Patent classifications
G01N2021/8455
Image Acquisition System And Image Acquisition Method
An image acquisition system includes a feeding unit supplying a product, a product pickup platform onto which the product is supplied by the feeding unit, and a camera capturing an image of the product on the product pickup platform. The camera identifies a position and an angle of the product based on the image. The image acquisition system includes a robot gripping the product from the product pickup platform based on the position and the angle identified by the camera and an image acquisition platform onto which the product is placed by the robot. An imaging microscope of the image acquisition system captures an image of a surface of the product facing upwards on the image acquisition platform and a computer stores the image of the surface of the product captured by the imaging microscope.
Method and system of detecting foreign materials within an agricultural product stream
Methods and systems for detecting foreign material within a product stream in real-time, involve illuminating a portion of the agricultural product stream with light spanning a wavelength range including or within near-infrared and/or shortwave infrared wavelengths; scanning a line of the illuminated agricultural product stream to acquire a hyperspectral image of the line, the hyperspectral image of the line having a width of a single pixel; processing the hyperspectral image of the scanned line to obtain spectrum data for one or more pixels of the hyperspectral image of the scanned line; comparing the obtained spectrum data of the one or more pixels to predetermined spectrum data to determine whether the obtained spectrum data is indicative of foreign material within the scanned line of the agricultural product stream.
POSITION DETECTION METHOD AND POSITION DETECTION DEVICE FOR SENSOR CHIP IN OPTICAL SAMPLE DETECTION SYSTEM
Provided is a position detection method and a position detection device for detecting a position of a sensor chip and obtaining relative positional information between a well member and a prism as for a well chip type sensor chip in which the well member is provided on a prism. By applying measurement light to the sensor chip while changing a distance between the sensor chip and a measurement light irradiation unit and detecting reflected light traveling in a predetermined direction out of the reflected light generated when the measurement light is reflected by the sensor chip, at least any one of the position of the sensor chip and the relative position between a dielectric member and a sample solution holding member is detected on the basis of a change in intensity of the detected reflected light.
Method for dynamic analysis of parcels
Disclosed herein is a method for dynamic analysis of parcels, particularly intended to be implemented within logistics facilities. The method achieves real time analysis of stability performance of the parcels before the parcels enter specific paths within the logistics facility, so that the paths can be chosen based of stability performance of the parcels determined through the method.
Intelligent piping inspection machine
An automated method of inspecting a pipe includes: positioning the pipe with respect to a laser scanner using a positioning apparatus; scanning a size of the positioned pipe by the laser scanner; identifying a specification and historical data of the pipe's type by inputting the scanned size to an artificially intelligent module trained through machine learning to match input size data to standardized pipe types and output corresponding specifications and historical data of the pipe types; scanning dimensions of the positioned pipe by the laser scanner using a dimension portion of the identified historical data; comparing the scanned dimensions with standard dimensions from the identified specification; detecting a dimension nonconformity when the scanned dimensions are not within acceptable tolerances of the standard dimensions; and in response to detecting the dimension nonconformity, generating an alert and updating the dimension portion of the identified historical data to reflect the detected dimension nonconformity.
INSPECTION SYSTEM AND METHOD FOR DRIVING INSPECTION SYSTEM
An inspection system is provided to inspect an inspection target efficiently. The inspection system includes a second chamber separate from a first chamber in which a radiation source section is present. The second chamber is surrounded by a wall that blocks an electromagnetic wave that the radiation source section emits. A separator roll is stocked in the second chamber.
LIBS-TYPE OBJECT SORTING DEVICE
An LIBS-type object sorting device includes a three-dimensional-shape measurement means that acquires a space-coordinate group of a top face of an object to be sorted in top view on a conveyor, an LIBS analyzing means that performs chemical composition analysis on the object to be sorted while irradiating the object to be sorted with laser light, and a conveying-path switching means that switches a conveying path of the object to be sorted, in this order. The device includes a computing means that determines an analyzing section on which the LIBS analysis is to be performed, and a control means that causes a beam position to move and causes, when detecting that the analyzing section has reached from a movement amount of the conveyor, based on the movement amount, a beam-focus position to move along the analyzing section while irradiating the laser light.
Detection Method And Detection Device
A light irradiation angle is set with respect to a first surface so as to detect only either first reflected light or second reflected light. Then, light is emitted from a light irradiation part at the set irradiation angle while a detection chip is kept in motion, either the first reflected light or the second reflected light is detected by a reflected light detection part, and positional information of the detection chip is acquired on the basis of the result of the detection of the first or second reflected light. The detection chip is moved, on the basis of the acquired positional information, to a detection position where detection of a substance to be detected is performed. While the detection chip is kept at the detection position, detection of the substance to be detected is performed through detection of sample light.
REAGENT CARD ALIGNMENT SYSTEM AND METHOD
A reagent analyzer and method is described. In the method, a reagent card having a reagent pad is passed through an optical signal path between an optical signal source and an optical signal detector. A transition between a first electrical signal and a second electrical signal is detected to determine a substantially exact position of a leading end or a trailing end of the reagent pad. The first electrical signal is indicative of the substrate interfering with the optical signal. The second electrical signal is indicative of the substrate and reagent pad of the reagent card interfering with the optical signal. The reagent pad is moved to a known second location upon determining the substantially exact position of at least one of the leading end and the trailing end of the reagent pad. At the second location a sample is dispensed onto the reagent pad by a sample dispenser.
Surface property indexing apparatus, surface property indexing method, and program
A surface property indexing apparatus includes a measurement device that generates a plurality of captured images and an arithmetic processing apparatus that indexes a surface property of the measured object. The captured images are of the same wavelength of the reflected light that forms images in an image capturing device, and is of different reflection angles of the reflected light that forms images in the image capturing device in the direction corresponding to the longitudinal direction of the measured object in the captured image. The arithmetic processing apparatus reconstructs the generated captured images to generate processing target images having a common wavelength of the reflected light and a common reflection angle of the reflected light and composed of pixels corresponding to the different view field positions of the measured object, and indexes the surface property of the measured object on the basis of the generated processing target images.