Methods, devices, and systems are provided for analyzing the moisture content in natural gas. In one embodiment, a portable moisture analyzer system is provided and can include a moisture analyzer and a housing. The moisture analyzer can include a tunable diode laser absorption spectrometer (TDLAS) and a natural gas sample conditioning system. The TDLAS can be configured to detect water vapor content within a natural gas sample. The sample conditioning system can be in fluid communication with the TDLAS and can be configured to condition at least one of temperature, flow rate, and pressure of a natural gas sample. The housing can be configured to receive the moisture analyzer therein and to protect the moisture analyzer from vibration and/or shock.

Apparatus for determining concentration of a targeted gas in environmental air, the apparatus includes a non-dispersive infrared (NDIR) sensor, a pressure sensor coupled in fluid communication with an interior of the NDIR sensor; and a processor. The processor is configured to receive pressure data from the pressure sensor based on gas pressure within an interior of the NDIR sensor, receive a target-gas concentration signal from the NDIR sensor, and produce a pressure-compensated concentration signal based on the target-gas concentration signal, a predetermined reference pressure and the pressure data from the pressure sensor.

A gas analyzer is provided, capable of measuring specific gas amount information within a measurement target gas in which pressure varies greatly. The gas analyzer includes a calculation member for calculating specific gas amount information of the nth cycle, a gas pressure change amount calculation unit for calculating an amount of gas pressure change at each time, and a correction signal creation member for generating a time changing, corrected light intensity at each wavelength , by performing a fitting process using the time-changing intensity over a long time period in a time zone in which the amount of gas pressure change is small but using the time-changing intensity over a short time period in a time zone in which the amount of gas pressure change is large. The calculation member generates a light intensity change of the measurement light in the predetermined wavelength range of 1 to 2 of the nth cycle by using the time changing, corrected light intensity at each wavelength , and calculates the specified gas amount information for the nth cycle.

An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.

A detection device includes a substrate, first electrodes formed on a first surface of the substrate, a responsive layer, and second electrodes formed on a first surface of the responsive layer, each of the second electrodes are capacitively coupled to one of the first electrodes and each second electrode is connected to a power supply to provide driving power.

Apparatus for determining concentration of a targeted gas in environmental air, the apparatus includes a non-dispersive infrared (NDIR) sensor, a pressure sensor coupled in fluid communication with an interior of the NDIR sensor; and a processor. The processor is configured to receive pressure data from the pressure sensor based on gas pressure within an interior of the NDIR sensor, receive a target-gas concentration signal from the NDIR sensor, and produce a pressure-compensated concentration signal based on the target-gas concentration signal, a predetermined reference pressure and the pressure data from the pressure sensor.

Methods, devices, and systems are provided for analyzing the moisture content in natural gas. In one embodiment, a portable moisture analyzer system is provided and can include a moisture analyzer and a housing. The moisture analyzer can include a tunable diode laser absorption spectrometer (TDLAS) and a natural gas sample conditioning system. The TDLAS can be configured to detect water vapor content within a natural gas sample. The sample conditioning system can be in fluid communication with the TDLAS and can be configured to condition at least one of temperature, flow rate, and pressure of a natural gas sample. The housing can be configured to receive the moisture analyzer therein and to protect the moisture analyzer from vibration and/or shock.

A method includes receiving a gas mixture at a first pressure including at least a primary gas and a secondary gas and changing a pressure of the received gas mixture from the first pressure to a second pressure. Further, the method includes determining a spectra of the gas mixture at the second pressure, wherein at least the first spectral line of the primary gas is spectrally distinguished from at least the second spectral line of the secondary gas, identifying a peak wavelength associated with the spectrally distinguished first spectral line of the primary gas based on at least two wavelengths of the secondary gas corresponding to at least two peak amplitudes in the spectra of the gas mixture, and determining a concentration of the primary gas based on the identified peak wavelength associated with the spectrally distinguished first spectral line of the primary gas.

A method of using a spectrometer to produce corrected diamond Attenuated Total Reflectance (ATR) spectral data includes acquiring, using the spectrometer, an initial set of ATR spectral data for a sample pressed into contact with a diamond ATR crystals; numerically matching, using the spectrometer, a pressure dependent diamond artifact reference spectrum to a corresponding pressure dependent diamond artifact in the initial set of ATR spectral data; and numerically subtracting out the numerically matched pressure dependent diamond artifact reference spectrum from the initial set of ATR spectral data to yield a corrected set of ATR spectral data for the sample for output by the spectrometer.

Systems are provided for contactless determining a physical feature of a target item. Such systems comprise a scanner unit, a detector unit and a determiner unit. The scanner unit is configured to operate according to a relative position between the target item and the scanner unit, said operation including emitting a scanning radiation onto the target item and measuring an interaction radiation caused by interaction of the scanning radiation with the target item. The detector unit includes one or more measurers configured to measure, irrespective of the relative position or variations thereof, a condition potentially distorting the operation by the scanner unit. The determiner unit is configured to determine the physical feature of the target item depending on the interaction radiation measured by the scanner unit and the potentially distorting condition measured by the detector unit. Methods and computer programs performable at or by said systems are also provided.