Patent classifications
G01N2203/0405
TEST METHOD FOR QUANTITATIVELY STUDYING STRESS WAVE PROPAGATION LAW OF POROUS ROCK
The invention provides a test method for quantitatively studying a stress wave propagation law of a porous rock, which adopts a dynamic true triaxial electromagnetic Hopkinson bar test system for testing. The test method comprises: quantitatively designing and preparing a cubic porous rock sample required by testing; placing the cubic pore rock sample in a central cubic square chest; and quantitatively studying a high-amplitude stress wave propagation law of the porous rock on the cubic porous rock sample by adopting the dynamic true triaxial electromagnetic Hopkinson bar test system.
Device for Preparing Sheet Specimens
The device for preparing sheet specimens comprises a base (1) for placing on it a sheet specimen (2) and a cutting punch (3) for cutting sheared cracks or sharp notches in said sheet specimen (2). Preferably, said cutting punch (3) comprises a beveled lower end (31) and/or a central vertical groove (32). Permits the cracks to be formed cutting directly the sheet, and not by cyclic loading, so that the preparation of the sheet specimen takes a reduced time in comparison with the conventional devices.
PULL-TEST JIG FOR MICROCHIPS AND TEST APPARATUS AND METHOD USING THE SAME
A pull-test jig for microchips and a test apparatus and method using the same are disclosed. The microchip pull-test jig comprises a sample fixer provided, at an upper surface thereof, with a sample seat configured to fix a substrate to which a microchip is connected by a solder, a stud support disposed over the sample fixer and formed with a stud hole at a position corresponding to the microchip, a stud fixed to an upper surface of the microchip through the stud hole, and a stud holder separably coupled to the stud.