sample outlet.

Various approaches can be used to interrogate a surface such as a surface of a layered semiconductor structure on a semiconductor wafer. Certain approaches employ Second Harmonic Generation and in some cases may utilize pump and probe radiation. Other approaches involve determining current flow from a sample illuminated with radiation. Decay constants can be measured to provide information regarding the sample. Additionally, electric and/or magnetic field biases can be applied to the sample to provide additional information.