An optical measurement instrument is an integrated instrument that includes an optical cavity with a light source, a sample cuvette, and an optical sensor. The light source and sensor are on a bench that is on a translational or rotational mechanical platform such that optical beam can be moved to multiple sample containers. Each sample containers holds a distinct microorganism-attracting substance and a portion of a fluid sample containing an unknown microorganism. Each distinct microorganism-attracting substance is configured to bind with a single type of microorganism. The unknown microorganism in the fluid sample binds with the distinct microorganism-attracting substance in a single sample container. The instrument incubates the microorganism in the single sample container and detects the presence of the microorganism in the single sample container to thereby simultaneously identify the unknown microorganism.

The purpose of the present invention is to embody an inspection device wherein dew condensation in a sample container, in particular, in the lid thereof can be prevented or quickly removed without giving heat shock to a sample in the sample container. For this purpose, provided is an inspection device comprising an isothermal part 110 which comprises a rack 111 and maintains a sample container 150 storing a sample in a temperature-controlled environment, said sample container 150 comprising a plate and a lid, a detection part 120 which comprises an optical device for observing and inspecting the sample stored in the sample container, and a transportation part 130 which transports the sample container from the isothermal part to the detection part and vice versa, wherein at least one of the isothermal part, detection part and transportation part is provided with a member by which the lid of the sample container is held in a state lifted from the plate.

A measurement device includes: a container into which sample gas is to be injected; a liquefaction mechanism configured to liquefy the sample gas in the container; a near-infrared probe extending from inside to outside the container; and a near-infrared measuring instrument configured to measure an absorbance spectrum of the sample gas in a state of being liquefied by the liquefaction mechanism, via the near-infrared probe.

Systems, methods, and computer-program products for fluid analysis and monitoring are disclosed. Embodiments include a sampling system and an analytical system connected to the sampling system. A fluid may be routed through the sampling system and data may be collected from the fluid via the sampling system. The sampling system may process and transmit the data to the analytical system. The analytical system may include a command and control system to receive and store the data in a database and compare the data to existing data for the fluid in the database to identify conditions in the fluid. The system may further include a cooling system configured to enclose at least one member of the fluid analysis system. The cooling system encloses at least one member of the fluid analysis system including the excitation system, the detection system, the fluid inlet, the sample chamber, the Raman probe, and combinations thereof.

A concentration measuring device according to an embodiment may include a light-emitting unit configured to generate measurement light, a measurement unit configured to receive first measurement light that is part of the measurement light and that passes through a sample that is a measurement target, and a reference measurement unit configured to receive second measurement light that is part of the measurement light and that does not pass through the sample, wherein the concentration measuring device may be configured to measure a concentration of a chemical material in the sample by measuring an amount of light absorbed by the sample based on an amount of light detected by the measurement unit and an amount of light detected by the reference measurement unit.

This invention relates to a method of and system for facilitating detection of a particular predetermined gas in a scene under observation. The gas in the scene is typically associated with a gas leak in equipment. To this end, the system comprises an infrared camera arrangement; a strobing illuminator device having a strobing frequency matched to a frame rate of the camera; and a processing arrangement. The processing arrangement is configured to store a prior frame obtained via the infrared camera arrangement; and compare a current frame with the stored prior frame and generate an output signal in response to said comparison. The system also comprises a display device configured to display an output image based at least on the output signal generated by the processing arrangement so as to facilitate detection of the particular predetermined gas, in use.

The present invention relates to a device for spectroscopic measurements, in particular X-ray diffraction (XRD), temperature-resolved second harmonic generation (TR-SHG) or infrared (IR) measurements, which prevents the formation of condensation (dew) or ice (frost) when carrying out spectroscopic measurements in sub-ambient temperature conditions and to a method of spectroscopic measurements with said device.

The present invention relates to an optoelectronic chip for receiving a sample for optical examination, having a carrier layer, a thin-film lightguide having an active region, in which the sample interacts with a guided mode of the thin-film lightguide, wherein at least one scattering structure is arranged in the active region, which scatters a part of the light guided in the thin-film lightguide, whereby a reference light field is produced. The invention further relates to an optical system having such a chip. The system is used for the marker-free analysis of particles, particularly biomolecules in their natural environment.

The present invention relates to an optoelectronic chip for receiving a sample in the visualization of temperature-dependent processes, having a carrier layer, a thin-film lightguide and a thin-film heating element, wherein the thin-film lightguide and the thin-film heating element are preferably arranged on sides of the carrier layer that lie opposite each other.

A method and system are presented for use in measuring one or more characteristics of patterned structures. The method comprises: performing measurements on a patterned structure by illuminating the structure with exciting light to cause Raman scattering of one or more excited regions of the pattern structure, while applying a controlled change of at least temperature condition of the patterned structure, and detecting the Raman scattering, and generating corresponding measured data indicative of a temperature dependence of the detected Raman scattering; and analyzing the measured data and generating data indicative of spatial profile of one or more properties of the patterned structure.