Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.

A system in an embodiment can comprise an optical assembly, an surface-plasmon-resonance (SPR) light source, and an SPR camera. The optical assembly can comprise a hemispherical prism comprising a top surface configured to support a SPR sensor; and a high numerical aperture (NA) lens located distal from the top surface of the hemispherical prism. The SPR light source can be configured to emit a light beam for SPR imaging. The SPR camera can be configured to capture an SPR image. The SPR sensor further can comprise a surface configured to contact a sample. The high NA lens can be configured to refract the light beam toward the hemispherical prism. The hemispherical prism can be configured to collimate the light beam, as refracted by the high NA lens, toward the SPR sensor. The high NA lens further can be configured to receive and refract the light beam toward the SPR camera, after the light beam is reflected by the surface of the SPR sensor. Other embodiments are disclosed.

Systems and methods presented herein generally relate to a tool for determining a refractive index of a formation fluid using attenuated total reflection. The tool includes a body having a fluid admitting assembly and a flow line that receives the formation fluid. The tool also includes two different crystals having faces in contact with fluid in the flow line. The tool further includes at least one light source coupled to the crystals and configured to direct light into the crystals. In addition, the wavelength, the refractive indices, and the angles of incidence are configured such that the light undergoes total internal reflection at interfaces between the crystals and the formation fluid. The tool also includes at least one light detector coupled to the crystals and configured to measure reflected light exiting the crystals. The tool further includes at least one processor coupled to the at least one light detector.

An imaging reflectometer includes a source module configured to generate a plurality of input beams at different nominal wavelengths. An illumination pupil having a first numerical aperture (NA) is arranged so that each of the plurality of input beams passes through the illumination pupil. A large field lens is configured to receive at least a portion of each of the plurality of input beams and provide substantially telecentric illumination over a sample being imaged. The large field lens is also configured to receive reflected portions of the substantially telecentric illumination reflected from the sample. The reflected portions pass through an imaging pupil having a second NA that is lower than the first NA and are received by an imaging sensor module that generates image information.

The present invention is an underwater analysis device (10) for analyzing absorption capacity of water. Accordingly, the subject matter device is characterized by comprising a body (100) having a sealed first casing (110) which accommodates a sealed illumination window (111); a sealed second casing (130) which accommodates a sealed measurement window (131); a prismatic hollow water chamber (120) provided between said first casing (110) and said second casing (130) and arranged such that a first inlet (121) thereof faces said illumination window (111) and such that a second inlet (122) thereof faces said measurement window (131); said water chamber (120) comprises pluralities water transfer openings (123); said first casing (110) comprises a light emitting unit (113) arranged to emit test light from the illumination window (111) towards the measurement window (131); said second casing (130) comprises a light sensing unit (133) arranged to at least partially receive the test light passing through the water in the water chamber (120) and to embody in a manner generating signal in accordance with the density of the received test light components.

An inspection chip according to the present invention is an inspection chip for stirring liquid by a circular movement of a bottom surface end, including a well main body for accommodating the liquid and a side wall member arranged on a side surface of the well main body. The bottom surface end has a bottom surface structure in contact with a rotating member for allowing the bottom surface end to perform the circular movement in a position leaning from a center line of the well main body toward the side wall member.

Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.

The invention relates to an optical group for detection light of a microscope, in particular a confocal scanning microscope, having an input plane (10) for the passage of detection light to be measured and having a detection beam path arranged downstream of the input plane for guiding the detection light (11) into a detection plane (67), wherein the detection beam path has at least one first beam course (1) having first optical beam-guiding means, in particular first lenses and/or mirrors (20, 30, 34, 36, 58, 60, 66), for guiding the detection light into the detection plane. In the first beam course, the optical group has at least one dispersive device (26) for the spatial spectral splitting of the detection light to be measured and a manipulation device (49) for manipulating the spectrally spatially split detection light. The first optical beam-guiding means together with the dispersive device and with the manipulation device are arranged and designed to produce a spectrally separated and diffraction-limited image of the Input plane into the detection plane. The optical group preferably has a second beam course (2) having optical beam-guiding means and has a selection device (22) for selecting the first beam course (1) or the second beam course (2). In further aspects, the invention relates to a method for microscopy and to a microscope.

There is set forth herein a light energy exciter that can include one or more light sources. A light energy exciter can emit excitation light directed toward a detector surface that can support biological or chemical samples.

A multichannel angular spectrometer includes an array of fiber pickups having an arcuate arrangement and focused about a sample volume. A broadband light source is configured to illuminate a sample within the sample volume. At least one dispersion element is in optical communication with the array of fiber pickups. An imaging sensor is in optical communication with the array of fiber pickups. The imaging sensor is configured to image the broadband light received by the array of fiber pickups and dispersed by the at least one dispersion element. A processor is in electrical communication with the imaging sensor. The processor has a power supply and computer-readable memory.