A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.

A high-sensitive phase imaging is achieved using a grating section without upsizing the imaging device or narrowing the period of the gratings. A radiation source generates radiation on a radiation path toward the grating section. The grating section comprises a G1 grating and a refraction-enhancing grating. The G1 grating has a G1 periodic structure that forms radiation converging points where an intensity of the radiation is increased between the G1 grating and a detector. The refraction-enhancing grating is located at the position of the radiation converging points and has enhancement planes and that increase the refraction angle of the radiation. The detector detects the radiation that has passed through the grating section.

A high-sensitive phase imaging is achieved using a grating section without upsizing the imaging device or narrowing the period of the gratings. A radiation source generates radiation on a radiation path toward the grating section. The grating section comprises a G1 grating and a refraction-enhancing grating. The G1 grating has a G1 periodic structure that forms radiation converging points where an intensity of the radiation is increased between the G1 grating and a detector. The refraction-enhancing grating is located at the position of the radiation converging points and has enhancement planes and that increase the refraction angle of the radiation. The detector detects the radiation that has passed through the grating section.

A laminated scintillator panel having a structure in which a scintillator layer for converting radiation into visible light and a non-scintillator layer are repeatedly laminated in a direction parallel to an incident direction of radiation, wherein the non-scintillator layer transmits the visible light.

Provided is a lattice-shaped laminated scintillator panel with high luminance, a large area, and a thick layer by means completely different from a conventional technique using a silicon wafer.

This X-ray phase imaging system includes a plurality of gratings including a first grating that is irradiated with X-rays from an X-ray source and a second grating that is irradiated with X-rays from the first grating. The X-ray phase imaging system includes an imaging unit that optically images a subject and one or both of the first grating and the second grating.

This X-ray phase imaging system includes a plurality of gratings including a first grating that is irradiated with X-rays from an X-ray source and a second grating that is irradiated with X-rays from the first grating. The X-ray phase imaging system includes an imaging unit that optically images a subject and one or both of the first grating and the second grating.

The present invention provides a method of generating a fingerprint for a gemstone (5), for example a diamond, using x-ray imaging. The fingerprint comprises a three-dimensional map of a crystal or crystals present within the gemstone (5) including internal imperfections of the crystals and may also comprise further information about the gemstone (5). The method comprising the steps of: mounting the gemstone (5) in a sample holder (4) of an imaging apparatus, the imaging apparatus comprising a detector (6), a sample holder (4) mounted on a sample stage (3), an x-ray source (1), the sample holder (4) and the x-ray source (1) aligned along an optical axis, wherein the sample holder (4) is movable relative to the at least one x-ray source (1) and the detector (6); exposing the gemstone (5) to x-ray radiation from the x-ray source (1), whilst moving the sample holder (4) according to a search strategy that is predetermined for the gemstone (5) based on known physical characteristics of the gemstone (5); using the detector (6) to locate diffraction and/or extinction spots generated by the lattice of the crystals; utilising the located diffraction and/or extinction spots to calculate information about the position, orientation, and phase of the crystals; generating a suitable x-ray diffraction scanning strategy from the calculated information, the strategy including moving the sample holder (4) relative to the x-ray source (1) and the detector (6) and exposing the gemstone (5) to appropriate x-ray radiation as the sample holder (4) is moved, wherein the strategy is generated to locate and classify internal imperfections in the at least one crystal; scanning the gemstone according to the scanning strategy and recording the diffraction and/or extinction images using the detector (6); and generating a fingerprint from the recorded diffraction and/or extinction images.

Provided is a radiation phase-contrast imaging device capable of assuredly detecting a self-image and precisely imaging the internal structure of an object. According to the configuration of the present invention, the longitudinal direction of a detection surface of a flat panel detector is inclined with respect to the extending direction of an absorber in a phase grating. This causes variations in the position (phase) of a projected stripe pattern of a self-image at different positions on the detection surface. This is therefore expected to produce the same effects as those obtainable when a plurality of self-images are obtained by performing imaging a plurality of times in such a manner that the position of the projected self-images on the detection surface varies. This alone, however, results in a single self-image phase for a specific region of the object. Therefore, according to the present invention, it is configured such that imaging is performed while changing the relative position of the imaging system and the object.

The invention relates to a system and a method for active grating position tracking in X-ray differential phase contrast imaging and dark-field imaging. The alignment of at least one grating positioned in an X-ray imaging device is measured by illuminating a reflection area located on the grating with a light beam, and detecting a reflection pattern of the light beam reflected by the reflection area. The reflection pattern is compared with a reference pattern corresponding to an alignment optimized for X-ray differential phase contrast imaging, and the X-ray imaging device is controlled upon the comparison of the reflection pattern and the reference pattern.

The invention relates to a system and a method for active grating position tracking in X-ray differential phase contrast imaging and dark-field imaging. The alignment of at least one grating positioned in an X-ray imaging device is measured by illuminating a reflection area located on the grating with a light beam, and detecting a reflection pattern of the light beam reflected by the reflection area. The reflection pattern is compared with a reference pattern corresponding to an alignment optimized for X-ray differential phase contrast imaging, and the X-ray imaging device is controlled upon the comparison of the reflection pattern and the reference pattern.