A calibration method for an X-ray measuring device includes mounting a calibration tool on a rotating table, identifying centroid positions from an output of an X-ray image detector, calculating projection transformation matrixes from the centroid positions and known relative positional intervals, repeating to identify the centroid positions from the output of the X-ray image detector and to calculate the projection transformation matrixes from the centroid positions and known relative positional intervals while the rotating table is rotated twice or more by a predetermined angle, and calculating a rotation center position of the rotating table on the basis of the projection transformation matrixes. The calibration method thereby allows easy calculation of the rotation center position of the rotating table on which an object to be measured is mounted in a rotatable manner, with the simple process.

A non-destructive inspection system includes: a neutron emission unit 12 capable of emitting neutrons pulsed; a neutron detector capable of detecting the neutrons emitted from the neutron emission unit and penetrating through an inspection object; a storage unit storing attenuation information indicating a relationship between a material of the inspection object and attenuation of the neutrons; and a calculation unit capable of calculating distance information indicating a position of a specific portion in the inspection object in accordance with time change information which is information on a change over time in an amount of the neutrons detected by the neutron detector. The calculation unit is capable of generating information related to an amount of the specific portion from information based on the amount of the neutrons according to the time change information, using the distance information and the attenuation information.

A non-destructive inspection system includes: a neutron emission unit 12 capable of emitting neutrons pulsed; a neutron detector capable of detecting the neutrons emitted from the neutron emission unit and penetrating through an inspection object; a storage unit storing attenuation information indicating a relationship between a material of the inspection object and attenuation of the neutrons; and a calculation unit capable of calculating distance information indicating a position of a specific portion in the inspection object in accordance with time change information which is information on a change over time in an amount of the neutrons detected by the neutron detector. The calculation unit is capable of generating information related to an amount of the specific portion from information based on the amount of the neutrons according to the time change information, using the distance information and the attenuation information.

An example portable radiography scanning system includes: a radiation detector configured to generate a digital image based on incident radiation; a radiation emitter configured to output the radiation; a frame configured to hold at least one of the radiation emitter or the radiation detector such that the radiation emitter directs the radiation to the radiation detector; a first sensor configured to determine a first distance between the radiation detector and the radiation emitter; and a computing device configured to: determine a second distance between the radiation emitter and an interface between the radiation and the object; determine a magnification correction factor based on the first distance and the second distance; measure a size, in pixels, of a feature of the object in the digital image; and at least one of: calculate an actual size of the feature based on the magnification correction factor and the measured size of the feature, or determine whether the measured sized of the feature satisfies a threshold size based on the magnification correction factor.

An example portable radiography scanning system includes: a radiation detector configured to generate a digital image based on incident radiation; a radiation emitter configured to output the radiation; a frame configured to hold at least one of the radiation emitter or the radiation detector such that the radiation emitter directs the radiation to the radiation detector; a first sensor configured to determine a first distance between the radiation detector and the radiation emitter; and a computing device configured to: determine a second distance between the radiation emitter and an interface between the radiation and the object; determine a magnification correction factor based on the first distance and the second distance; measure a size, in pixels, of a feature of the object in the digital image; and at least one of: calculate an actual size of the feature based on the magnification correction factor and the measured size of the feature, or determine whether the measured sized of the feature satisfies a threshold size based on the magnification correction factor.

In one embodiment, an X-ray inspection system may access a first set of X-ray images of one or more first samples that are labeled as being non-conforming. The system may adjust a classification algorithm based on the first set of X-ray images. The classification algorithm may classify samples into conforming or non-conforming categories based on an analysis of corresponding X-ray images. The system may analyze a second set of X-ray images of a number of second samples using the adjusted classification algorithm. The second samples may be previously inspected samples that have been classified as conforming by the classification algorithm during a previous analysis before the classification algorithm is adjusted. The system may identify one or more of the second samples from the second set of X-ray images. Each identified second sample may be classified as non-conforming by the adjusted classification algorithm.

In one embodiment, an X-ray inspection system may access a first set of X-ray images of one or more first samples that are labeled as being non-conforming. The system may adjust a classification algorithm based on the first set of X-ray images. The classification algorithm may classify samples into conforming or non-conforming categories based on an analysis of corresponding X-ray images. The system may analyze a second set of X-ray images of a number of second samples using the adjusted classification algorithm. The second samples may be previously inspected samples that have been classified as conforming by the classification algorithm during a previous analysis before the classification algorithm is adjusted. The system may identify one or more of the second samples from the second set of X-ray images. Each identified second sample may be classified as non-conforming by the adjusted classification algorithm.

The present invention provides a detection method for radiation-induced defects of an oxide layer in electronic devices. The detection method includes the following steps: selecting a semiconductor material to be prepared into a substrate; preparing a back electrode on an upper surface of the substrate; growing an oxide layer on the back electrode; etching one side of the oxide layer, and exposing an etched part out of the back electrode; preparing a front electrode on an upper surface of the oxide layer; forming a plurality of grooves in the front electrode, and distributing the plurality of grooves in a grid shape to prepare a test sample; and performing a radiation test on the test sample, and detecting radiation-induced defects. By using the detection method provided by the present invention, rapid identification and detection of electrons and holes are achieved.

The present invention provides a detection method for radiation-induced defects of an oxide layer in electronic devices. The detection method includes the following steps: selecting a semiconductor material to be prepared into a substrate; preparing a back electrode on an upper surface of the substrate; growing an oxide layer on the back electrode; etching one side of the oxide layer, and exposing an etched part out of the back electrode; preparing a front electrode on an upper surface of the oxide layer; forming a plurality of grooves in the front electrode, and distributing the plurality of grooves in a grid shape to prepare a test sample; and performing a radiation test on the test sample, and detecting radiation-induced defects. By using the detection method provided by the present invention, rapid identification and detection of electrons and holes are achieved.

A food product quality control system is provided. The system comprises a support structure, an inspection unit for detecting at least one property of a food product supplied to the inspection unit, the inspection unit being mounted on the support structure, and a conveyor system for conveying a food product through and/or past the inspection unit, the conveyor system being mounted on the support structure. The conveyor system comprises a conveying apparatus carried on a frame. The frame is movably mounted to the support structure such that the frame may move relative to the inspection unit between an operation position, at which the frame is laterally aligned with the inspection unit such that food product may be conveyed through and/or past the inspection unit, and a maintenance position, at which the frame is laterally offset from the inspection unit.