A method for testing an interfacial tribochemical reaction between a diamond wafer and active metal abrasive or metal oxide abrasive is provided. A surface of a diamond indenter used in a nano scratch tester is coated with a layer of the active metal abrasive or the metal oxide abrasive with uniform and controllable thickness by magnetron sputtering, and an interface interaction between the layer of the active metal abrasive or the metal oxide abrasive and the diamond wafer is controlled by a scratch test of the diamond wafer. Chemical components of an interaction section on a surface of the diamond wafer are analyzed by the scanning probe micro Raman spectrometer.

Hardness testers having a pivoting body and capable of providing power to accessories on the pivoting body are disclosed. An example hardness testing device includes: a rotating carriage configured to: hold at least one of an indenter or an objective and at least one accessory; and rotate to selectively place the at least one indenter or objective or the at least one accessory in an operative position to operate the at least one indenter or objective or the at least one accessory; a carriage mount configured to support the rotating carriage; and an electrical contact block mounted stationary with respect to the carriage mount, the electrical contact block comprising a plurality of electrical contacts configured to make electrical contact with a counterpart electrical contact block of the at least one accessory coupled to the rotating carriage when the at least one accessory is positioned in the operative position.

A measuring device for detection pf measurement signals during a penetrating movement of a penetrating member into a surface of a test object or during a sensing movement of the penetrating member on the surface of the test object. The measuring device includes a housing which accommodates a force generating device and on which a holding element is arranged remote from the force generating device, which holding element is movable relative to the housing at least in one direction along a longitudinal axis of the housing and which accommodates the penetrating member. The measuring device also includes at least one first measuring element for measuring the penetration depth of the penetrating member into the surface of the test object or a traversing movement of the penetrating member along the longitudinal axis relative to the housing during a sensing movement on the surface of the test object, wherein a transmission element is provided which extends between the force generating device and the penetrating member.

An apparatus for performing a contact mechanics test in a substrate includes a stylus having at least two contact elements. Each contact element has a contact profile, and the contact elements are disposed in the stylus to define a stretch passage therebetween. The stylus is configured to deform the substrate so as to cause the substrate to flow between the contact elements and induce tension in the substrate in order to generate and preserve micromodifications in the substrate. Methods of performing a contact mechanics test using the apparatus are also provided.

The present disclosure discloses a rock high-stress high-temperature micro-nano indentation test system, comprising: an X, Y, Z three-direction macroscopic adjustment module, an indentation precision loading module, an indentation test module and an indentation data processing module. The rock high-stress high-temperature micro-nano indentation test system further comprise a two-dimensional horizontal stress loading device, a temperature control device and a vacuum device 13. The rock high-stress high-temperature micro-nano indentation test system provided by the present disclosure has distinctive features of modularity and structuralization, and its test results have high accuracy. The rock high-stress high-temperature micro-nano indentation test system is easy to operate, and provides a theoretical and technical system support for testing the mechanical characteristics of the rock under the high-stress and high-temperature environment in the deep region.

An object hardness measuring device includes a first side portion, a second side portion, a pedestal unit, a load unit, a measuring unit, and a holding unit. The load unit applies a load to the measurement object. The measuring unit is able to measure, in a state where the load acts on the measurement object, at least one of a movement distance of the second side portion with respect to the first side portion and a change amount of the load when the second side portion is moved either at a predetermined speed or to a predetermined position. The holding unit is able to hold the measurement object, and is movable between the first side portion and the second side portion by the slide rail unit.

The invention provides a test device and method for controlling a low-temperature environment. A double-layer stainless steel plate forms an interlayer cavity of a cooling box; four walls of the cooling box are provided with a heat insulation plate; a probe thermometer is disposed on a side wall of the cooling box; both the top of a press and the bottom of an indenter of a universal testing machine are provided with a fiberglass reinforced plastic pipe cover; the cooling box is disposed on the press; the indenter is disposed in the cooling box through a through hole; a cold bath device communicate with the cooling box; the cold bath device and the interlayer cavity are provided with a freezing liquid; a stress-strain data acquisition instrument is connected to a sample in the cooling box through a strain gage and a strain gage connection line.

Systems and methods for accurate characterization of the mechanical properties of ultra-soft materials in the meso/macro-length scale are provided. Through the use of a millimeter-scale, ultra-high molecular weight indenter probe, accurate mechanical characterization of ultra-soft materials on the centimeter-scale can be achieved. The indenter probe can capture the adhesion forces present during the approach and detachment segments of the indentation process.

An inspection substrate for use in inspecting whether or not a constituent element of a cutting apparatus forms a scratch on a top surface of a workpiece when a cutting blade cuts the workpiece, the inspection substrate includes a top surface side of the inspection substrate having a groove portion for simulated cutting, the groove portion having a width that the cutting blade can pass through, and a paint layer disposed on the top surface side of the inspection substrate to improve visibility of a scratch formed on the top surface side.

Disclosed is a method for obtaining properties using an indentation. The method includes an initial value calculating step, a reference value calculating step, a pre-set value setting step and a checking step. So the method obtains properties only using an indentation without additional experiments