Patent classifications
G01N2203/0286
MEMS-based nanoindentation force sensor with electro-thermal tip heating
A MEMS microforce sensor for high temperature nanoindentation is used for determining a mechanical property of a sample by sensing a deflection and measuring a force. The MEMS microforce sensor includes at least a cold movable body, a heatable movable body, a heating resistor and capacitor electrodes. The cold movable body and the heatable movable body are mechanically connected by at least one bridge and the capacitor electrodes measure a force applied on the sample by sensing the deflection of the cold movable body relative to the outer frame by a change of electrical capacitance.
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
Rock high-stress high-temperature micro-nano indentation test system
The present disclosure discloses a rock high-stress high-temperature micro-nano indentation test system, comprising: an X, Y, Z three-direction macroscopic adjustment module, an indentation precision loading module, an indentation test module and an indentation data processing module. The rock high-stress high-temperature micro-nano indentation test system further comprise a two-dimensional horizontal stress loading device, a temperature control device and a vacuum device 13. The rock high-stress high-temperature micro-nano indentation test system provided by the present disclosure has distinctive features of modularity and structuralization, and its test results have high accuracy. The rock high-stress high-temperature micro-nano indentation test system is easy to operate, and provides a theoretical and technical system support for testing the mechanical characteristics of the rock under the high-stress and high-temperature environment in the deep region.
Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
Systems and methods for testing mechanical properties of ultra-soft materials
Systems and methods for accurate characterization of the mechanical properties of ultra-soft materials in the meso/macro-length scale are provided. Through the use of a millimeter-scale, ultra-high molecular weight indenter probe, accurate mechanical characterization of ultra-soft materials on the centimeter-scale can be achieved. The indenter probe can capture the adhesion forces present during the approach and detachment segments of the indentation process.
IN SITU MECHANICAL CHARACTERIZATION OF A SINGLE CELL-CELL ADHESION INTERFACE UNDER LARGE STRAIN
A method of measuring a stress-strain curve in a cell-cell adhesion interface, the method including: providing a structure including a first movable island supported by a first beam, a second movable island supported by a second beam, and a gap therebetween connected by a pair of cells forming a junction, the pair of cells comprising a cell-cell adhesion interface having an initial length defined by a distance between nuclei of the pair of cells; moving the second movable island with a defined displacement; determining a displacement of the first movable island based on moving the second movable island; calculating a difference between the displacement of the first movable island and the defined displacement of the second movable island based on moving the second movable island; determining an applied strain in the cell-cell adhesion interface between the pair of cells based on the difference divided by the initial length of the cell-cell adhesion interface; calculating a force between the cell-cell adhesion interface of the pair of cells based on the displacement of the first movable island; calculating a stress in the cell-cell adhesion interface between the pair of cells based on the force; and determining the stress-strain curve of the cell-cell adhesion interface between the pair of cells by plotting the calculated stress against the applied strain.
Model test device for ground collapse caused by pipeline leakage
The present invention discloses a model test device for ground collapse caused by pipeline leakage, including a sand box, a pipeline water circulation device, a groundwater replenishment device, a water storage tank and a water head measuring pipe set. The sand box includes a sand box body and a mesh sieve plate. There are two mesh sieve plate which divides an inner cavity of the sand box into a penetration cavity and a test cavity. Corresponding positions on the side wall of the test cavity are provided with a tunnel construction hole and a plurality of pipe mounting hole groups, respectively. One side wall of the test cavity is provided with a plurality of rows. There is a plurality of rows of water head measuring hole groups, and each row is provided with a plurality of the water head measuring hole groups.
MEASURING SYSTEM, MEASURING ARRANGEMENT AND METHOD FOR DETERMINING MEASURING SIGNALS DURING A PENETRATION MOVEMENT OF A PENETRATION BODY INTO A SURFACE OF A TEST BODY
A measuring device for detecting measuring signals during either a scanning across a surface to determine a surface profile or a penetration movement of an indenter into a surface of the specimen to determine hardness, and, scanning with sufficient force to determine the scratch resistance of the specimen is described. All of the measurements can be done on the same specimen without unmounting the specimen from a holder. A camera mounted to the same framework as the measuring device enables further documentation of the specimen being tested.
MICRO-NANO INDENTATION TESTING DEVICE AND METHOD
The disclosure discloses a micro-nano indentation testing device and method. A lower end of an upright post is fixedly connected to a base, a top support plate is fixedly connected to an upper end of the upright post, a precise pressing device is fixedly connected to the top support plate; a load detection module is fixedly connected to the lower end of the output shaft, an elastic element is sleeved on the output shaft, and two ends of the elastic element respectively press against the precise pressing device and the load detection module; the displacement detection module is fixedly connected to the lower end of the load detection module, an indenter fixer is fixedly connected to the lower end of the displacement detection module and used for fixedly mounting an indenter; and a stage is fixedly connected to the base and used for fixedly mounting a sample.
INVERSION IDENTIFICATION METHOD OF CRYSTAL PLASTICITY MATERIAL PARAMETERS BASED ON NANOINDENTATION EXPERIMENTS
The present disclosure provides a method for inversion of crystal plasticity material parameters based on nanoindentation experiments. The method comprises: firstly, obtaining the elastic modulus of material by Oliver-Pharr method; secondly, establishing a macroscopic parameter inversion model of nanoindentation, correcting actual nanoindentation experimental data by pile-up/sink-in parameters and calculating macroscopic constitutive parameters of indentation material in combination with a Kriging surrogate model and a genetic algorithm; and finally, establishing a polycrystalline finite element model for a tensile specimen based on crystal plasticity finite element method, and calculating the crystal plasticity material parameters according to the calculated constitutive parameters of the material in combination with the Kriging surrogate model and the genetic algorithm. Compared with the prior art, the present disclosure can improve the calculation accuracy, reduce the amount of calculation and enhance calculation convergence, and has both practical and guideline values for the inversion of crystal plasticity material parameters.