Technologies are described for methods and systems effective for flex plates. The flex plates may comprise a base plate. The base plate may include walls that define an insert location opening in the base plate. The insert location opening in the base plate may be in communication with a securement area. The flex plates may comprise an insert. The insert may include a reservoir region and a crystallization region separated by a wall including channels. The reservoir region and the crystallization region may include a backing. The insert may further include securement tabs. The securement tabs may be configured to secure the insert to the base plate at the securement area.

A method for evaluating the quality of a SiC single crystal by a non-destructive and simple method; and a method for producing a SiC single crystal ingot with less dislocation and high quality with good reproducibility utilizing the same. The method for evaluating the quality of a SiC single crystal body is based on the graph of a second polynomial equation obtained by differentiating a first polynomial equation, the first polynomial equation approximating the relation between a peak shift value and a position of the measurement point and the peak shift value being obtained by an X-ray rocking curve measurement. The method for producing a SiC single crystal ingot manufactures a SiC single crystal ingot by a sublimation recrystallization method using, as a seed crystal, the SiC single crystal body evaluated by the evaluation method.

There is provided an analytical method capable of generating a high resolution spectrum of X-rays with an intended energy. The analytical method is for use in an analytical apparatus having a diffraction grating for spectrally dispersing X-rays emanating from a sample, an image sensor for detecting the spectrally dispersed X-rays, and an incident angle control mechanism for controlling the incident angle of X-rays impinging on the diffraction grating. The image sensor has a plurality of photosensitive elements arranged in the direction of energy dispersion. The analytical method starts with specifying an energy of X-rays to be acquired. The incident angle is adjusted based on the specified energy to bring the focal plane of the diffraction grating into positional coincidence with those one or ones of the photosensitive elements which detect X-rays having the specified energy.

A calibration method is executed in an analysis device including a spectroscopic element for diffracting a signal generated from a specimen by irradiating the specimen with a primary beam, and a detector that detects the signal diffracted by the spectroscopic element, the detector having a plurality of detection regions arranged in an energy dispersion direction, and the detector detecting the signal to acquire a spectrum of the signal. The calibration method includes determining energy of the signal detected in each of the plurality of detection regions based on a positional relationship between the specimen and the spectroscopic element and a positional relationship between the spectroscopic element and each of the plurality of detection regions.

A device for the collection of X-rays includes at least one multi-reflection reflector cone. The multi-reflection reflector cone has a focal axis. A first portion of the multi-reflection reflector cone is oriented at a first angle to the focal axis, and a second portion of the multi-reflection reflector cone is oriented at a second angle to the focal axis.

A flip top spectrometer sample cell including first and second members each includes a window aligned with each other when the first and second members are coupled together defining a predefined spacing between the windows when the first and second members are coupled together, the first and second members decoupled for manually placing a fluid sample on a the window. The flip top spectrometer sample cell is configured to be withdrawn out of a housing for cleaning of the windows.

An integrated portable sample analysis system includes a portable case including an interior panel and a spectrometer subsystem. The spectrometer subsystem includes a flip top spectrometer sample cell including first and second members each including a window aligned with each other when the first and second members are coupled together defining a predefined spacing between the windows when the first and second members are coupled together, the first and second members decoupled for manually placing a fluid sample on a the window. An analyzer behind the interior panel receives the flip top spectrometer sample cell therein when the first and second members are coupled together for analyzing the fluid sample located between the windows by directing radiation through the windows and the fluid sample. The flip top spectrometer sample cell is configured to be withdrawn out of the analyzer for cleaning of the windows. The integrated portable sample analysis system also includes a viscometer subsystem including a flip top sample viscometer cell. The flip top sample viscometer cell includes a first plate including a rail configured to constrain a fluid sample manually presented thereto between its edges by surface tension, and a second plate including a surface spaced from the rail by a predefined gap for constraining fluid to the rail by surface tension when the rail is inclined by gravity and pulls the fluid along the rail. An analysis unit is behind the interior panel receiving the flip top viscometer sample cell therein when the first and second plates are coupled together for defining the viscosity of the sample flowing along said rail, and the flip top viscometer sample cell is configured to be withdrawn out of the analysis unit for cleaning of the rail. A processing subsystem is associated with the portable case and responsive to the spectrometer subsystem and the viscometer subsystem and configured to process outputs of the spectrometer subsystem and the viscometer subsystem and to provide a report concerning the sample, its physical properties, and its viscosity.

An x-ray spectrometer system includes an x-ray source, an x-ray optical system, a mount, and an x-ray spectrometer. The x-ray optical system is configured to receive, focus, and spectrally filter x-rays from the x-ray source to form an x-ray beam having a spectrum that is attenuated in an energy range above a predetermined energy and having a focus at a predetermined focal plane.

This fluorescent X-ray analysis apparatus is provided with an X-ray irradiation unit 20 for irradiating a sample S with: X-rays, having an energy that exceeds the energy absorption edge value of Ag which is selected as a measurement target element, and that is no greater than the energy absorption edge value of Sn which is an adjacent element having a higher energy absorption edge value than Ag; and X-rays having an energy exceeding the energy absorption edge value of Sn which is selected as a measurement target element.

Provided are an operation guide system, an operation guide method, and an operation guide program, which are capable of allowing a user to easily understand measurement of an X-ray optical system to be selected. A quantitative phase analysis device includes qualitative phase analysis result acquisition means for acquiring information on a plurality of crystalline phases contained in a sample, and weight ratio calculation means for calculating a weight ratio of the plurality of crystalline phases based on a sum of diffracted intensities corrected with respect to a Lorentz-polarization factor, a chemical formula weight, and a sum of squares of numbers of electrons belonging to each of atoms contained in a chemical formula unit, in the plurality of crystalline phases.