A deposit detection device according to an embodiment includes a detection module and an identification module. The detection module detects a small region as a candidate region for a deposit region corresponding to a deposit adhering to an imaging device, based on brightness information for each of small regions into which a predetermined region in an image captured by the imaging device is divided. The identification module identifies the candidate region as the deposit region when undulation change in brightness distribution of pixels included in the candidate region detected by the detection module is within a predetermined range.

A deposit detection device according to an embodiment includes a detection module and an identification module. The detection module detects a small region as a candidate region for a deposit region corresponding to a deposit adhering to an imaging device, based on brightness information for each of small regions into which a predetermined region in an image captured by the imaging device is divided. The identification module identifies the candidate region as the deposit region when undulation change in brightness distribution of pixels included in the candidate region detected by the detection module is within a predetermined range.

A chamberless smoke detector includes at least one light emitter and at least one light receiver and a transparent sheet above the at least one light emitter and the at least one light receiver.

A chamberless smoke detector includes at least one light emitter and at least one light receiver and a transparent sheet above the at least one light emitter and the at least one light receiver.

A monitoring system and method are presented for use in monitoring a target. The monitoring system comprises: an input utility for receiving input data comprising measured data indicative of optical response of the target measured under predetermined conditions and comprising phase data indicative of a two-dimensional profile of full phase of the optical response of the target in a predetermined two-dimensional parametric space including a two-dimensional range in which said target exhibits phase singularity; an analyzer module for processing said measured data and extracting at least one phase singularity signature of the target characterizing the target status, the phase singularity signature being formed by a number N of phase singularity points, each corresponding to a condition that the physical phase continuously accumulates a nonzero integer multiple m of 2π around said point.

A monitoring system and method are presented for use in monitoring a target. The monitoring system comprises: an input utility for receiving input data comprising measured data indicative of optical response of the target measured under predetermined conditions and comprising phase data indicative of a two-dimensional profile of full phase of the optical response of the target in a predetermined two-dimensional parametric space including a two-dimensional range in which said target exhibits phase singularity; an analyzer module for processing said measured data and extracting at least one phase singularity signature of the target characterizing the target status, the phase singularity signature being formed by a number N of phase singularity points, each corresponding to a condition that the physical phase continuously accumulates a nonzero integer multiple m of 2π around said point.

Systems and methods for calibrating non-spatial measurements of a device under test (DUT) for misalignment between the DUT and a non-spatial measurement device are disclosed herein. A system for generating a misalignment calibration database can include, for example, a non-spatial measurement device and a high-precision translation stage. The system can generate a misalignment calibration database by taking measurements of a DUT at multiple misalignment locations. A system for measuring a DUT can include, for example, a spatial measurement device, a non-spatial measurement device, a translation stage, and/or a carrier tray. The system can capture measurements of the DUT at a first position and calibrate the measurements for misalignment using calibration data corresponding to the first position. For example, the system can retrieve calibration data from a calibration misalignment system that was taken at the same and/or different locations proximate the position of the DUT.

Systems and methods for performing a contamination estimation of a downhole sample including at least a formation fluid and a filtrate are provided. A plurality of downhole signals are obtained from the downhole sample and one or more of the signals are conditioned. At least two of the conditioned signals or downhole signals are fused into a multivariate dataset. A principle component analysis (PCA) is performed on the fused multivariate dataset to determine optical and density properties of the formation fluid. Based on at least the PCA, optical and density properties of the filtrate are determined. From the optical and density properties of the formation fluid and of the filtrate, a multivariate calculation is performed to generate concentration profiles of the formation fluid and the filtrate.

Systems and methods for performing a contamination estimation of a downhole sample including at least a formation fluid and a filtrate are provided. A plurality of downhole signals are obtained from the downhole sample and one or more of the signals are conditioned. At least two of the conditioned signals or downhole signals are fused into a multivariate dataset. A principle component analysis (PCA) is performed on the fused multivariate dataset to determine optical and density properties of the formation fluid. Based on at least the PCA, optical and density properties of the filtrate are determined. From the optical and density properties of the formation fluid and of the filtrate, a multivariate calculation is performed to generate concentration profiles of the formation fluid and the filtrate.

Systems, devices, and methods for additive manufacturing are provided that allow for components being manufactured to be assessed during the printing process. As a result, changes to a print plan can be considered, made, and implemented during the printing process. More particularly, in exemplary embodiments, a spectrometer is operated while a component is being printed to measure one or more parameters associated with one or more layers of the component being printed. The measured parameter(s) are then relied upon to determine if any changes are needed to the way printing is occurring, and if such changes are desirable, the system is able to implement such changes during the printing process. By way of non-limiting examples, printed material in one or more layers may be reheated to alter the printed component, such as to remove defects identified by the spectrometer data. A variety of systems, devices, and methods for performing real-time sensing and control of an additive manufacturing process are also provided.