Systems and methods are described for rapid throughput of samples from a plurality of sample sources to a nebulizer for analysis, such as a sample analysis via ICP-MS. A system embodiment can include, but is not limited to, a valve in fluid communication with a fluid transfer line to receive a plurality of samples from a plurality of sample sources from an autosampler unit and direct the sample into a valve channel; a first pump to draw sample into the valve channel, a sensor positioned adjacent a nebulizer to detect respective samples of the plurality of samples and generate one or more signals in response thereto; a second pump to push the sample from the valve channel to the nebulizer; and a controller configured to coordinate operation of the first pump, the second pump, and the valve based at least on the one or more signals.

A flame atomic absorption spectrophotometer in which an angle of a burner can be manually adjusted and a rotation position of the burner can be easily obtained is provided. An atomization unit 12 burns mixed gas of fuel gas and supporting gas with a burner 121 to form flame, and atomizes a sample by spraying the sample into the flame. Alight source emits a measuring beam into the flame. A detector detects the measuring beam that has passed through the flame. A manual rotation mechanism (such as a gripper 124) allows the burner 121 to be manually rotated to change an angle of the burner 121 with respect to an optical path P of the measuring beam. A rotation position detection unit 125 detects a rotation position of the burner 121.

Provided is a spray chamber including a sample introduction port portion into which a gas flow containing sample droplets that have been atomized by a nebulizer is introduced, a discharge port portion that discharges at least a part of the gas flow introduced into the sample introduction port portion to the outside, and a flow passage tube portion that has the sample introduction port portion on one end portion thereof and the discharge port portion on the other end portion thereof and serves as a flow passage for the introduced gas flow, wherein the flow passage tube portion includes a first tube portion having the discharge port portion on one end portion thereof and a second tube portion having the sample introduction port portion on one end portion thereof, the spray chamber includes a double tube portion.

A sampling apparatus (100) employs a cell-positioning system to move a sample capture cell (138) relative to a specimen positioning system (124). The cell-positioning system may be controlled to move sample capture cell (138) opposite to movement of the specimen positioning system (124) to maintain alignment of the sample capture cell (138) with an optical path of a laser beam of a sample generator (108). Alternatively or additionally, the cell-positioning system may be controlled to move sample capture cell (138) in response to alignment deviation of a reference beam on a quadrant detector (404).

Apparatus, systems, and methods for identifying and quantifying chemical components in a high-melting-point liquid. One such method includes: receiving, into a nebulizer assembly, a high-melting-point liquid from a molten liquid conduit; aerosolizing, using the nebulizer assembly, at least a portion of the received high-melting-point liquid; delivering, into one or more instruments, the aerosolized high-melting-point liquid from the nebulizer; and chemically analyzing, using the one or more instruments, the aerosolized high-melting-point liquid.

A laser ablation device is provided with: a laser light source that outputs a femtosecond pulse laser beam; an optical system that includes a first mirror rotatable about a first axis, a second mirror rotatable about a second axis, a first driving source for rotating the first mirror about the first axis, and a second driving source for rotating the second mirror about the second axis, and that reflects the laser beam from the laser light source toward a sample by the first mirror and the second mirror; and an irradiation controller that, on the basis of the two-dimensional coordinate position of an analysis position, controls the first driving source and the second driving source to irradiate the analysis position with the laser beam.

A torch for use in analytic instruments includes a tube subassembly with substantially cylindrical nested inner and outer tubes with coincident central axes, the inner tube having a terminus. The torch also includes a removable injector extending at least partially in the inner tube and having an alignment feature, an inlet, an outlet, and a central axis that is coincident with the central axes of the inner and outer tubes, a seal having a channel for accommodating a portion of the injector, and a base for supporting the tube subassembly, injector, and seal. The seal has a complementary feature to engage the alignment feature of the injector to prevent axial misalignment of the injector and maintain a fixed gap between the terminus of the inner tube and the outlet of the injector.

A system can include an exchangeable mounting structure having a visual marking or coloring and at least one physically associated sample introduction system component having an indicating mark or color matching the visual marking or coloring of the exchangeable mounting structure. The visual marking or colored corresponds to a sample analysis configuration for analyzing a particular sample type at an analytical instrument.

The invention relates to a method for the spectrometry, in particular mass spectrometry, ion-mobility spectrometry, or optical emission spectroscopy, of a sample, comprising the following steps: providing a solid-state generator for generating a high-frequency signal, having a control element for varying the power and/or frequency of the signal, providing a plasma ignition head fed by the signal for generating a plasma jet, applying the plasma jet to a sample, performing a first measuring operation, wherein the plasma jet is generated with a first power of the solid-state generator and a spectrum emitted by the sample, preferably charged ions and/or optical spectrum, is recorded by means of a spectrometer, wherein the first power leads to a soft ionization of the sample, and performing a second measuring operation on the same sample, wherein the plasma jet is generated with a second power of the solid-state generator and a spectrum emitted by the sample, preferably charged atoms and/or optical spectrum, is recorded by means of the spectrometer, wherein the second power leads to a hard ionization of the sample.

A sampling apparatus (100) employs a cell-positioning system to move a sample capture cell (138) relative to a specimen positioning system (124). The cell-positioning system may be controlled to move sample capture cell (138) opposite to movement of the specimen positioning system (124) to maintain alignment of the sample capture cell (138) with an optical path of a laser beam of a sample generator (108). Alternatively or additionally, the cell-positioning system may be controlled to move sample capture cell (138) in response to alignment deviation of a reference beam on a quadrant detector (404).