The present disclosure concerns a method and detector (10) for detecting an analyte (1) in a sample volume (2), such as nitrosamine in an amine solvent. The method comprises measuring a resonance Raman spectrum (I1) with a first light beam (PI) matching an electronic transition of the analyte (1). The detection of the analyte is enhanced by measuring an off-resonance Raman spectrum (12) using a second light beam (P2) that is shifted in wavelength at least 10 nm away from the electronic resonance. The resonance Raman signal (S1) of the analyte (1) is isolated from the background (Q1, Q2) by a difference analysis between the resonance and off-resonance Raman spectra (I1, I2). The method and detector (10) can be employed for detecting nitrosamine in a carbon capture process or plant (20) that employs an amine solvent.

A process for making a liquid detergent composition, the process including a step of passing the liquid detergent composition via Raman Spectroscopy apparatus.

A process for detecting oil or lubricant contamination in a manufactured product, the process comprising adding a fluorescent taggant to oils or lubricants contained in processing machinery for said product, conveying said product past an infrared detection apparatus, irradiating said product with infrared radiation from said detection apparatus as it passes the detection apparatus, and detecting infrared radiation emitted from said irradiated product.

The present invention provides an information processing apparatus comprising: an obtainer configured to, in a process of supplying a curable composition onto a substrate or a mold and forming a film of the curable composition in a space between the substrate and the mold, obtain the captured image of the curable composition; a generator configured to generate a predicted image representing a prediction result of a behavior of the curable composition on the substrate in the process; and a display controller configured to display, on a display unit, the captured image and the predicted image to be comparable to each other.

A device for measuring a strand that is tubular includes a first radiation source to emit terahertz radiation in a first measurement region from an inside onto an inner surface of the strand. A first radiation receiver receives terahertz radiation reflected by the strand in a second measurement region. A first evaluation apparatus determines at least one geometric parameter of the strand in the first measurement region. A second radiation source emits terahertz radiation in the second measurement region from an outside onto an outer surface of the strand. A second radiation receiver receives terahertz radiation reflected by the strand in the second measurement region. A second evaluation apparatus determines at least one geometric parameter of the strand in the second measurement region. A third evaluation apparatus determines a change in the at least one geometric parameter of the strand between the first and second measurement regions.

A method includes: sensing a defect on a cast strip surface, the cast strip being cast from molten metal or alloy by a casting system, determining an adjustment amount and/or direction of a casting system component based on the identified surface defect, and providing the adjustment amount and/or direction to an operator for adjustment of the casting system component and/or commanding that the casting system component be adjusted by the adjustment amount and/or direction.

The present disclosure provides a method for detecting etching defects of an etching equipment, belonging to the field of semiconductor manufacturing technology. The method includes: providing a test wafer, the test wafer including a substrate, a first dielectric layer and a second dielectric layer, the first dielectric layer and the second dielectric layer being sequentially formed on a top surface of the substrate, and capacitor contact structures being disposed in the substrate; transferring the test wafer to the etching equipment to be detected, and etching part of the second dielectric layer and part of the first dielectric layer to form capacitor holes; removing the second dielectric layer to form a measured wafer; transferring the measured wafer to a defect detection equipment and detecting the shapes of the capacitor holes of the measured wafer.

There is described an equipment and method for analysis of a fluid, suspension, solution, dispersion or fluid emulsion that automatically analyzes the characteristic properties of the samples of the fluids, such as paints, enamels, and dyes, among others, so that adjustments can be made to the fluid to meet the optical properties such as color, opacity, hue, saturation (tinting power), covering and luminosity, from the spectrometric measurement technique by transmission analysis of film having radiated fixed thickness.

A monitoring system for a bioreactor is disclosed. The monitoring system includes a cuvette arranged to receive a fluid from a bioreactor, wherein the fluid includes a portion of a biomass. The system further includes a light source arranged to project light, at wavelengths absorbable by the biomass, into the cuvette. A sensor is arranged to detect portions of the light that are not absorbed by the biomass. The system further includes a controller coupled to receive an indication of an amount of light detected by the sensor. The indication of the amount of detected light is usable to determine an amount of biomass in the cuvette.

A system includes a reflector attached to a liner of a processing chamber. A light coupling device is to transmit light, from a light source, through a window of the processing chamber directed at the reflector. The light coupling device focuses, into a spectrometer, light received reflected back from the reflector along an optical path through the processing chamber and the window. The spectrometer detects, within the focused light, a first spectrum representative of a deposited film layer on the reflector using reflectometry. An alignment device aligns, in two dimensions, the light coupling device with the reflector until maximization of the focused light received by the light coupling device.