The present invention provides a method of inspecting a surface including detecting a presence or absence of a defect derived from a surface irregularity part of a planar inspection object to be conveyed in a predetermined direction, using a change in intensity of inspection light, the inspection light including at least two inspection lights that are parallel to a surface of the inspection object in a side view of the inspection object and pass over the surface of the inspection object or through the inspection object in a direction intersecting the conveyance direction in a plan view of the inspection object, the two inspection lights being non-parallel to each other in the plan view.

An image processing device capable of high-accuracy foreign object inspection is provided. The image processing device include a background value setting section configured to (i) obtain a value for use as a background value on a basis of a first pixel value of at least one reference pixel present in the vicinity of a target pixel and having a predetermined positional relationship with the target pixel, and (ii) set the background value of the target pixel to the value obtained.

A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.

A device and method for the radioscopic examination of a continuous strip-shaped material of rubber which runs continuously in particular. During the movement, the strip-shaped material is x-rayed by a radioscopic measurer and the entire cross-sectional surface is detected so that foreign bodies or defects present in the material are detected according to their position and orientation. An elimination device removes the previously identified foreign body during the feed movement of the material in that a tool, configured as a punching tool, of the elimination device is moved synchronously with the material.

A device and method for the radioscopic examination of a continuous strip-shaped material of rubber which runs continuously in particular. During the movement, the strip-shaped material is x-rayed by a radioscopic measurer and the entire cross-sectional surface is detected so that foreign bodies or defects present in the material are detected according to their position and orientation. An elimination device removes the previously identified foreign body during the feed movement of the material in that a tool, configured as a punching tool, of the elimination device is moved synchronously with the material.

A continuous non-destructive inspection method for a membrane-electrode assembly includes detecting presence or absence of an internal foreign substance and an internal defect in the membrane-electrode assembly using a transmitted X-ray image obtained by repeating the steps of conveying the membrane-electrode assembly to a photographing position sandwiched between an X-ray imaging unit and an X-ray source disposed to face the X-ray imaging unit and that has a focal spot size of 50 m or less; temporarily stopping the conveyance of the membrane-electrode assembly and emitting X-rays from the X-ray source toward the X-ray imaging unit in a state where the membrane-electrode assembly stands still in the photographing position to take a transmitted X-ray image; and restarting the conveyance of the membrane-electrode assembly to move the membrane-electrode assembly from the photographing position.

A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.

Ad. X-ray inspection apparatus includes a conveyance unit, an X-ray radiation unit, an X-ray detection, unit, and an image processing unit. The X-ray detection unit has a plurality of direct conversion-type X-ray detection element arrays disposed, side-by-side in rows along a direction intersecting both a conveyance direction in which an object is conveyed by the conveyance unit and a radiation direction in which X-rays are radiated by the X-ray radiation unit The image processing unit has an edge detection unit configured to carry out edge detection processing on an X-ray transmission image to generate an edge detected image, a horizontal direction gradation unit configured to carry out horizontal direction gradation processing on the edge detected image to generate a horizontal direction gradation linage, and a synthesizing unit configured to synthesize the X-ray transmission image and the horizontal direction gradation image to generate a post-processing X-ray transmission image.

A defect inspection device includes: a radiation source configured to emit an electromagnetic wave radially to a separator roll; a TDI sensor configured to detect the electromagnetic wave which has passed through the separator roll; and a moving mechanism configured to move an inspection region of the separator roll with a distance kept substantially constant between the radiation source and the separator roll and with a distance kept substantially constant between the radiation source and the TDI sensor.

A defect inspection device includes: a radiation source configured to emit an electromagnetic wave radially to a separator roll; a TDI sensor configured to detect the electromagnetic wave which has passed through the separator roll; and a moving mechanism configured to move an inspection region of the separator roll with a distance kept substantially constant between the radiation source and the separator roll and with a distance kept substantially constant between the radiation source and the TDI sensor.