Disclosed is a microfluidic detection device including a circuit substrate and a transparent substrate. The circuit substrate is provided with at least one first light-emitting device used to emit a detection beam, a photodetector used to receive the detection beam and send out a sensing signal, and a control circuit electrically connected to the first light-emitting device and the photodetector. The transparent substrate overlaps the circuit substrate and is provided with a microfluidic channel and a light guide structure. The light guide structure has a light incident surface disposed corresponding to the first light-emitting device and a light exiting surface disposed corresponding to the photodetector. The light guide structure extends from each of the light incident surface and the light exiting surface to the microfluidic channel and is adapted to transmit the detection beam into and out of the microfluidic channel.

An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.

Apparatus for optically exciting fluorescence and detecting light is disclosed. The apparatus comprises a device for optically exciting fluorescence. The device comprises a transparent substrate having first and second opposite faces and a multilayer stack disposed on the second face of the substrate. The multilayer stack comprises a first layer having first and second opposite faces and a first refractive index and a second layer having first and second opposite faces and a second refractive index. The first face of the first layer is disposed on the second face of the substrate. The first face of the second layer is disposed on the second face of the first layer such that the first layer is interposed between the second layer and the substrate. The substrate has a third refractive index. The first refractive index is less than the second refractive index and the third refractive index. The device further comprises a light source carried by the first face of the substrate and arranged to emit light towards the first face of the first layer. The apparatus comprises a detector directed at the substrate, the substrate interposed between the waveguide and the detector for detecting fluorescence.

A method of testing a sample for the presence of nitrate or nitrite, the method comprising the steps of: forming a mixture by contacting the sample with a composition comprising hydrogen peroxide or a hydrogen peroxide precursor and a fluorescent indicator precursor capable of forming a fluorescent indicator in the presence of peroxynitrite; irradiating the mixture; and measuring fluorescence from the fluorescent indicator. The method may be carried out using a device in which the mixture in a channel or chamber 101 of a microfluidic device is irradiated by light from light source 103 and emission from the fluorescent indicator is detected by photodetector 105.

An analytical test device (i) includes two or more sets of emitters (2, 3, 98, 101), each set of emitters (2, 3, 98, 101) comprising one or more light emitters (2, 3, 98, 101) configured to emit light within a range around a corresponding wavelength. Each set of light emitters (2, 3, 98, 101) is configured to be independently illuminable. The test device (1) also includes one or more photodetectors (4) arranged such that light from each set of emitters (2, 3, 98, 101) reaches the photodetectors (4) via an optical path (7) comprising a sample receiving portion (8). The emitters (2, 3, 98, 101) and photodetectors (4) are configured such that, at the sample receiving portion (8) of the optical path (7), a normalised spatial intensity profile generated by each set of emitters (2, 3, 98, 101) is substantially equal to a normalised spatial intensity profile generated by each other set of emitters (2, 3, 98, 101). The test device (1) also includes a liquid transport path (41) comprising a first end (43), a second end (4$) and a liquid sample receiving region (42). The liquid transport path (41) is configured to transport a liquid sample received in the liquid sample receiving region (42) towards the second end (44) and through the sample receiving portion (8) of the optical path (7).

A device for optically exciting fluorescence is disclosed. The device comprises transparent substrate having first and second opposite faces and a multilayer stack disposed on the second face of the substrate. The multilayer stack comprises a first layer having first and second opposite faces and a first refractive index and a second layer having first and second opposite faces and a second refractive index. The first face of the first layer is disposed on the second face of the substrate. The first face of the second layer is disposed on the second face of the first layer such that the first layer is interposed between the second layer and the substrate. The substrate has a third refractive index. The first refractive index is less than the second refractive index and the third refractive index. The device comprises a light source carried by the first face of the substrate and arranged to emit light towards the first face of the first layer.

A method for real-time surface imperfection detection for additive manufacturing and 3-D printing parts is provided. The method includes directing a first light radiation using one or more illumination sources, wherein the first light radiation illuminates a target area of a part being manufactured in a uniform chromatic light such that the target area appears to have a substantially uniform monochromatic color; capturing a current image of a second light radiation that is scattered or reflected by the target area using one or more feedback cameras; and analyzing the current image of the second light radiation using at least one of the one or more feedback camera with a previously acquired image to determine whether a surface imperfection exists or does not exist.

The invention relates to an arrangement for a spatially resolved and wavelength-resolved detection of light radiation emitted from at least one OLED or LED. A multilayer system is arranged between an electrode, an OLED or an LED, and a substrate and is formed using layers formed alternately above one another from a material having higher and lower optical refractive indices n. In this respect, light radiation from the at least one OLED or LED and having a plurality of different wavelengths 1, 2, 3, . . . n thus exits the multilayer system. Light radiation that exits at different wavelengths 1, 2, 3, . . . n at different angles is incident onto at least one detector array after at least a simple refraction at an optical element or after reflection at a layer or at a layer system of a sensor such that light radiation at a wavelength 1, 2, 3, . . . or n is incident onto a respective detector element of the detector array. The detector elements of the detector array are arranged discretely from one another.

An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.

The invention relates to a device for detecting a leak in a sealed enclosure, comprising an organic light-emitting diode intended to be placed inside the enclosure; and a device for measuring a value representative of at least one of the following parameters: a) the luminous efficacy of the diode; and b) the impedance of the diode.