Patent classifications
G01N23/18
FOOD PRODUCT QUALITY CONTROL SYSTEM
A food product quality control system is provided. The system comprises a support structure, an inspection unit for detecting at least one property of a food product supplied to the inspection unit, the inspection unit being mounted on the support structure, and a conveyor system for conveying a food product through and/or past the inspection unit, the conveyor system being mounted on the support structure. The conveyor system comprises a conveying apparatus carried on a frame. The frame is movably mounted to the support structure such that the frame may move relative to the inspection unit between an operation position, at which the frame is laterally aligned with the inspection unit such that food product may be conveyed through and/or past the inspection unit, and a maintenance position, at which the frame is laterally offset from the inspection unit.
APPARATUS, METHOD, COMPUTER-READABLE STORAGE MEDIUM FOR NON-DESTRUCTIVE INSPECTION OF BICYCLE BASED ON ANALYZING AMOUNT OF SCALE VALUE CHANGE
A non-destructive inspection apparatus is provided. The non-destructive inspection apparatus includes at least one memory configured to store commands for performing predetermined operations, and at least one processor operatively coupled to the at least one memory and configured to execute the commands. The at least one processor is configured to obtain information on a transmission amount of an X-ray by emitting the X-ray to a part of a bicycle, generate a gray scale image based on the information on the transmission, measure an amount of change in a gray value from one end to the other end of the part of the bicycle represented in the gray scale image along an extending direction of the part, and detect an area in which the amount of change in the gray value is equal to or greater than a threshold, as an abnormal area.
APPARATUS, METHOD, COMPUTER-READABLE STORAGE MEDIUM FOR NON-DESTRUCTIVE INSPECTION OF BICYCLE BASED ON ANALYZING AMOUNT OF SCALE VALUE CHANGE
A non-destructive inspection apparatus is provided. The non-destructive inspection apparatus includes at least one memory configured to store commands for performing predetermined operations, and at least one processor operatively coupled to the at least one memory and configured to execute the commands. The at least one processor is configured to obtain information on a transmission amount of an X-ray by emitting the X-ray to a part of a bicycle, generate a gray scale image based on the information on the transmission, measure an amount of change in a gray value from one end to the other end of the part of the bicycle represented in the gray scale image along an extending direction of the part, and detect an area in which the amount of change in the gray value is equal to or greater than a threshold, as an abnormal area.
Multi-scan computed tomography defect detectability
Systems and methods for representing internal defects of an object to determine defect detectability using a multi-scan computed tomography (CT) approach are disclosed. A defect-free object may be scanned using a CT machine. In one or more separate scans, phantom defects may be imaged and the resulting projections combined and reconstructed to represent internal defects. The air-normalized intensities of the object and the phantom defect may be used to represent voids and inclusions. Subtraction of materials may be represented by the quotient of the air-normalized intensities thereof, and the addition of materials may be represented by the product of the air-normalized intensities thereof. A void may be represented by subtracting a phantom defect scan from the object scan. An inclusion may be represented by creating a void, scanning an additional phantom defect, and adding the additional phantom defect in the volume created by the void.
Multi-scan computed tomography defect detectability
Systems and methods for representing internal defects of an object to determine defect detectability using a multi-scan computed tomography (CT) approach are disclosed. A defect-free object may be scanned using a CT machine. In one or more separate scans, phantom defects may be imaged and the resulting projections combined and reconstructed to represent internal defects. The air-normalized intensities of the object and the phantom defect may be used to represent voids and inclusions. Subtraction of materials may be represented by the quotient of the air-normalized intensities thereof, and the addition of materials may be represented by the product of the air-normalized intensities thereof. A void may be represented by subtracting a phantom defect scan from the object scan. An inclusion may be represented by creating a void, scanning an additional phantom defect, and adding the additional phantom defect in the volume created by the void.
PROTECTIVE MEMBER AND ARTICLE PROCESSING DEVICE
An X-ray shielding curtain includes a main body having a pair of main surfaces facing each other, and a plurality of protruding parts provided on at least one of the pair of main surfaces of the main body and protruding from the main surface, wherein each of the plurality of protruding parts has an opening portion that passes through the pair of main surfaces of the main body.
X-ray inspection device
An X-ray inspection apparatus suppresses anomalies in inspection results caused by the X-ray inspection apparatus being used while an unsuitable setting is in effect. The X-ray inspection apparatus is provided with an inspection unit, a setting unit, a storage unit, an assessment unit, and a notification unit. The inspection unit inspects an irradiated article using detection data obtained by detecting X-rays. The setting unit sets a setting value used in inspection of the article by the inspection unit. The storage unit stores a detection value based on the detection data. The assessment unit assesses, on the basis of the detection value stored in the storage unit, whether or not the setting value set by the setting unit is suitable. When the assessment unit has assessed that the setting value is not suitable, the notification unit issues a notification to indicate that the setting value is not suitable.
X-ray inspection device
An X-ray inspection apparatus suppresses anomalies in inspection results caused by the X-ray inspection apparatus being used while an unsuitable setting is in effect. The X-ray inspection apparatus is provided with an inspection unit, a setting unit, a storage unit, an assessment unit, and a notification unit. The inspection unit inspects an irradiated article using detection data obtained by detecting X-rays. The setting unit sets a setting value used in inspection of the article by the inspection unit. The storage unit stores a detection value based on the detection data. The assessment unit assesses, on the basis of the detection value stored in the storage unit, whether or not the setting value set by the setting unit is suitable. When the assessment unit has assessed that the setting value is not suitable, the notification unit issues a notification to indicate that the setting value is not suitable.
Real time additive manufacturing process inspection using x-ray emission and detection through a build chamber
Systems and methods for real time, nondestructive inspection of an object being formed by additive manufacturing is provided. The disclosed systems and methods can be used with any additive manufacturing system and can detect defects introduced during fabrication. In operation, additive manufacturing of the object can be paused and the object rotated within the build chamber. An x-ray pulse can then be directed through a linear aperture towards the object being formed inside the build chamber. A linear x-ray detector array can detect the x-ray pulse and an x-ray image of the object being formed can be created. By rotating the object being formed during exposure to the x-ray pulse at least one half of one full rotation, the entire volume of the object can be inspected.
Real time additive manufacturing process inspection using x-ray emission and detection through a build chamber
Systems and methods for real time, nondestructive inspection of an object being formed by additive manufacturing is provided. The disclosed systems and methods can be used with any additive manufacturing system and can detect defects introduced during fabrication. In operation, additive manufacturing of the object can be paused and the object rotated within the build chamber. An x-ray pulse can then be directed through a linear aperture towards the object being formed inside the build chamber. A linear x-ray detector array can detect the x-ray pulse and an x-ray image of the object being formed can be created. By rotating the object being formed during exposure to the x-ray pulse at least one half of one full rotation, the entire volume of the object can be inspected.