The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

A side surface inspection device is provided for a cylindrical battery having a side surface defining a first region and a second region as a remainder of the side surface. The device includes a first light to emit light to the side surface of the cylindrical battery; a first mirror and a second mirror on respective sides of the cylindrical battery to each reflect light from respective portions of the first region of the cylindrical battery; and a camera to capture a first image from the light reflected by the first mirror, and to capture a second image from the light reflected by the second mirror. The first region of the cylindrical battery is more than half of the side surface of the cylindrical battery. The first and second images corresponds to a full region of the first region of the cylindrical battery.

Multi-modality imaging systems and methods for enabling controllable and/or automated switching between different imaging systems or modes. An imaging system includes a base plate having a first exposed region and a second region, a sample stage configured to hold a sample platform, and a first translation mechanism configured to translate the sample stage on the base plate along a first axis between a first position and a second position. In the first position the sample stage is positioned proximal to the first exposed region, and in the second position, the sample stage is positioned proximal to the second region. An illumination device is configured to illuminate a portion of the first exposed region, and a second translation mechanism is configured to translate the illumination device along a second axis substantially perpendicular to the first axis.

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

The present invention relates to an apparatus for classification of matter comprising: a scanning element is configured to redirect the at least one illumination beam and to shift a plurality of inspection zones and an irradiated area relative said matter in the first direction. A processing circuitry configured to execute: a second zone collection function configured to collect second zone data based which pertains to said optical radiation emitted by said matter in the second inspection zone, a third zone collection function configured to collect third zone data based which pertains to optical radiation emitted by said matter in the third inspection zone, a classification function configured to classify said matter based on the second zone data and the third zone data.

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

A light sheet microscope for imaging biological materials uses a plurality of light beams, focused to an overlapping line to excite a fluorescent material within the biological sample. The laser-induced fluorescence image is then analyzed and displayed.

The present disclosure relates to an inspection system for inspecting objects passing through an inspection area, which inspection area is divided into a plurality of elongated inspection zones having a longitudinal extension, the inspection system comprising: at least one detector and a scanning element adapted for redirecting the detector's field of view to any one of the plurality of elongated inspection zones, wherein the scanning element is adapted to rotate around a first rotational axis and comprises at least two reflective surfaces which redirect the detector's field of view to different inspection zones of the inspection are. A method for inspecting objects passing through an inspection area by an inspection system is also disclosed.