A method of forming an enhanced super-resolution image is provided. The method includes: preparing a substrate comprising a glass substrate, a metal layer on the glass substrate, and a biolayer on the metal layer; placing a biological specimen on the substrate, the biological specimen being in contact with the biolayer and being attached to the metal layer through the biolayer, in which the biological specimen is labeled by a plurality of spontaneous blinking elements therein; irradiating a light beam to the metal layer via the glass substrate; receiving fluorescence signals emitted from the spontaneous blinking elements within a time period; fitting a plurality of functions respectively to each of the fluorescence signals; pinpointing peak positions of the functions; and reconstructing the peak positions to derive the enhanced super-resolution image of an underlying structure of the biological specimen in proximity to the metal layer.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced by the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.

A method for detecting inconsistencies in an assembly using an energy source and an imaging device is disclosed. An energy source directs energy through first scanning mirrors toward a surface of the laminated composite assembly raising an energy level of an inspection area. An imaging device directs a view through second scanning mirrors toward the inspection area and the imaging device detects a rate of change in energy at the surface of the laminated composite. Movement of the first scanning mirrors is synchronized with movement of the second scanning mirrors for directing a view of the imaging device to the inspection area after the energy level of the area of the surface has been raised. The imaging device detects dissipation of energy at the area of the surface being inspected and identifies inconsistencies associated defects in the assembly.

An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.

A method of forming an enhanced super-resolution image is provided. The method includes: preparing a substrate comprising a glass substrate, a metal layer on the glass substrate, and a biolayer on the metal layer; placing a biological specimen on the substrate, the biological specimen being in contact with the biolayer and being attached to the metal layer through the biolayer, in which the biological specimen is labeled by a plurality of spontaneous blinking elements therein; irradiating a light beam to the metal layer via the glass substrate; receiving fluorescence signals emitted from the spontaneous blinking elements within a time period; fitting a plurality of functions respectively to each of the fluorescence signals; pinpointing peak positions of the functions; and reconstructing the peak positions to derive the enhanced super-resolution image of an underlying structure of the biological specimen in proximity to the metal layer.

A measurement method for a vertical cavity surface emitting laser diode (VCSEL) and an epitaxial wafer test fixture are provided, especially the Fabry-Perot Etalon of the bottom-emitting VCSEL can be measured. When the Fabry-Perot Etalon of the bottom-emitting VCSEL is measured by a measurement apparatus, a light of the test light source of the measurement apparatus is incident from the substrate surface of the VCSEL epitaxial wafer such that the Fabry-Perot Etalon of the bottom-emitting VCSEL is acquired. Through the VCSEL epitaxial wafer test fixture, the bottom-emitting VCSEL can be directly measured by the existing measurement apparatus such that there is no need to change the optical design of the measurement apparatus, and it can prevent the VCSEL epitaxial wafer from being scratched or contaminated.

Quality control of an electrochromic device is described. A method may be subsequent to a stage of manufacturing of an electrochromic device. The method may include directing a current tinting state of the electrochromic device to correspond to a first tinting state and receiving sensor data associated with the directing of the current tinting state of the electrochromic device to correspond to the first tinting state. The method may further include determining, based on the sensor data, whether a corrective action is to be performed for the electrochromic device and, responsive to determining the corrective action is to be performed, cause the corrective action to be performed.

A metrology system may include an imaging sub-system including one or more lenses and a detector to image a sample, where the sample includes metrology target elements on two or more sample layers. The metrology system may further include a controller to determine layer-specific imaging configurations of the imaging sub-system to image the metrology target elements on the two or more sample layers within a selected image quality tolerance, where each layer-specific imaging configuration includes a selected configuration of one or more components of the imaging sub-system. The controller may further receive, from the imaging sub-system, one or more images of the metrology target elements on the two or more sample layers generated using the layer-specific imaging configurations. The controller may further provide a metrology measurement based on the one or more images of the metrology target elements on the two or more sample layers.

An optical coherence tomography (OCT) system (63) is used to inspect bonding points (66A, 66B, 66C) sandwiched between two materials (layers 62, 64 of e.g. displays). The OCT differentiates between a bonding point, e.g. a weld, and air gaps between the two materials. The bonding points are identified as breaks in the air gap between the materials. By extracting various physical characteristics of the bonding points and the gap between the two materials, the present system determines whether the bonding is faulty.

The present invention relates to a method of non-destructively measuring a thickness of a reinforcement membrane, and more particularly, to a method of non-destructively measuring a thickness of a hydrogen ion exchange reinforcement membrane for a fuel cell, in which the reinforcement membrane has a symmetric three-layer structure including a reinforcement base layer and pure water layers disposed at opposing sides of the reinforcement base layer, including performing total non-destructive inspection and omitting a process of analyzing a position by means of a thickness peak of a power spectrum of the respective layers of the reinforcement membrane.