An apparatus for transmitting and/or receiving terahertz, THz, radiation, comprising at least one terahertz element which is configured to generate and/or detect a THz signal, and at least one field-shaping element which in particular is assigned to the at least one terahertz element, wherein the at least one terahertz element is arranged in the region of a first surface of the field-shaping element.

An optical sensor system, comprising refractory plasmonic elements that can withstand temperatures exceeding 2500° C. in chemically aggressive and harsh environments that impose stress, strain and vibrations. A plasmonic metamaterial or metasurface, engineered to have a specific spectral and angular response, exhibits optical reflection characteristics that are altered by varying physical environmental conditions including but not limited to temperature, surface chemistry or elastic stress, strain and other types of mechanical load. The metamaterial or metasurface comprises a set of ultra-thin structured layers with a total thickness of less than tens of microns that can be deployed onto surfaces of devices operating in harsh environmental conditions. The top interface of the metamaterial or metasurface is illuminated with a light source, either through free space or via an optical fiber, and the reflected signal is detected employing remote detectors.

A method for measuring the radiant exposure of energy curable inks or coatings on a printing press. The steps for measuring comprise: a) providing an ink or coating material comprising a fluorescent probe; b) transferring the ink or coating material onto a substrate using a printing process; c) exposing the ink or coating material to actinic radiation capable of initiating cure of the ink or coating material that also alters the luminescence of the probe; d) exposing the ink or coating to a first source of excitation light with wavelength and luminance capable of absorption by the fluorescent probe; and e) measuring the emitted light from the fluorescent probe by a first detector.

An information processing apparatus includes a controller configured to execute first processing of providing an incentive to a first user who brings a first painting film to a predetermined base. The first painting film is a painting film including an easily peeling layer and that is peeled off from a first vehicle.

A defect inspection apparatus (100) is configured to approximate a difference value or an absolute value (Ia) of the difference value between a pixel value in at least three captured images (A) captured by an imager in at least three different phases of an elastic wave and a pixel value in a reference image (A.sub.ave) separate from the captured images (A) so as to acquire an approximate value for defect inspection corresponding to an amount of change in the pixel value in the captured images (A).

A resin composition quality controlling method includes a step of measuring a Raman spectrum of a resin composition composed of TiO.sub.2 particles dispersed in a base material mainly composed of a silicone rubber by irradiating the resin composition with laser, and a step of determining a concentration of the TiO.sub.2 particles in the resin composition based on an intensity of a fluorescence spectrum in the Raman spectrum.

The present invention is directed to a coated substrate including a substrate that is part of an aerospace, a wind turbine, or a marine structure; and an exterior coating on the substrate, the exterior coating including an icephobic or a low ice adhesion composition including an indicator that is an additive that is detectable or measurable as the exterior coating wears; wherein the indicator provides indicia of wear of the exterior coating; and a method of inspecting the exterior coating on the substrate.

Disclosed are methods for quantifying the cleanability of a surface of an article, for instance an aircraft interior component. In embodiments, a solution containing an artificial “dirt” is introduced to a surface under test to simulate a sullied condition. The sullied surface is subjected to at least one cleaning process. Obtained reference and post-cleaning light measurements are compared to determine a measurement difference corresponding to a cleanability of the surface and/or effectiveness of the at least one cleaning process. In embodiments, the measurement difference is assigned a cleanability score for at least one of determining a passing or failing cleanability, modifying the cleaning process, indicating the need for a second or subsequent cleaning, modifying the barrier coating formulation, redesigning the article, etc. The disclosed methods provide solutions for objective verification measures of surface cleanability used to facilitate new article designs, materials, barrier coatings, cleaning processes, cleaners, etc.

In an method for inspecting the coating of an electronic component, wherein the electronic component includes at least one electrical resistance element and wherein the layer thickness of at least one coating is determined thermographically, it is provided as essential to the invention that the electrical resistance element is contacted electrically, an electrical voltage is applied to the resistance element, the temperature of the electronic component in the area of the resistance element is captured as a function of time, and a conclusion is drawn about the layer thickness of the coating of the electronic component in the area of the resistance element based on the temperature variation over time.

Camera images may be utilized to detect substrate edges and provide information regarding the centering of the substrate within the fluid dispense system. Camera images may also be utilized to monitoring the location of a cup within the fluid dispense system. The signal processing techniques utilized may include data smoothing, analyzing only certain wavelengths of reflected energy, transforming the data (in one embodiment utilizing a Fourier transform), and/or analyzing a sub-set of the collected pixels of data. The camera image data collected herein may be combined with a wide variety of other data so as to better monitor, characterize and/or control a substrate processing process flow.