A measurement method for a vertical cavity surface emitting laser diode (VCSEL) and an epitaxial wafer test fixture are provided, especially the Fabry-Perot Etalon of the bottom-emitting VCSEL can be measured. When the Fabry-Perot Etalon of the bottom-emitting VCSEL is measured by a measurement apparatus, a light of the test light source of the measurement apparatus is incident from the substrate surface of the VCSEL epitaxial wafer such that the Fabry-Perot Etalon of the bottom-emitting VCSEL is acquired. Through the VCSEL epitaxial wafer test fixture, the bottom-emitting VCSEL can be directly measured by the existing measurement apparatus such that there is no need to change the optical design of the measurement apparatus, and it can prevent the VCSEL epitaxial wafer from being scratched or contaminated.

A lithium ion-conductive solid electrolyte including a freestanding inorganic vitreous sheet of sulfide-based lithium ion conducting glass is capable of high performance in a lithium metal battery by providing a high degree of lithium ion conductivity while being highly resistant to the initiation and/or propagation of lithium dendrites. Such an electrolyte is also itself manufacturable, and readily adaptable for battery cell and cell component manufacture, in a cost-effective, scalable manner. An automated machine based system, apparatus and methods assessing and inspecting the quality of such vitreous solid electrolyte sheets, electrode sub-assemblies and lithium electrode assemblies can be based on spectrophotometry and can be performed inline with fabricating the sheet or web (e.g., inline with drawing of the vitreous Li ion conducting glass) and/or with the manufacturing of associated electrode sub-assemblies and lithium electrode assemblies and battery cells.

The continuity of a functional layer of a web (32, 60, 78) is assessed by forwarding the web, detecting (42, 63) the presence of the functional layer and a discontinuity and/or a thin region in the functional layer, and generating a signal in response to the discontinuity and/or thin region. The functional layer comprises a detectable component (360) in a thermoplastic composition. The detecting is carried out by a machine vision system capable of detecting the detectable component (360) in the functional layer. The detectable component (360) can be active or passive. Also included are systems for carrying out the process.

An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.

A manufacturing device is used for manufacturing a package including a resin sheet and a predetermined work wrapped with the resin sheet. The manufacturing device includes: a sealing unit that thermally welds overlapping parts of the sheet; and an inspection device that inspects a sealing quality of the sealed portion thermally welded by the sealing unit. The sealing unit makes, by the thermal welding, a thickness of the sealed portion after the thermal welding smaller than a total thickness of the overlapping parts prior to the thermal welding. The inspection device obtains thickness information on the thickness of the sealed portion and determines the sealing quality of the sealed portion based on the thickness information.

Embodiments of the present disclosure generally relate to systems and methods for in-line measurement of alkali metal-containing structures or alkali ion-containing structures of, e.g., electrodes. In an embodiment, a system for processing an electrode is provided. The system includes a first processing chamber for forming an electrode comprising an alkali metal-containing structure. The system further includes a metrology station coupled to and in-line with the first processing chamber, the metrology station comprising: a source of radiation for delivering radiation to the alkali metal-containing structure, and an optical detector for receiving an emission of radiation emitted from the alkali metal-containing structure, and a processor configured to determine a characteristic of the alkali metal-containing structure of the electrode based on the emission of radiation.

This application provides an apparatus and method for detecting tab folds, and an image analyzer. The apparatus for detecting tab folds includes: a first image obtaining module, configured to obtain a first image of a first lateral face of tabs of a battery cell; a second image obtaining module, configured to obtain a second image of a second lateral face of the tabs, where the second lateral face is different from the first lateral face; and an image analyzer, configured to obtain, based on the first image, a first number of layers of the tabs corresponding to the first lateral face, and obtain, based on the second image, a second number of layers of the tabs corresponding to the second lateral face, and determine, based on at least one of the first number of layers or the second number of layers, whether the tabs are in a folded state.

An apparatus (1) for inspecting an object, where the object is made up of a first layer of plastic material and a second layer of EVO or EVOH and has a base wall (A) and a side wall (B) which is inclined relative to the base wall (A), comprises: an inspection zone (10) in which the object can be placed for inspection; a conveyor (12) for feeding the object to the inspection zone (10) along a feed plane (P); an imaging device (14) configured to view the object positioned in the inspection zone (10) and to generate an image (143) of the object; a processor (151), configured to process the image (143), to inspect the second layer. The conveyor (12) is configured to dispose the object in the inspection zone (10) with the base wall (A) positioned according to a predetermined orientation relative to the feed plane (P).

A method of evaluating a laminate formed of two or more layers bonded to each other includes an image obtaining step of obtaining a two-dimensional image of the laminate; a detecting step of detecting air-pocket corresponding regions from a two-dimensional image; a characteristic value obtaining step of determining a characteristic value related to areas of the air-pocket corresponding regions; and an evaluation step of evaluating the laminate based on the characteristic value. is a method of evaluating a laminate.

A method and device of thin film spectroellipsometric imaging are disclosed. The device comprises an illuminator to direct light through a polarization generator system toward an extended area of a sample; an imaging system to form images; a detection system to record in a plurality of spectral channels; a computer to display and analyze the recorded images; and at least one reference phantom with known optical properties to replace the sample for calibration. The method comprises directing light from an illuminator through a polarization generator system toward an extended area of a sample having a geometrical shape; forming images with an imaging system; adjusting a polarization generator system and a polarization analyzer system to obtain a series of polarimetric setups; recording the images with a detection system in a plurality of spectral channels; replacing the sample with at least one reference phantom; and analyzing the recorded images with a computer.