An inspection device comprises movable equipment (6) driven relative to a stand (7) and fitted with at least one inspection gauge (14, 15). The device also includes a measurement system (30) comprising a contactless transceiver system (30a) for emitting and receiving a light beam (F) along a path in which there is arranged a target (30b) that is securely mounted to the first inspection gauge, the transceiver system being secured to the stand, and delivering measurements continuously of the position of the first inspection gauge relative to the stand (7). A processor unit (31) is provided that means for detecting when the measurements of the position of the inspection gauge delivered by the transceiver system (30a) cease varying, in order to determine that contact has occurred between the inspection gauge and the container.

[Object] To integratively index a surface property of a measured object by utilizing a measurement result at a plurality of illumination wavelengths and measurement angles.

[Solution] A surface property indexing apparatus according to the present invention includes a measurement device that generates a plurality of captured images by capturing images of reflected light of illumination light on a surface of the measured object while selecting its wavelength, and an arithmetic processing apparatus that indexes a surface property of the measured object on the basis of the obtained captured images. The captured images generated by the measurement device are of the same wavelength of the reflected light that forms images in an image capturing device, and is of different reflection angles of the reflected light that forms images in the image capturing device in the direction corresponding to the longitudinal direction of the measured object in the captured image. The arithmetic processing apparatus reconstructs the generated captured images to generate a plurality of processing target images having a common wavelength of the reflected light and a common reflection angle of the reflected light and composed of pixels corresponding to the different view field positions of the measured object, and indexes the surface property of the measured object on the basis of the generated processing target images.

In the present invention, excitation light is irradiated onto an analysis chip that has been placed in a chip holder, reflected light or transmitted light from the analysis chip is detected, and as a result the position information of the analysis chip is obtained. On the basis of this position information, the chip holder is moved by a conveyance stage and thereby moved to a measurement position. Excitation light is irradiated onto the analysis chip that is disposed at the measurement position, and fluorescence emitted from a fluorescent substance that marks the substance to be detected is detected.

A gluing position inspection method, device, and system resolve at least problemst such as long treatment time, high costs, a low production capacity, and the influence of omission of regluing on heat dissipation and performance of a battery pack caused due to online manual regluing. The inspection method is applied to an inspection device. The inspection method includes: determining an inspection result of a current battery cell based on an image of a surface of the current battery cell, where the image of the surface of the current battery cell is captured by the inspection apparatus at an inspection position, and the image of the surface of the current battery cell includes a gluing position; and controlling a picking portion of the pick-and-place apparatus to move the current battery cell to the cache apparatus and move a spare battery cell in the storage apparatus to the inspection position.

A terminal strip inspection system includes a visual inspection module, a cutting module, and a conveying module. The visual inspection module installed at a visual inspection station visually inspects whether a quality of terminals on a terminal strip conveyed through the visual inspection station are qualified. The cutting module is installed at a cutting station and is located downstream of the visual inspection station. The conveying module conveys the terminal strip from back to front through the visual inspection station and the cutting station in sequence. When the terminal strip is loaded into the terminal strip inspection system, a front end area of the terminal strip is located downstream of the visual inspection station and has not undergone visual inspection. After the terminal strip is loaded, the terminal strip inspection system is activated and the cutting module cuts off the front end area of the terminal strip, so that uninspected areas in the terminal strip are not further conveyed through the terminal strip inspection system.