An etalon-based mid-infrared probe can be configured for spectroscopic tissue discrimination, such as between non-normal (e.g., cancerous) and normal (e.g., healthy) tissue. A broadband light source can be applied to the etalon to generate fringes at spectroscopic wavelengths of interest, which can be delivered to a tissue specimen via a fiber loop probe. A response signal can be spectral dispersed across a parallel array of detector pixels, such as using a diffraction grating, and signal processed for performing the tissue classification. A learning model can be trained, using full IR spectral data, for applying a reduced set of wavelengths for performing the spectroscopic tissue analysis and classification.

High-throughput hyperspectral imaging systems are provided. According to an aspect of the invention, a system includes an excitation light source; an objective that is configured to image excitation light onto the sample, such that the excitation light causes the sample to emit fluorescence light; a channel separator that is configured to separate the fluorescence light into a plurality of spatially dispersed spectral channels; and a sensor. The excitation light source includes a light source and a plurality of lenslet arrays. Each of the lenslet arrays is configured to receive light from the light source and to generate a pattern of light, and the patterns of light generated by the lenslet arrays are combined to form the excitation light. The objective is configured to simultaneously image each of the patterns of light to form a plurality of parallel lines or an array of circular spots at different depths of the sample.

Provided are an image reconstruction method, a device and a microscopic imaging device. The method includes calculating a gray value at each fiber center in a fiber bundle (04) in a reconstructed image according to a gray value at a center position of each fiber, determined in one or more sample images; performing a spatial interpolation using the gray value at the fiber center to obtain gray values of other pixel points in the fiber bundle (04) in the reconstructed image, so as to form the reconstructed image. This image reconstruction method greatly accelerates the speed of image reconstruction, and is helpful to remove the grating (022) and fiber bundle (04) cellular grid residues in the reconstructed image and improve the imaging quality of the reconstructed image.

The technology disclosed present systems and methods to produce an enhanced resolution image from images of a target using structured illumination microscopy (SIM). The method includes transforming at least three images of the target captured by a sensor in a spatial domain into a Fourier domain to produce at least three frequency domain matrices that each include first blocks of complex coefficients and redundant second blocks of complex coefficients that are conjugates to the first blocks. The method includes reducing computing resources required to produce the enhanced resolution image by using first blocks of complex coefficients to produce at least three phase-separated half-matrices in the Fourier domain. The method includes performing one or more intermediate transformation on the phase-separated half-matrices to produce realigned shifted half-matrices. The method includes calculating complex coefficients of second blocks in the Fourier domain to produce full matrices from half-matrices.

A nonlinear element provides a nonlinear effect to light output from a pulsed laser source. Remaining light component having the oscillation wavelength of the pulsed laser source is attenuated when the light is split by a dichroic mirror. The divided light is subjected to pulse stretching by a fiber, and is combined by a multiplexing element. The light thus combined is irradiated to a target object S. The light transmitted through the target object S is received by a photoreceiver. The output signal of the photoreceiver is converted by a calculation unit into a spectrum.

Embodiments of the present invention provide an apparatus for determining spectral information of a three-dimensional object, comprising a cavity (110) for location in relation to the object, an imaging light source (120) located in relation to the cavity, wherein the imaging source is controllable to selectively emit light in a plurality of wavelength ranges, structured light source (130) for emitting structured illumination toward the object, wherein the structured light source comprises a plurality of illumination devices arranged around the cavity, one or more imaging devices (140) for generating image data relating to at least a portion of the object, a control unit, wherein the control unit (1100) is arranged to control the structured light source to emit the structured illumination and to control the imaging light source to emit light in a selected one or more of the plurality of wavelength ranges, a data storage unit (1120) arranged to store image data corresponding to the structured illumination and each of the selected one or more of the plurality of wavelength ranges, and processing means (1110) arranged to determine depth information relating to at least a portion of the object in dependence on the image data corresponding to the structured illumination stored in the data storage means.

A snapshot ellipsometer or polarimeter which does not require temporally modulated element(s) to measure a sample, but instead uses one or more spatially varying compensators, (eg. microretarder arrays and compound prisms), to vary the polarization state within a measurement beam of electromagnetic radiation. Analysis of an intensity profile of the beam after interaction with the spatially varying compensator(s) and the sample, and after having source beam wavelength content determined using a digital light processor, and/or being directed by a digital light processor elements toward elements in the detector, allows sample parameters to be characterized.

An inspection device includes an objective lens that transmits inspection light reflected from a sample during inspection and measurement light from a point light source during aberration measurement, a first pupil relay lens that transmits the inspection light and the measurement light, a second pupil relay lens in which an intermediate imaging plane is formed between the second pupil relay lens and the first pupil relay lens, a diffraction grating disposed between the first pupil relay lens and the intermediate imaging plane and that diffracts the measurement light, a point diffraction interferometry plate disposed within a depth of focus of the intermediate imaging plane and that selectively transmits the diffracted light, a first detector that detects an image of the sample, and a second detector that detects a fringe image of the measurement light.

The prism-coupling systems and methods include using a prism-coupling system to collect a 2D digital mode spectrum of an IOX article. The mode line and critical angle positions and orientations are found by performing a weighted fit to mode line and critical angle images and are used to define a compensated mode spectrum. If mode line tilt is found, it is removed from the 2D digital mode spectrum to define the compensated mode spectrum. The compensated mode spectrum is then processed using techniques known in the art to provide a more accurate estimate of stress-related characteristics of the IOX sample versus using the uncompensated mode spectrum. Derivative-based methods of accurately establishing positions of intensity transitions in a mode spectrum of an IOX sample using a derivative spectrum and curve fitting are also disclosed.

A microfluidic apparatus is provided. The microfluidic apparatus includes a first substrate having a first side and a second side opposite to each other; a grating layer on the second side of the first substrate, the grating layer including a plurality of grating blocks of different wavelength selectivity; a second substrate having a third side and a fourth side opposite to each other; the fourth side of the second substrate on a side of the third side away from the first substrate, and the second side of the first substrate on a side of the first side away from the second substrate; a light detection layer on the third side of the second substrate, the light detection layer including a plurality of detectors; and a microfluidic layer between the first substrate and the light detection layer, the microfluidic layer including a plurality of microfluidic channels.