Described herein is a tool holder for small objects. A tool and tool holder as described herein improve the flexibility and ability to manipulate small objects (such as for example crystal used in X-ray crystallography) in a confined space.

A sample analysis cup, sample cup assembly, and method is provided including a cell body with an open top end including an outer top wall and an inner top wall, each extending axially and positioned in concentric relationship; a bottom wall extending from the outer top wall to the inner top wall, the bottom wall and the inner and outer top walls defining an internal reservoir therebetween; a transverse wall extending a selected distance from the inner top wall, the transverse wall partially closing the open top end; an open bottom end including an outer bottom wall and an inner bottom wall, each extending axially and positioned in concentric relationship, the outer and inner bottom walls defining an internal channel therebetween; and a hollow chamber defined between the open top end and the open bottom end.

A system (300) for providing a three-dimensional computer tomography image of a gemstone, the system (300) comprising an X-ray source (330) for providing an X-ray towards a gemstone (320); an X-ray detector system for detecting X-rays transmitted through or diffracted by the gemstone (320). The X-ray detector system surrounds the gemstone (320) and detects a three-dimensional multi-angle X-ray diffraction pattern from the gemstone (320) upon rotation of the gemstone (320) within the X-ray field, and provides an output signal therefrom, wherein the output signal provides for invasive three-dimension multiangle X-ray diffraction reconstructed computed tomography from the three-dimension multiangle X-ray diffraction pattern.

A system (300) for providing a three-dimensional computer tomography image of a gemstone, the system (300) comprising an X-ray source (330) for providing an X-ray towards a gemstone (320); an X-ray detector system for detecting X-rays transmitted through or diffracted by the gemstone (320). The X-ray detector system surrounds the gemstone (320) and detects a three-dimensional multi-angle X-ray diffraction pattern from the gemstone (320) upon rotation of the gemstone (320) within the X-ray field, and provides an output signal therefrom, wherein the output signal provides for invasive three-dimension multiangle X-ray diffraction reconstructed computed tomography from the three-dimension multiangle X-ray diffraction pattern.

A system and method of inspecting a plurality of objects using a computed tomography (CT) system is provided. The method includes acquiring an image of a fixture used for holding the plurality of objects with the CT system. A first electronic model of the fixture is generated. The objects are placed in the fixture. An image of the fixture and the objects is acquired with the CT system. A second electronic model of the fixture and the objects is generated. A third electronic model of the objects is defined based at least in part on subtracting the first electronic model from the second electronic model. Dimensions of the objects from the third electronic model are compared with a computer aided design (CAD) model. A report is output based at least in part on the comparison of the objects from the third electronic model with the CAD model.

A system and method of inspecting a plurality of objects using a computed tomography (CT) system is provided. The method includes acquiring an image of a fixture used for holding the plurality of objects with the CT system. A first electronic model of the fixture is generated. The objects are placed in the fixture. An image of the fixture and the objects is acquired with the CT system. A second electronic model of the fixture and the objects is generated. A third electronic model of the objects is defined based at least in part on subtracting the first electronic model from the second electronic model. Dimensions of the objects from the third electronic model are compared with a computer aided design (CAD) model. A report is output based at least in part on the comparison of the objects from the third electronic model with the CAD model.

An equipment mount for an x-ray apparatus is disclosed. The mount comprises a main shield element, a peripheral shield element and a secondary shield element arranged to permit a mounting element to pass through the main shield element in a shielded manner. A support apparatus for an x-ray apparatus is also disclosed. The support apparatus comprises a separable bearing for translating a support part between a first position and a second position and an elevator mechanism for translating the support part from the second position to a third position, thereby separating the bearing. A manipulator stage for an x-ray apparatus is also disclosed. The stage comprises a first support structure arranged to support a sample stage and supported at first and second positions either side of the sample stage by second and third support structures, the second and third support structures being configured to allow the first support structure to raise and lower while remaining supported at both ends.

A ball-mapping system connectable to an X-ray diffraction apparatus, for collecting X-ray diffraction data at measurement points located on a ball-shaped sample is provided. The system includes a sample stage, including a sample-contacting surface and a guide assembly cooperating with the sample-contacting surface for guiding the sample-contacting surface along a first axis and along a second axis unparallel to the first axis. The system includes a sample holder for keeping the ball-shaped sample in contact with the sample stage and a motor assembly in driving engagement with the guide assembly, the motor assembly driving the sample-contacting surface in translational movement along the first axis and the second axis, the translational movement of the sample-contacting surface causing the ball-shaped sample to rotate, on the sample-contacting surface along the first axis and the second axis. A method for mapping the ball-shaped sample is also provided.

A ball-mapping system connectable to an X-ray diffraction apparatus, for collecting X-ray diffraction data at measurement points located on a ball-shaped sample is provided. The system includes a sample stage, including a sample-contacting surface and a guide assembly cooperating with the sample-contacting surface for guiding the sample-contacting surface along a first axis and along a second axis unparallel to the first axis. The system includes a sample holder for keeping the ball-shaped sample in contact with the sample stage and a motor assembly in driving engagement with the guide assembly, the motor assembly driving the sample-contacting surface in translational movement along the first axis and the second axis, the translational movement of the sample-contacting surface causing the ball-shaped sample to rotate, on the sample-contacting surface along the first axis and the second axis. A method for mapping the ball-shaped sample is also provided.

An apparatus for X-ray topography includes a source assembly, a detector assembly, a scanning assembly and a processor. The source assembly is configured to direct multiple X-ray beams so as to irradiate multiple respective regions on a sample, wherein the regions partially overlap one another along a first axis of the sample and are offset relative to one another along a second axis of the sample that is orthogonal to the first axis. The detector assembly is configured to detect the X-ray beams diffracted from the sample and to produce respective electrical signals in response to the detected X-ray beams. The scanning assembly is configured to move the sample relative to the source assembly and the detector assembly along the second axis. The processor is configured to identify defects in the sample by processing the electrical signals, which are produced by the detector assembly while the sample is moved.