An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path, a distal X-ray detector arranged downstream of the sample holder and being movable, in a motorized way, is disclosed. The first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot near the distal X-ray detector when placed at its largest distance from the sample holder or produce a parallel beam so that the X-ray scattering apparatus has a second X-ray beam delivery system having a second X-ray source and being configured to generate and direct a divergent second X-ray beam towards the sample holder for X-ray imaging.

An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path, a distal X-ray detector arranged downstream of the sample holder and being movable, in a motorized way, is disclosed. The first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot near the distal X-ray detector when placed at its largest distance from the sample holder or produce a parallel beam so that the X-ray scattering apparatus has a second X-ray beam delivery system having a second X-ray source and being configured to generate and direct a divergent second X-ray beam towards the sample holder for X-ray imaging.

An x-ray tube source is disclosed that allows differential phase shift, attenuation, and x-ray scattering features of an object to be acquired in a single exposure. Such multiplexed x-ray tube source includes multiple x-ray spot origins controlled in such a way that each slightly separated spot is temporally modulated “ON and OFF” at differing frequencies. In an x-ray interferometer system, such x-ray tube source forms multiple illumination beams of a single angular view of an object's feature but each with different interference fringe locations. A composite image can be acquired with a high frame-rate digital detector as a component element in such x-ray interferometer system. Such composite image can be subsequently de-multipexed and separately presented according to each spot-source illumination beam. Such isolated images of an object's feature, each having different fringe locations, allows for post-acquisition “fringe-mapping” analysis of the feature's full interaction with x-rays, including refraction, scattering, and absorption.

There is provided a technique for non-destructively and relatively easily acquiring orientation information of an anisotropic material even for a large-sized object. An object is irradiated with X-rays in a tangential direction of a curved anisotropic material from a radiation source of a phase-contrast X-ray optical system. A scattering image is then obtained using a detection signal of X-rays having penetrated through the object. Structure information of the anisotropic material is acquired based on the scattering image.

There is provided a technique for non-destructively and relatively easily acquiring orientation information of an anisotropic material even for a large-sized object. An object is irradiated with X-rays in a tangential direction of a curved anisotropic material from a radiation source of a phase-contrast X-ray optical system. A scattering image is then obtained using a detection signal of X-rays having penetrated through the object. Structure information of the anisotropic material is acquired based on the scattering image.

The present invention relates to an apparatus (10) for processing of data acquired by a dark-field and/or phase contrast X-ray imaging system, the apparatus comprising an input unit (20), and a processing unit (30). The input unit is configured to provide the processing unit with blank scan fringe data acquired by a dark-field and/or phase contrast X-ray imaging system comprising an interferometry arrangement and detector. The input unit is configured to provide the processing unit with sample scan fringe data acquired by the dark-field and/or phase contrast X-ray imaging system, with an object to be imaged is positioned within the dark-field and/or phase contrast X-ray imaging system. The processing unit is configured to pre-process the blank scan fringe data to determine pre- processed blank scan fringe data comprising utilization of an effective point spread function “PSF”. The processing unit is configured to pre-process the sample scan fringe data to determine pre- processed sample scan fringe data, comprising utilization of the effective point spread function “PSF”. The effective PSF has been determined for the dark-field and/ or phase contrast X-ray imaging system.

The present invention relates to an apparatus (10) for processing of data acquired by a dark-field and/or phase contrast X-ray imaging system, the apparatus comprising an input unit (20), and a processing unit (30). The input unit is configured to provide the processing unit with blank scan fringe data acquired by a dark-field and/or phase contrast X-ray imaging system comprising an interferometry arrangement and detector. The input unit is configured to provide the processing unit with sample scan fringe data acquired by the dark-field and/or phase contrast X-ray imaging system, with an object to be imaged is positioned within the dark-field and/or phase contrast X-ray imaging system. The processing unit is configured to pre-process the blank scan fringe data to determine pre- processed blank scan fringe data comprising utilization of an effective point spread function “PSF”. The processing unit is configured to pre-process the sample scan fringe data to determine pre- processed sample scan fringe data, comprising utilization of the effective point spread function “PSF”. The effective PSF has been determined for the dark-field and/ or phase contrast X-ray imaging system.

Method include emitting x-rays from an x-ray source, directing a first portion of the x-rays through an object grating situated adjacent to an object while the object is scanned relative to the object grating along a scan direction, directing a second portion of the x-rays through the object and subsequently through a detector grating without transmitting through the object grating, wherein the object grating and detector grating are adjacently arranged in a field of view of the x-rays sequentially with respect to each other in the scan direction, and receiving the first portion transmitted through the object and object grating with a first portion of a detector and receiving the second portion transmitted through the object and the detector grating with a second portion of the detector adjacent to the first portion of the detector. Systems are also disclosed, along with related techniques for beam hardening correction.

Method include emitting x-rays from an x-ray source, directing a first portion of the x-rays through an object grating situated adjacent to an object while the object is scanned relative to the object grating along a scan direction, directing a second portion of the x-rays through the object and subsequently through a detector grating without transmitting through the object grating, wherein the object grating and detector grating are adjacently arranged in a field of view of the x-rays sequentially with respect to each other in the scan direction, and receiving the first portion transmitted through the object and object grating with a first portion of a detector and receiving the second portion transmitted through the object and the detector grating with a second portion of the detector adjacent to the first portion of the detector. Systems are also disclosed, along with related techniques for beam hardening correction.

A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.