A device for automatic control of color tone of a reel of thread includes a frame supporting an arm on which a reel of thread is loadable, a meter configured to project a measuring beam onto a cylindrical portion of the reel of thread, the meter having a camera and an illuminator aligned with the camera, the illuminator being multispectral and configured to illuminate the reel of thread with different wavelengths. A computer provided with a screen with graphic interface and connected to the meter processes the classification of the reel of thread loaded on the arm on the basis of measurements performed by the meter.

Embodiments of the present disclosure provide a winder system that includes a battery winder and a camera apparatus. The battery winder is configured to wind a positive electrode plate and a negative electrode plate of a battery. The camera apparatus includes: a camera and a lens, where an angle between a sensor target plane of the camera and a lens plane of the lens is a predetermined angle, and the predetermined angle is greater than 0 degree and less than or equal to 20 degrees. The camera apparatus is configured to obtain images of the positive electrode plate and images of the negative electrode plate concurrently. The camera apparatus according to the present disclosure can implement focusing of images on different working planes, thereby obtaining clear images of both positive electrode features and negative electrode features concurrently with a single camera.

This defect inspection device for emitting illumination light onto a moving and rotating sample and inspecting for sample defects by scanning the sample in a spiral shape or concentric circle shapes comprises: an illumination and detection unit comprising an emission optical system and a detection optical system; a rotary stage for rotating the sample; a rectilinear stage for rectilinearly moving the rotary stage; and a controller for controlling the illumination and detection unit, rotary stage, and rectilinear stage. On the linear path of the rectilinear stage are a scanning start position where illumination light is emitted onto the sample and scanning is started and a sample delivery position where movement of the sample to the scanning start position starts. When the sample arrives at the scanning start position, the defect inspection device starts emitting the illumination light onto the sample without waiting for the rotation speed of the rotary stage to rise to a specified rotation speed for scanning and raises the rotation speed of the rotary stage to the specified rotation speed while scanning the sample.

A tofu production system includes: a production device configured to continuously produce tofu; a conveyance device configured to arrange the tofu produced by the production device according to a predetermined rule corresponding to the tofu and convey the tofu; a tofu inspection device configured to inspect the tofu on the conveyance device; and a sorting and removing device configured to sort or remove a defective product in the tofu being conveyed by the conveyance device based on an inspection result of the tofu inspection device.

A surface detection system and method for continuous casting billet using two-dimensional and three-dimensional combined imaging. The detection system comprises an encoder (2), a position sensing mechanism, and a mounting rack (3), sequentially provided along a running direction of a continuous casting billet (1). The mounting rack (3) is provided with a three-dimensional imaging mechanism (4) and a two-dimensional imaging mechanism (5) sequentially along the running direction of the continuous casting billet (1). The position sensing mechanism starts the encoder (2), which records position information of the continuous casting billet (1). The mounting rack (3) is further provided with a lifting device (6). The three-dimensional imaging mechanism (4) moves up and down along the lifting device (6). The mounting rack (3) is further provided with an insulation plate (7). The two-dimensional imaging mechanism (5) is located above the insulation plate (7), and the continuous casting billet (1) is located below the insulation plate (7). Two-dimensional image data information and three-dimensional image data information are integrated to effectively detect real defects on the surface of the continuous casting billet (1) and filter pseudo defects.

Illumination modules (530) are described for use during manufacturing processes and subsequent material processing steps. The illumination modules (530) may assist with implementing methods for performing quality assurance or defect detection while material (510) is being manufactured or processed. Methods are also described for utilizing an illumination module to facilitate the detection of material properties or conformations as a part of quality assurance or defect detection algorithms.

An inspection device for tofu products includes a processor and a memory storing instructions that, when executed by the processor, cause a computer to execute operations. The operations include: acquiring a captured image from an image capturing device configured to capture an image of a tofu product to be inspected; and determining a quality of the tofu product indicated by the captured image using an evaluation value as output data obtained by inputting the captured image of the tofu product captured by the image capturing device as input data with respect to a learned model for determining a quality of a tofu product indicated by input data, the learned model being generated by performing machine learning using learning data including a captured image of a tofu product.

A device, system, and method related to operator guided inspection is disclosed. A portable inspection device (“PID”) is comprised of a housing, display, camera, light array, gyro, location sensor, a non-transitory computer-readable medium, a processor, and a computer-executable instruction set stored on the non-transitory computer-readable medium. The method is comprised of the steps of selecting an inspection task using the PID; capturing an image of the DUT; providing a reference image with reference dimensions; fixing the focal distance on the camera; providing a region of interest (“ROI”) and an alignment region (“AR”) on the display of the PID; adjusting the lighting of the PID to match the illumination on the DUT with the illumination in the reference image; adjusting the distance between the PID and the DUT such that the DUT fits in the ROI; rotating the PID until the ROI and AR merge into a Merged Region; calibrating the Merged Region with the reference image by scaling the pixel-level distances of the Merged Region with the reference dimensions of the reference image; and performing an automated inspection routine on one or more special characteristics of the DUT. The operator guided inspection system (“OGIS”) includes a plurality of PIDs capable of measuring a plurality of DUTs.

A method for optically inspecting a surface (10) of an object (1) and an inspection device (9) are described. With the method a temporally periodic pattern (13) with different illumination patterns (130) is generated on the surface (10) by means of a illumination device (8) of the inspection device (9) during an image recording sequence (13), and in the image recording sequence a number of images of the pattern (13) on the surface (10) are recorded by means of an image recording device (7) of the inspection device (9), wherein generating one of the different illumination patterns (130) is synchronised, respectively, with the image recording of one of the images of the pattern (13), the phase of the pattern (13) is determined from the succession of the recorded known illumination patterns (130) in at least one image point and defects (4, 5) on the surface (10) are detected from deviations of the recorded illumination pattern (130) from the generated known illumination pattern (130). The illumination device (8) and the image recording device (7) are arranged in the reflection angle (α), wherein the object (1) is moved relative to the inspection device (9) and the duration of the image recording sequence is chosen such that a sequence reflection zone (17) can be regarded as constant (FIG. 4b).

The invention embodies methods and apparatuses to monitor and control the characteristics of a creping process. The method involves measuring optical properties of various points along a creped paper sheet and converting those measurements into characteristic defining data. The invention allows for determining the magnitude and distribution of crepe structures and their frequency and distribution. This allows for the generation of information that is accurate and is much more reliable than the coarse guessing that is currently used in the industry. Feeding this information to papermaking process equipment can result in increases in both quality and efficiency in papermaking.