Patent classifications
G01N27/041
WEAR-OUT MONITOR DEVICE
The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
Verifying structural integrity of materials
A measurement system may include control electronics; an electrical signal source; a plurality of measurement system electrical contacts; at least one feature for repeatably electrically connecting the plurality of measurement system electrical contacts to selected locations of a tested material. The control electronics may be configured to cause the electrical signal source to output an electrical signal; determine a measured voltage in response to the electrical signal using a measurement electrical contact from the plurality of measurement system electrical contacts. The measurement electrical contact is electrically coupled to the tested material. The control electronics also may be configured to determine whether the tested material includes a crack or other defect based on the measured voltage.
Method for measuring spreading resistance and spreading resistance microscope
A method includes: removing at least a part of an oxide formed on a surface of the sample by relatively scanning the surface of the sample in X and Y directions parallel to the surface while bringing a probe into contact with the surface of the sample; detecting a signal by bringing the probe into contact with the surface of the sample from which at least a part of the oxide is removed at a predetermined detection position in the X direction or the Y direction while a bias voltage is applied to the sample; calculating a spreading resistance value based on the signal; and retracting the probe to keep the probe relatively away from the surface in a Z direction perpendicular to the surface while relatively moving the probe to a next detection position to start scanning the sample from the next detection position.
DETECTING STRUCTURAL INTEGRITY OF A STRUCTURAL COMPONENT
Each of a plurality electronic circuit devices fixed to a structural component of a physical structure can be scanned a first time, using a radio frequency (RF) scanner to receive, from each of the plurality of electronic circuit devices, first data indicating a first measured electrical impedance of a respective conductor connected to the electronic circuit device and an identifier assigned to the electronic circuit device. For each of the plurality of electronic circuit devices, the first data indicating the first measured electrical impedance and the identifier assigned to the electronic circuit device can be stored to a first memory. The first data indicating the first measured electrical impedance and the identifier for each of the electronic devices can form a baseline measurement of the electronic circuit devices.
Multi-functional precious stone testing apparatus and method thereof
A multi-functional precious stone testing apparatus includes a portable housing, a testing unit, and an indication unit. The portable housing includes a hand-held casing and a probe casing extended from a front end of the hand-held casing. The testing unit includes a conductive probe, a sensor, and a UV light source for emitting UV light beam, so as to allow the sensor to sense the UV reflected and refracted by a testing object for determining various qualities of the testing object.
Method and system for on-line monitoring electrolytic capacitor condition
A method for on-line monitoring an electrolytic capacitor condition comprising: measuring a voltage ripple across the electrolytic capacitor and the current ripple flowing through the electrolytic capacitor; measuring the temperature of the electrolytic capacitor; emulating the monitored electrolytic capacitor using a capacitor model comprising a capacitor and a solid state adjustable resistor, applying one of the measured ripple to the capacitor model, adjusting the solid state adjustable resistor to minimize the error between an estimated ripple provided by the capacitor model and the other measured ripple not applied to the capacitor model, and estimating an equivalent series resistance of the monitored electrolytic capacitor using value of the solid state adjustable resistor.
THREE-DIMENSIONAL ELECTRICAL RESISTIVITY TOMOGRAPHY METHOD AND SYSTEM
A three-dimensional electrical resistivity tomography method and system belonging to the field of geological geophysical prospecting, the method including the steps of prospecting a region containing a geological anomaly with at least two prospecting modes respectively to acquire two-dimensional resistivity data of a corresponding detection plane; unifying coordinate systems of resistivity data points acquired in all prospecting modes, and extracting data points with the same coordinates; carrying out data fusion on extracted resistivity data at the same position by utilizing a principal component analysis method; and carrying out three-dimensional coordinate conversion on resistivity data acquired after fusion to form a three-dimensional model.
Organic optoelectronic component
An organic optoelectronic component includes a first electrode which is made of an electrically conductive material, an active region which is made of an organic material, a second electrode which is made of an electrically conductive material, an encapsulating layer sequence which is made of a dielectric material, and a third electrode which is made of an electrically conductive material. The first electrode and the second electrode are arranged on different sides of the active region. The encapsulating layer sequence is arranged between the first electrode and the third electrode. The first electrode, the second electrode, and the third electrode can be contacted from outside the component.
High temperature corrosion sensor
A high temperature corrosion sensor is provided having (i) a housing having an external wall and an internal wall, the internal wall of the housing forming a chamber of the housing, (ii) a stainless steel tube inserted into the chamber, (iii) a ceramic tube wherein at least a portion of the ceramic tube is inserted into the stainless steel tube, (iv) an airflow tube that extends through the chamber, and (v) a sensor probe having a first working electrode, a second working electrode, a reference electrode, a positive electrical resistance, a negative electrical resistance, and a thermocouple, wherein at least a portion of each are encapsulated into a ceramic casting that is located at one end of the housing. Methods of measuring corrosion within a power plant environment are provided.
METHODS AND STRUCTURE TO PROBE THE METAL-METAL INTERFACE FOR SUPERCONDUCTING CIRCUITS
A method of measuring contact resistance at an interface for superconducting circuits is provided. The method includes using a chain structure of superconductors to measure a contact resistance at a contact between contacting superconductor. The method further includes eliminating ohmic resistance from wire lengths in the chain structure by operating below the lowest superconducting transition temperature of all the superconductors in the chain structure. The measurement is dominated by contact resistances of the contacts between contacting superconductors in the chain.