Real-time multidimensional terahertz imaging system and method, the method comprising method for imaging an object, comprising, in a laser pump line: patterning a laser pump beam with known patterns of a radiation beam and illuminating the object with the radiation beam; yielding a patterned pump beam; directing the patterned beam from the pump line and a laser probe beam from a laser probe line to a detection crystal; single-shot detection of the radiation beam waveform; and correlating the single-shot detection and the known patterns.

An apparatus for inspecting containers and in particular cans, having an illumination device which illuminates the can to be inspected and radiates radiation onto an inner base wall of the container, and having an image recording device which records at least one spatially resolved image of the inner base wall illuminated by the illumination device is provided. The apparatus has a first polarization device in a beam path between a light source of the illumination device and the inner base wall in such a way that the radiation reaching the inner base wall is polarized, wherein the illumination device being designed in such a way that a predominant proportion of the radiation irradiated into the container by the illumination device reaches the inner base wall.

Provided is a biosensor device. The biosensor device includes a light source configured to generate source light, a photodetector configured to detect the source light, and a sample box accommodating a biomaterial that receives the source light to generate structured light beam from the source light. The sample box may include a substrate, a spacer on an edge of the substrate, a cover plate on the spacer, and a lower metamaterial pattern disposed on a top surface of the substrate.

An apparatus and method for Crystal Anisotropy Terahertz Microscopy (“CATM”) is provided. The apparatus includes an emitter configured to emit a THz pulse and a detector configured to detect the THz pulse after the pulse is transmitted through a sample disposed on a sample surface of the detector. A pulsed radiation generator generates a probe beam to interrogate the detector. The detector may include an electro-optical (“EO”) crystal configured to change in birefringence according to the THz pulse. The sample surface of the detector may have a dielectric coating which is transmissive to THz and reflective to the probe beam. The sample is disposed on the dielectric coating.

Methods for producing a high resolution image of a sample are provided. In some embodiments, the method includes: detecting first and second sets of spatially-dependent emission signals from a sample labeled with a fluorescent polymeric dye; and producing a high resolution fluorescence image of the sample from the detected first and second sets of spatially-dependent emission signals. In some embodiments, the sample is a cell. Also provided are systems for imaging a sample that include a high resolution light microscope including a light source configured to irradiate a field of view with an excitation light; a photodetector configured to detect an emission signal: and a polarization modulator disposed in the light pathway between the light source and the photodetector; and a sample labelled with a polymeric dye and disposed in the field of view.

A self-contained metrology wafer carrier systems and methods of measuring one or more characteristics of semiconductor wafers are provided. A wafer carrier system includes, for instance, a housing configured for transport within the automated material handling system, the housing having a support configured to support a semiconductor wafer in the housing, and a metrology system disposed within the housing, the metrology system operable to measure at least one characteristic of the wafer, the metrology system comprising a sensing unit and a computing unit operably connected to the sensing unit. Also provided are methods of measuring one or more characteristics of a semiconductor wafer within the wafer carrier systems of the present disclosure.

An inspection device of a display device includes a first illumination unit providing a first incident light to the display device at a first incident angle, a second illumination unit providing a second incident light to the display device at a second incident angle, a third illumination unit providing a third incident light to the display device at a third incident angle, and a defect detector receiving at least one of a first reflection light obtained from the first incident light reflected by the display device at a first reflection angle, a second reflection light obtained from the second incident light reflected by the display device at a second reflection angle, and a third reflection light obtained from the third incident light reflected by the display device at a third reflection angle to detect defects of the display device.

Methods and systems for generating inspection results for a specimen with an adaptive nuisance filter are provided. One method includes selecting a portion of events detected during inspection of a specimen having values for at least one feature of the events that are closer to at least one value of at least one parameter of the nuisance filter than the values for at least one feature of another portion of the events. The method also includes acquiring output of an output acquisition subsystem for the sample of events, classifying the events in the sample based on the acquired output, and determining if one or more parameters of the nuisance filter should be modified based on results of the classifying. The nuisance filter or the modified nuisance filter can then be applied to results of the inspection of the specimen to generate final inspection results for the specimen.

Disclosed are optical computing devices that employ birefringent optical elements configured for use in optical computing devices. One optical computing device includes a polarizer configured to generate at least x polarized light and y polarized light, a birefringent integrated computational element configured to optically interact with a substance and the polarizer, thereby generating optically interacted light, and at least one detector arranged to receive the optically interacted light and generate an output signal corresponding to a characteristic of the substance.

An in-situ on-line detection device and detection method for a long-distance metallurgical liquid metal component. The detection device comprises a front-end high-temperature resistant probe, a middle-end optical sensing device and a back-end control platform, wherein the head of the front-end high-temperature resistant probe is placed in a liquid metal, the tail thereof is coaxially connected to the middle-end optical sensing device, and an optical window is arranged in the connection position; and the middle-end optical sensing device is connected to the back-end control platform through a signal line. The detection device and detection method can provide a timely and valid message for quality control and a melting end, so that the detection time is greatly shortened, the detection distance can he adjusted extensively, the measurement result is accurate, and it can be achieved to measure components that are difficult to measure such as carbon, sulfur, phosphorous, etc.