Patent classifications
G01N2021/8427
MULTIFUNCTIONAL BARRIER COATING FORMING SOLUTIONS AND METHODS FOR APPLYING AND DETECTING THE SAME
Disclosed are multifunctional barrier coating forming solutions for surface coating substrates, for instance interior surfaces in aircraft. In embodiments, the solutions include a base coating component in an amount from 5 to 40% by weight of the solution, a solvent in an amount from 50 to 70% by weight of the solution, an FST resistive component in an amount from 0.1 to 5% by weight of the solution, a UV resistive component in an amount from 0.1 to 2% by weight of the solution, an antimicrobial component in an amount from 0.1 to 5% by weight of the solution, and optionally a dye component in an amount less than 0.5% by weight of the solution. Also disclosed are methods for surface coating a substrate with a multifunctional barrier coating forming solution and detecting the same post application to determine a need for barrier coating reapplication.
Optical sample characterization
Optical sample characterization facilitates measurement and testing such as transmittance or reflectance at any discrete angle in a full range of angles of light propagation through a coated glass plate having a higher than air index of refraction. A rotatable assembly includes a cylinder having a hollow, and a receptacle including the hollow. The receptacle also contains a fluid having a refractive index matching the refractive index of the cylinder and coated plate. An optical light beam is input normal to the surface of the cylinder, travels through the cylinder, then via the index matching fluid through the coating, the coated glass plate, the fluid, the other side of the cylinder, and is collected for analysis. Due at least in part to the index matching fluid surrounding the coated plate, the plate can be rotated through a full range of angles (±90°, etc.) for full range testing of the coating.
SYSTEMS AND METHODS FOR THE IN-LINE MEASUREMENT OF ALKALI METAL-CONTAINING STRUCTURES AND ALKALI ION-CONTAINING STRUCTURES
Embodiments of the present disclosure generally relate to systems and methods for in-line measurement of alkali metal-containing structures or alkali ion-containing structures of, e.g., electrodes. In an embodiment, a system for processing an electrode is provided. The system includes a first processing chamber for forming an electrode comprising an alkali metal-containing structure. The system further includes a metrology station coupled to and in-line with the first processing chamber, the metrology station comprising: a source of radiation for delivering radiation to the alkali metal-containing structure, and an optical detector for receiving an emission of radiation emitted from the alkali metal-containing structure, and a processor configured to determine a characteristic of the alkali metal-containing structure of the electrode based on the emission of radiation.
INSPECTION SYSTEM AND METHOD FOR CONTROLLING INSPECTION SYSTEM
An inspection system for inspecting an object including a base and a coating layer includes: an emission unit configured to irradiate the object with a terahertz wave including at least a reference pattern; and a support unit configured to adjust a relative position between the emission unit and the object. The inspection system further includes: a detection unit configured to detect the terahertz wave reflected on the object and acquire a terahertz image; and a determination unit configured to determine, from a shape of the terahertz image, whether an incident angle of the terahertz wave on the object is a predetermined incident angle.
METHOD FOR MEASURING ELEMENT CONCENTRATION OF MATERIAL
A method for measuring an element concentration of a material includes: a material sample is irradiated with first electromagnetic waves; second electromagnetic waves radiated by the material sample are obtained under the action of the first electromagnetic waves; material property parameters of the material sample are determined by detecting the second electromagnetic waves; and an element concentration of the material sample is determined according to the material property parameters.
Coating quality prediction device and learned model generation method
The coating quality prediction device includes: a learned model that has learned a relationship between characteristics of a paint, conditions at a time of applying the paint, and a smoothness of a surface of a coating film obtained by applying the paint under the conditions; and a calculation unit that uses the learned model to calculate the smoothness of the surface of the coating film from the characteristics of the paint and the conditions at the time of applying the paint.
Gravure Coater Test Apparatus and Gravure Coater
A gravure coater test apparatus includes a gravure roll and a backup roll which are circumscribed to each other, a motor which drives the gravure roll partially submerged in a water-based pressure-sensitive adhesive for coating, a controller which adjusts the rotational speed of the motor, a doctor blade which is selected from a plurality of types to scrape the water-based pressure-sensitive adhesive from the surface of the gravure roll being rotated, and an infrared analyzer which allows at least one of the type of the water-based pressure-sensitive adhesive corresponding to the selected doctor blade, the uniformity of the coating surface, and the amount of the coated water-based pressure-sensitive adhesive to be confirmed.
Method for Simultaneously Determining Parameters of at Least One Resin Layer Applied to at Least One Carrier Material
Provided is a method for the simultaneous determination of parameters, in particular of at least two, three or four parameters, of at least one resin layer applied to at least one carrier material by recording and evaluating at least one NIR spectrum in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, more preferably between 900 nm and 1700 nm, and particularly advantageously between 1450 nm and 1550 nm, using at least one NIR measuring head, in particular at least one NIR multimeter head.
SYSTEMS AND METHODS FOR IDENTIFYING A COATING ON AN IMPLANT
Systems and methods of identifying a coating on a bone material are provided. The systems and methods comprise providing a bone material and a scanning device; adjusting a distance between the bone material and the scanning device; scanning the bone material using the scanning device; and transmitting a scanned data from the scanning device to a processor configured to analyze the scanned data, and display the analyzed scanned data to identify the coating on the bone material based on the scanned data when the coating meets or fails to meet a predetermined parameter.
Thin film spectroellipsometric imaging
A method and device of thin film spectroellipsometric imaging are disclosed. The device comprises an illuminator to direct light through a polarization generator system toward an extended area of a sample; an imaging system to form images; a detection system to record in a plurality of spectral channels; a computer to display and analyze the recorded images; and at least one reference phantom with known optical properties to replace the sample for calibration. The method comprises directing light from an illuminator through a polarization generator system toward an extended area of a sample having a geometrical shape; forming images with an imaging system; adjusting a polarization generator system and a polarization analyzer system to obtain a series of polarimetric setups; recording the images with a detection system in a plurality of spectral channels; replacing the sample with at least one reference phantom; and analyzing the recorded images with a computer.