An abrasion tester and testing method. The testing method comprises setting a running speed of a rubber sample fixed to an outer surface of an annular belt member stretched between a pair of pulleys to a desired speed; setting a pressing load applied by a contact member to a desired pressing load via an anchor member; selecting, as the contact member, a desired contact member from a plurality of types of contact members with different rubber sample surface contacting tip specifications; pressing the contact member against the surface of the rubber sample running by the rotation of the pulleys; and obtaining an amount of scratch abrasion of the rubber sample using a calculation unit on the basis of a cross-sectional shape of the surface of the rubber sample detected by a shape sensor.

An impact testing machine is configured. The impact testing machine includes: a testing machine body that applies a load having a prescribed speed to a test piece and conducts a test; a controller that controls the testing machine body; a video camera that photographs the test piece; and a pulse generator. The controller includes: a detection signal capturing unit that captures a detection signal of the load in a prescribed measurement sampling period; and a synchronizing signal output unit that outputs a sampling synchronizing signal that is synchronized with the measurement sampling period. The pulse generator includes: a photographing instruction signal generator that generates a photographing instruction signal by multiplying or dividing the sampling synchronizing signal, and outputs the photographing instruction signal to the video camera. The photographing instruction signal issues a photographing instruction to the video camera.

Provided are an apparatus and a method for infrared imaging, more particularly, an apparatus and a method for infrared imaging, which receive infrared light, emitted from a target, and output the received infrared light as an image. An infrared imaging apparatus, in accordance with an exemplary embodiment, receives infrared light, emitted from a target, and outputs the received infrared light as an image. The infrared imaging apparatus includes: a reaction unit having physical properties changing in response to the received infrared light; a light source unit for generating measurement light irradiated toward the reaction unit; and an imaging unit for detecting the measurement light with the light quantity thereof changing depending on a change in the physical properties of the reaction unit and outputting the detected measurement light as an image.

The present invention discloses a high throughput statistical characterization method of metal micromechanical properties, which comprises: grinding and polishing a metal sample until specular reflection finish satisfies a test requirement; marking position coordinates of a to-be-measured area on the metal sample by a microhardness tester to ensure the comparison of the same to-be-measured area; conducting an isostatic pressing strain test on the to-be-measured area by an isostatic pressing technology; and comparing high throughput characterization of components, microstructures, microdefects and three-dimensional surface morphology of the metal sample before and after isostatic pressing strain to obtain the full-view-field cross-scale high throughput statistical characterization of micromechanical property uniformity of the metal sample.

Disclosed are a tube pure shear loading device and method. A first mandrel penetrates into a first half tube, and a second mandrel penetrates into a second half tube. The size of the first mandrel matches the size of the first half tube, and the size of the second mandrel matches the size of the second half tube. A first connecting portion of the first mandrel and a second connecting portion of the second mandrel are loaded, and a first protruding portion and a second protruding portion transmit a force to a to-be-tested tube, so that a material of a whole tube in the same plane as a right plane or a left plane of the first half tube and a left plane or a right plane of the second half tube is in a pure shear stress state.

A rock mass shear test system for high-energy accelerator computed tomography (CT) scanning includes double horizontal loading devices, a first bearing device for bearing a static shear box, a second bearing device for bearing a dynamic shear box, and a normal loading device, etc. In the test, the double horizontal loading devices simultaneously apply an identical loading force to the rock mass, and the normal loading device applies a shear force to the rock mass. The double horizontal loading devices are provided in parallel and spaced apart, a loading force is applied in the horizontal direction, and a shear force is applied in the vertical direction, so that the loading cylinder and the rock mass sample are effectively prevented from interfering with each other during the accurate scanning process of the shearing progressive failure process of the rock mass.

The present invention relates, in part, to systems for characterizing force (e.g., friction, wear, and/or torque). In one embodiment, the system allows for wear testing of samples in a high throughput manner. In another embodiment, the system allows for torque sensing in a non-contact manner.

Provided is an evaluation method that can easily evaluate the percentage of voids in a rubber material. The present disclosure relates to an evaluation method including evaluating the percentage of voids in a rubber material with a strain applied thereto based on the φ.sub.void calculated from the following Equation (1) using the transmittance and thickness of the rubber material with no strain applied thereto and the transmittance and thickness of the rubber material with the strain applied thereto.

[00001]$\begin{array}{cc}{\varnothing }_{\mathrm{void}}=1-p_s/p_0=1-ln\left(\frac{I_s}{I_0}\right)/ln\left(\frac{I}{I_0}\right)\times \left(t_0/t_s\right)& \left(1\right)\end{array}$

Apparatus for inspecting the tension of a tape adhered to an annular frame having, in the center thereof, an opening for accommodating a wafer includes: a frame support section that supports the annular frame, a light source that applies light toward the tape, an imaging camera that captures, through the tape, the light applied from the light source, a first polarizing plate disposed between the tape and the light source, and a second polarizing plate disposed between the tape and the imaging camera and positioned so as to shield the light of linearly polarized light transmitted through the first polarizing plate. If distortion is generated in a polarization plane of the light due to application, onto the tape, of the light of the linearly polarized light transmitted through the first polarizing plate, the light is transmitted through the second polarizing plate, and the imaging camera images the transmitted light.

A method including obtaining a metal pipe with a longitudinal submerged arc weld, an axis of the longitudinal submerged arc weld being oriented parallel to a rotationally symmetric axis of the metal pipe and cutting a first test beam and a second test beam from the metal pipe with each test beam extending on both sides of the axis of the longitudinal submerged arc weld and has a cuboid shape. The method further including forming a double-beam assembly by clamping two spacers between the first and second test beams such that the two spacers are symmetrically disposed at an equal distance on either side the longitudinal submerged arc weld. The method further including immersing the double-beam assembly in a liquid test solution for a predetermined period of time before removing it from the liquid test solution and disassembling the double-beam. The method further including examining the first and the second test beam using a metallographic sectioning method.