Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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23/00
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
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G01N23/22
by measuring secondary emission from the material
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G01N23/227
Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
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G01N23/2276
using the Auger effect, e.g. Auger electron spectroscopy [AES]
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