Methods and systems for verifying compatibility of components (e.g. parts or devices) of an electronic system are disclosed. In certain embodiments the method includes: irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and detecting one or more XRF response signals indicative of a first and a second XRF signatures, emitted from the first and second components in response to the irradiation. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures/marking. Certain embodiments also disclose electronic systems including at least a first and a second electronic components/devices respectively having the first and second XRF marking compositions that enable verification of compatibility of the components. Certain embodiments disclose techniques for pairing the first and second components (e.g. devices) based a correspondence between the first and second XRF signatures/markings thereof. Certain embodiments disclose various calibration techniques for calibrating the XRF measurements of XRF markings applied to different substrate materials of the electronic components.

An X-ray backscatter indication and detection system, including an object disposed with respect to a target area targeted by X-rays, such that X-rays that backscatter from the target area strike the surface of the object. The surface of the object includes an X-ray sensitive indicator substance that fluoresces with a visible light when contacted by backscattered X-rays.

Methods and systems for verifying compatibility of components of an electronic system are disclosed. The method includes irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and in response thereto, detecting one or more XRF response signals indicative of first and second XRF signatures, emitted from the first and second components. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures. Electronic systems are also disclosed including at least a first and a second electronic components respectively having the first and second XRF marking compositions that enable verification of compatibility of the components.

The present invention is a method to quantify biomarkers. The method uses an X-ray florescence spectrometer to perform an X-ray fluorescence analysis on the sample to obtain spectral features derived from the biomarker; and quantifying the X-ray fluorescence signal of the biomarker.

An X-Ray-Spectroscopy (XRS) inspection station is presented for inspecting objects progressing on a production line. The XRS station comprises: at least one XRS inspection system each defining an XRS inspection region and performing one or more XRS inspection sessions on the object passing through the inspection region while progressing on the production line and generating XRS inspection data piece for said object. The XRS inspection system comprises at least one emitter, each producing X-Ray or Gamma-Ray exciting radiation to excite at least a portion of the object, and at least one detection unit that detects a response of said at least portion of the object to the exciting radiation and generates corresponding XRS inspection data pieces comprising data indicative of an XRS signature of marking(s) embedded in plastic material composition of the object, said data indicative of the XRS signature being informative of one or more conditions of plastic material composition in the object. The inspection system also includes an analyzer utility adapted to, generate, based on the XRS inspection data pieces, object status in association with identification data of the respective object. Also provided at the inspection station is a control unit which is adapted to generate, based on the object status data, sorting data in relation to said object for use at a sorting station of the production line.

An apparatus for steerable x-ray inspection of a sample includes an outer housing that can be inserted into an interior of the sample via a flexible insertion member; an x-ray source within the outer housing that can output source x-rays into the sample; an x-ray detector within the housing and capable of detecting fluorescence x-rays emitted from the sample upon excitation by the source x-rays; and a steering device coupled to an end of the insertion member and configured to adjust, selectively, a position of the flexible insertion member for steering the outer housing within the sample.

The present invention is a method to quantify biomarkers. The method uses an X-ray fluorescence spectrometer to perform an X-ray fluorescence analysis on the sample to obtain spectral features derived from the biomarker; and quantifying the X-ray fluorescence signal of the biomarker.

The invention provides formulations and masterbatches of a polymeric material and XRF-identifiable markers, for producing transparent elements including a polymer and at least one XRF-identifiable marker for a variety of industrial uses.

A method of extracting information encoded in a product includes: determining a concentration of a non-functional amount of a chemical in a product, where the concentration corresponds to one of a plurality of possible concentration ranges, where each of the plurality of possible concentration ranges indicates different non-composition manufacturing information about the product.

The present invention discloses a novel XRF analyzer capable of simultaneously identifying the presence of a marking composition in a plurality of objects by modulating/varying the intensity of the excitation beam on the different objects and measuring the secondary radiation thereof. The XRF analyzer comprises a radiation emitter assembly adapted for emitting at least one X-Ray or Gamma-Ray excitation radiation beam having a spatial intensity distribution for simultaneously irradiating the plurality of objects; a radiation detector for detecting secondary radiation X-Ray signals arriving from a plurality of objects in response to irradiation of the objects by X-Ray or Gamma-Ray radiation, and providing data indicative of spatial intensity distribution of the detected data X-Ray signals on the plurality of objects; and a signal reading processor in communication with the detector, the processor being adapted for receiving and processing the detected response X-Ray signals to verify presence of the marking composition included at least one surface of each object of the plurality objects.