One aspect provides a system, including: a sensor adjustment component having: a memory device having adjustment information stored therein; a light engine capable of producing a signal detectable by a light detector of an optical sensor to be adjusted; and one or more processors; where the one or more processors are configured to execute program instructions to operate the light engine to produce a predetermined light pattern detectable by the light detector of the optical sensor to be adjusted; where the predetermined signal pattern comprises the adjustment information; and where the adjustment information configures said light detector that receives said predetermined signal pattern carrying the adjustment information. Other aspects are disclosed.

An optical gas sensor device includes: a light source that emits an infrared ray to a detection target gas; an optical filter that transmits an infrared ray having a wavelength corresponding to an absorption wavelength of the detection target gas; a light receiver that detects the infrared ray entering through the optical filter and generates a detection signal; and a signal processor. The signal processor calculates a gas concentration of the detection target gas or a value corresponding to the gas concentration, based on the detection signal, compares the calculated gas concentration or the calculated value corresponding to the gas concentration with a predetermined threshold, and determines a state of the optical gas sensor device, based on a result of the comparison.

An apparatus and method, the apparatus comprising: an information electrode;a ground electrode;a photo-resistive element configured to enable the information electrode to be connected to the ground electrode; and wherein the apparatus is configured to enable a sensor element to be positioned overlaying the photo-resistive element such that a change in optical properties of the sensor element controls the connection between the ground and information electrodes.

An in-vitro diagnostic (IVD) analyzer 200 comprising an optical detection unit 217 comprising a cuvette 214 for the optical measurement of a biological sample 2, 2 is herein disclosed. The IVD analyzer 200 further comprises a piezo actuator 218 arranged on one side of the cuvette 214 configured to transmit ultrasonic waves 254, 254 through the cuvette 214, a piezo receiver 218 arranged on the opposite side of the cuvette 214 configured to receive ultrasonic waves 255, 255, 255 transmitted through the cuvette 214 and a controller 250 configured to operate according to either a lysis operating mode (L) or an air-detection operating mode (AD). According to the lysis operating mode (L) the piezo actuator 218 is configured to transmit ultrasonic waves 254 through the cuvette 214 for disrupting cellular particles contained in the biological sample 2. According to the air-detection operating mode (AD) the piezo actuator 218 is configured to transmit ultrasonic waves 254 through the cuvette 214 and the controller 250 is configured to correlate changes in amplitude and/or shifts of phase of the ultrasonic waves 255, 255, 255 received by the piezo receiver 218 relative to reference values with an eventual presence and quantity of air 3 in the cuvette 214, in order to determine if the optical measurement of the biological sample 2, 2 is affected by the presence of air 3. A respective automated method of operating the in-vitro diagnostic analyzer 200 in order to determine if the optical measurement of the biological sample 2, 2 is affected by the presence of air is herein also disclosed.

This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample.

A component measurement apparatus includes: a chip insertion space for inserting a component measurement chip provided with a reagent that reacts with a component to be measured in a sample; a light emitting unit configured to emit radiation light to the component measurement chip in a state in which the component measurement chip is inserted into the chip insertion space; a light receiving unit configured to receive light transmitted through or reflected from the component measurement chip; and a control unit configured to determine whether there is a possibility that an incorrect processing mode has been selected for execution.

A system for calculating a concentration of a water treatment chemical includes a water analyzer, databases storing information regarding a chemical component of the water treatment chemical, a server sending the information stored in the database, and a communication device sending the information acquired from the server to the water analyzer. The water analyzer includes a storage unit storing a calibration curve defining the relationship between the concentration of a chemical component and absorbance, a communication unit receiving the information regarding the chemical component of the water treatment chemical, an irradiation unit irradiating water to be analyzed with light, a detection unit detecting transmitted light, and an arithmetic and control unit calculating absorbance from the result of the detection by the detection unit, acquiring a calibration curve from the storage unit, and calculating the concentration of the chemical component with reference to the acquired calibration curve and the measured absorbance.

The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Embodimentsinvolve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer (depending on whether the incident light beam is received by a detector recording it in reflection or transmission from the conductive layer). The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The method then provides for comparing the first and second values to detect a change in refractive index at the layer after the first signal and before the second signal was captured.

A system for measuring optical signal detector performance includes an optical signal detector comprising a first detection channel having a first light source and a first sensor. The first detection channel is configured to emit and focus light generated by the first light source at a first detection zone, and to receive and focus light on the first sensor. The system also includes a controller operatively coupled to the optical signal detector and configured to determine an operational performance status of the optical signal detector based on at least one of (i) a first measured characteristic of light focused on the sensor while a first non-fluorescent surface portion is in the first detection zone and (ii) a second measured characteristic of light focused on the sensor while a void is in the first detection zone. The optical signal detector can be a fluorometer.

The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Processing SPR signals can involve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer. The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The first and second values can be compared to detect a change in refractive index at the layer after the first signal and before the second signal was captured.