The quality measurement method for a long sheet material W includes measuring cellulose fibers, % moisture, and % ash of the paper web W by using area cameras 1102 to 1106 having an infrared light receiving element and a light source 1100 having an infrared light emitting LED element. Performance check for the infrared cameras 1102 to 1106 over the entire width and correction of measured values are performed by using consistency between measured values for the same point in an overlap area measured by adjacent cameras and reference samples 1107 at the off-sheet positions provided at both sides.

An adhesion defect detection apparatus includes an inspection window having a first dummy area, a second dummy area, and an inspection area disposed between the first dummy area and the second dummy area. A first shape changer is disposed on the inspection window. The first shape changer is configured to change a shape of the inspection window in a first direction. A second shape changer is disposed outside of both the first dummy area and the second dummy area. The second shape changer is configured to change a shape of the inspection window in a second direction that is perpendicular to the first direction.

An inspection feature for an adhesive bond portion between parts of a component comprising the inspection feature extending from a surface of the part of the component a predetermined bond line thickness, the inspection feature having a density configured to imitate a defect of the adhesive bond portion responsive to a non-destructive inspection scan.

A method performed in a coating testing system for automatically determining the polymerisation of coating material includes positioning a spectrometer probe adjacent to an object (wire 10), the object comprising a polymer coating; acquiring spectra of the polymer coating using the probe; and performing chemometric analysis on the acquired spectra in order to measure the polymerisation of the polymer coating.

Provided is a polymer resin orientation evaluation method including: setting an axis intersecting a front surface of an object to be inspected as an inspection axis, and acquiring an optical characteristic value of the object to be inspected with respect to a plurality of polarization directions of a terahertz wave around the inspection axis; and evaluating orientation of a polymer resin that constitutes the object to be inspected on the basis of a variation amount of the optical characteristic value with respect to change of the polarization direction.

A full width measurement system includes a frame having a first and second rails. The first and second rails are positioned transverse to a moving sheet of material such that the first and second rails are positioned on opposite sides of the moving sheet. Sources may be positioned along the first rail in a predetermined arrangement across a width of the moving sheet. Each of the sources are configured to emit energy toward the moving sheet in a predetermined pattern. Detectors may be positioned along the second rail in a predetermined alignment with respect to the sources such that each of the detectors detect an energy level from multiple respective sources after the energy from the respective sources has passed through the moving sheet. Controller circuitry is configured to receive signals from the detectors and provide real time measured parameters spanning the width of the moving sheet of material.

A measurement device to measure a physical quantity of a measurement target having a sheet-like shape is provided, including: a first integrating sphere which is separated by a gap from a first surface of the measurement target, has a first opening facing the first surface, and is not provided with a light detector to detect an intensity of light; a second integrating sphere which is separated by a gap from a second surface of the measurement target, where the second surface is positioned opposite to the first surface, and has a second opening facing the first opening with the measurement target sandwiched therebetween; a light source to emit light into the first integrating sphere; a light detecting unit to detect an intensity of light inside the second integrating sphere; and a calculating unit to calculate the physical quantity of the measurement target based on the intensity of the detected light.

A measurement device to measure a physical quantity of a measurement target having a sheet-like shape is provided, including: a first integrating sphere which is separated by a gap from a first surface of the measurement target, has a first opening facing the first surface, and is not provided with a light detector to detect an intensity of light; a second integrating sphere which is separated by a gap from a second surface of the measurement target, where the second surface is positioned opposite to the first surface, and has a second opening facing the first opening with the measurement target sandwiched therebetween; a light source to emit light into the first integrating sphere; a light detecting unit to detect an intensity of light inside the second integrating sphere; and a calculating unit to calculate the physical quantity of the measurement target based on the intensity of the detected light.

An inspection device includes: an illumination device that irradiates standard and inspection objects with near-infrared light; a spectroscope that disperses reflected light; an imaging device that takes images of first and second optical spectrums of the reflected light dispersed by the spectroscope to obtain standard spectroscopic image data and inspection spectroscopic image data; and a processor. The processor executes a predetermined arithmetic operation with regard to at least one of (i) each pixel row of the standard spectroscopic image data perpendicular to a wavelength dispersion direction and (ii) each pixel column of the standard spectroscopic image data parallel to the wavelength dispersion direction. The processor, based on luminance values of pixels belonging to the pixel row or column, determines a characteristic of the pixel row and grasps a wavelength sensitivity characteristic of the imaging element under the near-infrared light emitted from the illumination device.

An adhesion defect detection apparatus includes an inspection window having a first dummy area, a second dummy area, and an inspection area disposed between the first dummy area and the second dummy area. A first shape changer is disposed on the inspection window. The first shape changer is configured to change a shape of the inspection window in a first direction. A second shape changer is disposed outside of both the first dummy area and the second dummy area. The second shape changer is configured to change a shape of the inspection window in a second direction that is perpendicular to the first direction.