Patent classifications
G01N2035/00059
Methods and apparatuses for detecting microscope slide coverslips
A system is capable of detecting substrates and can differentiate between zero, one, or multiple transparent or semi-transparent substrates in a stack. The system can include an optical sensor, an optically anti-reflective element, and a detector. The optical sensor outputs light towards the optically anti-reflective element. The light detector is positioned to detect light from the light source that is reflected by substrates, if any, positioned within a detection zone between the optically anti-reflective element and the detector.
Test strip pickup mechanism, test strip moving apparatus, liquid sample analyzer, and test strip pickup method
Disclosed is a test strip pickup mechanism configured to pick up test strips for liquid sample analysis one by one from a test strip bottle, the test strip pickup mechanism including: a pickup head configured to suck and hold a test strip; and a motor for rotating the pickup head, wherein the pickup head is provided with a suction hole for sucking and holding the test strip, and the motor is a hollow motor, a hollow portion thereof being connected to the suction hole.
TEST PLATE PROCESSOR DEVICE AND METHODS FOR USING SAME
A test plate processing system for processing multiple test plates, comprising one or more software controlled processing devices, a liquid handler configured to place a predetermined amount of a test substance on the plate when the cover is in the first position, a software controlled test plate storage device having one or more test plate storage modules configured to house a plurality of test plates, and a software controlled test plate transport device configured to move one or more test plates to and from the test plate storage device. Each of the processing devices can have a working surface and a lifting mechanism configured to move a cover of the test plate between a first position and a second position relative to a plating surface of the test plate, wherein the cover is further away from the plating surface in the first position than in the second position.
TEST PLATE PROCESSOR DEVICE AND METHODS FOR USING SAME
A test plate processing system for processing multiple test plates, comprising one or more software controlled processing devices, a liquid handler configured to place a predetermined amount of a test substance on the plate when the cover is in the first position, a software controlled test plate storage device having one or more test plate storage modules configured to house a plurality of test plates, and a software controlled test plate transport device configured to move one or more test plates to and from the test plate storage device. Each of the processing devices can have a working surface and a lifting mechanism configured to move a cover of the test plate between a first position and a second position relative to a plating surface of the test plate, wherein the cover is further away from the plating surface in the first position than in the second position.
AUTOMATED SYSTEMS AND METHODS FOR LOADING SOLID REAGENT PELLETS INTO WELLS OF A CARTRIDGE
Systems and methods for loading reagent pellets into wells of a cartridge include a pellet transfer head including vacuum nozzles corresponding to the number and arrangement of the wells of the cartridge, a pellet reservoir holding reagent pellets, a vision sensor system for performing various system vision checks, and vertical and horizontal carriage assemblies to effect relative movement between the transfer head, pellet reservoir, cartridge, and vision sensor system. The pellet transfer head may include downwardly-facing pressure ports to supply gas flow into the pellet supply reservoir to fluidize the supply of pellets and a static eliminator fan to eliminate or reduce static buildup among pellets in the reservoir. A pellet is drawn from the reservoir to each vacuum nozzle, and the vision sensor system confirms that a single, unbroken and undeformed pellet is positioned at each nozzle and then confirms transfer of a single pellet to each well.
CELL MEMBRANE OBSERVATION AND ANALYSIS DEVICE AND CELL MEMBRANE OBSERVATION AND ANALYSIS METHOD
A cell membrane observation and analysis device includes at least: a microscope; and a substrate which has a plurality of holes, in which a cell membrane is placed on each hole of the substrate to be placed on the substrate, the cell membrane is immersed into a buffer solution while the cell membrane is suctioned through the hole, and the buffer solution is sealed, thereby observing and analyzing the cell membrane. Using the above-mentioned device, a substrate is prepared; a cell membrane is dispersed in a buffer solution, thereby preparing a suspension; the suspension is dripped onto a face of the substrate; the cell membrane is sucked through each hole to be placed on each hole; the cell membrane is immersed into a second buffer solution while the cell membrane is sucked; the second buffer solution is sealed; and the cell membrane is observed and analyzed with a microscope.
AUTOMATED SPECIMEN PROCESSING SYSTEMS AND METHODS OF DETECTING SPECIMEN-BEARING MICROSCOPE SLIDES
Systems and methods that enable automated processing of specimens carried on microscope slides are described herein. In some embodiments, the system can include, for example, a slide ejector assembly having a slide staging device configured to receive a slide and an over-travel inhibitor that includes a first vacuum port positioned to draw a first vacuum between the slide and a standby platform as the slide is moved across at least a portion of the standby platform. The over-travel inhibitor includes a first sensor for detecting a presence of the slide on the standby platform. The system can also include a transfer assembly to transport slides away from the slide ejector assembly. The transfer assembly can include a floating transfer head having a vacuum port for drawing a partial vacuum for holding the slide.
AUTOMATED SPECIMEN PROCESSING SYSTEMS AND METHODS
The disclosure presents systems and methods for processing a specimen slide using a specimen processing system. Specimen slides may sequentially be ejected from a slide carrier towards a label reader to determine an appropriate processing protocol for the slides. A cracking element may be engaged with the slide carrier prior to ejecting the slide, in order to break or crack any residual adhesive bond between edges of a slide and walls of the carrier. The specimen slides may be horizontally aligned and resting on a corresponding plurality of flat shelves, enabling even spacing via gravitational forces. The slides are therefore evenly spaced, enabling damage-free ejection of slides, and proper positioning for additional operations including scanning, viewing, heating, washing, and other processing. The label reader may process scanned information from the label of the slide to determine one or more attributes of the slide, and to generate an order or sequence of operations to be thereafter performed on the slide.
VACUUM CHUCK FOR HIGH WARPAGE WAFERS
A vacuum chuck for supporting a sample, the vacuum chuck comprising: a support plate having an upper planar support surface sized and shaped to retain a sample disposed thereon; one or more vacuum lines formed within the support plate; a plurality of cavities formed within the support plate, wherein each cavity is fluidly coupled to a vacuum line in the one or more vacuum lines and includes an aperture at an upper surface of the planar support surface; and a plurality of vacuum pad plungers corresponding in number to the plurality of cavities, wherein each vacuum pad plunger is disposed in a unique one of the cavities and comprises a plunger body having a vacuum channel extending through its length and a biasing mechanism, wherein the plunger body is moveable between an up position in which a portion of the plunger body extends through the aperture of its respective cavity protruding above the upper planar support surface and a down position in which the plunger body is retracted into the cavity, and wherein the biasing mechanism biases the plunger body in the up position.
Autosampler system with automated sample container cover removal and sample probe positioning
Systems and methods are described for integrated sample container cover removal and sample probe positioning. In an example implementation, an autosampler system includes, but is not limited to, a z-axis support rotatable about a z-axis of an autosampler deck; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe to withdraw a fluid-containing sample held within a sample container supported by the autosampler deck; and a sample cap remover coupled to the z-axis support in an orientation that is rotationally offset from the z-axis support with respect to the sample probe support structure, the sample cap remover configured to lift a cap from the sample container to provide access to an interior of the sample container by the sample probe supported by the sample probe support structure.