In one embodiment, an automated high-speed X-ray inspection system may generate a first X-ray image of an inspected sample at a first direction substantially orthogonal to a plane of the inspected sample. The first X-ray image may be a high-resolution grayscale image. The system may identify one or more elements of interest of the inspected sample based on the first X-ray image. The first X-ray image may include interfering elements that interfere with the one or more elements of interest in the first X-ray image. The system may determine one or more first features associated with respective elements of interest based on variations of grayscale values in the first X-ray images. The system may determine whether one or more defects are associated with the respective elements of interest based on the one or more first features associated with the element of interest.

According to an embodiment, there is provided an apparatus which quantitatively evaluates a braze bonding length. A radiation emission unit emits radiation to each of a plurality of partial specimens which are obtained by cutting a specimen in a plane perpendicular to a braze bonding length direction. A light generator generates light of an amount corresponding to an intensity of transmissive radiation. An imaging unit photographs this light. A calculator calculates a braze bonding length of each of the partial specimens, from a light amount obtained with respect to each of the partial specimens, based on a correlation between a braze bonding length and a light amount. The calculator further calculates the braze bonding length of the specimen by totaling the braze bonding lengths of the respective partial specimens.

An X-ray inspecting apparatus, with which X-rays of a broad energy band can be detected while manufacturing costs are suppressed, comprises an X-ray radiation device, a line sensor assembly, and other components. The line sensor assembly has a plurality of detection units and other components. Each detection unit has a scintillator, a detection main body including a plurality of elements disposed thereon, and a ceramic substrate supporting the scintillator and detection main body. In the line sensor assembly, the plurality of detection units etc. are aligned in a forward-backward direction so that the scintillators and the detection main bodies of the detection units etc. are aligned without gaps with the scintillators and detection main bodies of adjacent detection units.

A radiation imaging apparatus includes a pixel array, a scanning circuit for scanning a plurality of rows of the pixel array in accordance with a selected mode of a plurality of modes, and a readout circuit configured to read out signals from pixels on a selected row in scanning by the scanning circuit. The plurality of modes include a first mode of performing image capturing at a first frame rate and a second mode of performing image capturing at a second frame rate lower than the first frame rate. The number of times of scanning on the plurality of rows by the scanning circuit in one frame period in the second mode is larger than that of scanning on the plurality of rows by the scanning circuit in one frame period in the first mode.

X-ray imaging systems and methods comprising, at least, an x-ray source, an x-ray detector, and a collimator assembly. The collimator assembly comprising a computer, a display, a camera, an x-ray source to object (patient) measuring device to measure source to object distance (SOD), and a plurality of metallic barriers used to manipulate a size and shape of X-ray beams, thereby also reducing the volume of irradiated tissue in the patient. The collimator may comprise computer-controlled motorized shutters to admit radiation into the region defined by the adjustable beam-defining components of the collimator of an X-ray apparatus. In some embodiments, the plurality of metallic barriers may be a fixed cone, or a cone comprised of movable plates.

In one embodiment, an X-ray inspection system may capture one or more X-ray images for samples of interest processed by a first tool. The X-ray inspection system may be inline with the first tool and have an inspection speed of 300 mm.sup.2 per minute or greater. The system may determine, in real-time, metrology information related to the samples of interest based on the X-ray images. The metrology information may indicate that a sample parameter associated with the samples of interest is outside of a pre-determined range. The system may provide instructions or data to one or more of the first tool or one or more second tools to adjust process parameters associated with the respective tools based on metrology information. The adjusted process parameters may reduce a processing error probability, of the respective tool for processing subsequent samples, related to the sample parameter being outside of the pre-determined range.

An imaging apparatus and related method comprising a detector located a distance from a source and positioned to receive a beam of radiation in a trajectory; a detector positioner that translates the detector to an alternate position in a direction that is substantially normal to the trajectory; and a beam positioner that alters the trajectory of the radiation beam to direct the beam onto the detector located at the alternate position.

Apparatus for optical imaging of Cerenkov luminescence from an object subsequent to the object receiving a dose of a radiopharmaceutical, the apparatus comprising: a light tight enclosure within which the object can be received at a sample location; an imaging means; a means to mitigate direct particle impingement between the sample location and the imaging means; and one or more optical elements for transmitting Cerenkov photons from within the light tight enclosure to the imaging means.

An X-ray single-pixel camera based on X-ray computational correlated imaging, which belongs to the technical research fields of X-ray computational correlated imaging and X-ray single-pixel imaging. The X-ray single-pixel camera includes: an X-ray modulation system (3), an X-ray modulation control system (4), an X-ray single-pixel detector (5), a main control system unit (6), a time synchronization system (7) and a computational imaging system (8). The main control system unit (6) controls each module through software; the time synchronization system (7) controls synchronization of each module for automatic collection; and the computational imaging system (8) is configured to perform a second-order correlated computation or a compressed sensing computation or a deep learning computation on the signals collected by the X-ray single-pixel detector (5) and a preset modulation matrix, so as to obtain an image of an object under test. The X-ray single-pixel camera based on X-ray computational correlated imaging, provided by the present invention, realizes single-pixel imaging, greatly reduces the sampling number while ensuring the imaging quality, and reduces the X-ray radiation dose in an imaging process.

Method for detecting at least one critical defect in a ceramic rolling element providing the steps of capturing a plurality of two-dimensional digital radiographic images of the rolling element; digitally filtering each radiographic image; delineating, on the basis of the filtered image, at least one region liable to comprise the critical defect; constructing stereoscopically a virtual model of the rolling element having the region; comparing the dimensions of the delineated region with a plurality of predetermined threshold values, and, when the dimensions are greater than the threshold values, generating an alarm signal.