An inspection apparatus includes an image generation unit, an image processing unit and an inspection unit. The image generation unit is configured to develop one dimensional transmission signal of an article to be inspected passing through an irradiation line of electromagnetic wave into a two dimensional image on a memory. The image processing unit is configured to perform image processing on a partial image every time the partial image including a part of article to be inspected is generated in the image generation unit. The inspection unit is configured to inspect a quality of the partial image after image processing, based on one or more processing results of the image processing unit.

This application relates to apparatus and method for x-ray fluorescence analysis. There is provided an X-ray fluorescence analysis apparatus for analysing a sample, The X-ray fluorescence analysis apparatus comprises an X-ray source, a measurement chamber for holding the sample in air, and an X-ray detector. The X-ray source is arranged to irradiate the sample with a primary X-ray beam, to cause the sample to fluoresce. The X-ray detector is arranged to detect characteristic X-rays emitted by the sample and to determine a measured X-ray intensity associated with the characteristic X-rays. An X-ray filter, which transmits the primary X-ray beam, is arranged between the X-ray source and the sample. The X-ray source comprises an anode of material having an atomic number that is less than 25. The X-ray fluorescence analysis apparatus further comprises a sensor arrangement configured to sense air pressure and air temperature. A processor receives the measured X-ray intensity. The processor also receives air pressure data and air temperature data from the sensor arrangement. The processor is configured to carry out a compensation calculation for adjusting the measured X-ray intensity using the air pressure data and the air temperature data.

Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The x-ray backscatter apparatus comprises an x-ray source and an x-ray filter. The x-ray filter comprises a plurality of emission apertures and a detection aperture. The x-ray backscatter apparatus further comprises an x-ray intensity sensor that is fixed to the x-ray filter over the detection aperture such that any portion of an unfiltered x-ray emission filtered into the detection aperture is detected by the x-ray intensity sensor. The x-ray backscatter apparatus additionally comprises an emission alignment adjuster that is operable to adjust a position of the unfiltered x-ray emission relative to the plurality of emission apertures and the detection aperture in response to a position, relative to the detection aperture, of a peak intensity of the unfiltered x-ray emission passing into the detection aperture, detected by the x-ray intensity sensor.

A process for quantifying the amount of unbound metal and bound metal in solution is provided. A process for quantifying the amount of bound metal amino acid chelate and free ligand in a solid (e.g., dry mixture such as an animal feed) is also provided.

A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.

An X-ray fluorescence analyzer according to an embodiment includes a sample box configured to accommodate a liquid sample, an X-ray generation unit configured to irradiate an X-ray to one side surface of the inside of the sample box, and a detector disposed along one side surface of the sample box at which a distance of a fluorescent X-ray emitted from the inside of the sample box to the outside of the sample box is shortest in order to minimize absorption of the fluorescent X-ray emitted out of the sample box in the air, when the X-ray irradiated by the X-ray generation unit reacts with the liquid sample inside the sample box to emit the fluorescent X-ray out of the sample box, the detector being configured to detect the fluorescent X-ray.

An x-ray system, comprising: a backscatter detector, comprising: an x-ray conversion material; a plurality of sensors configured to generate electrical signals in combination with the x-ray conversion material in response to incident x-rays; and a collimator disposed on the x-ray conversion material and including a plurality of partitions extending away from the x-ray conversion material and the sensors and forming a plurality of openings, each opening corresponding to one of the sensors.

A method for the X-ray inspection of products of a predefined product type including at least one first component and one second component having different absorption coefficients for X-radiation. X-radiation with a spectral range is transmitted through a product to be examined. The X-radiation that has passed through the product is detected by means of a spectrally resolving X-ray detector. The spectrally resolving X-ray detector assigns the X-ray quanta to a number of energy channels and generates image data which for each pixel include spectral values for selected or all energy channels and/or total spectral values for one or more groups of adjacent energy channels. At least one mapping rule is used to process the image data to form a total image, where each mapping rule is designed such that spectral values or total spectral values are mapped onto a total image value of an image point.

A sample holder (3) for performing X-ray analysis on a crystalline sample (11) comprises a mounting support with a first end that can be attached to a goniometer head, whereby the crystalline sample (11) can be attached to the mounting support at a distance to the first end. The sample holder (3) further comprises a holder base at the first end of the mounting support with means for mounting the holder base to the goniometer head, whereby the holder base is configured to fit into a well (2) of a well plate (1). The holder base comprises a ferromagnetic material for mounting the holder base to a magnetic base element at or within the goniometer head. The mounting support comprises a tube preferably made of glass into which the crystalline sample (11) can be inserted. The sample holder (3) can also comprise a base disk (14) that provides for a lid for a well (2) of the well plate (1) after insertion of the sample holder (3) into the well (2). The holder base can also comprise a holder ring (7) that is arranged at the first end of the mounting support and that surrounds the mounting support in a circumferential manner The base disk (14) can be removably attachable to the holder ring (7). A crystalline sponge is attached to the mounting support.

The invention described herein is a spectrometer having components allowing remote orientation of crystal analyzer and detector.