A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.

An embodiment of a method for restoring detector resolution in an X-Ray fluorescence instrument is described that comprises: measuring a resolution value of a detector in the X-Ray fluorescence instrument using a standard material at a first temperature; determining that the measured resolution value deviates from a target value; and adjusting the temperature of the detector to a second temperature that restores the resolution value of the detector to the target value, wherein the temperature is adjusted by an amount defined by a relationship of temperature change to the degree of deviation of detector resolution from the target value.

Systems and methods for analyzing an unknown sample are disclosed. The system includes at least one subsystem to obtain molecular information about the sample and at least one other subsystem to obtain elemental information about the sample. The system also includes a data collection component to collect and combine the information from the subsystems to create combined analytical information and a multivariate model that relates known attributes to information previously generated with at least two analytical systems that are the same types of systems as the at least two analytical subsystems. A prediction engine applies the multivariate model to the combined analytical information to produce predictions of attributes in the unknown sample.

Systems and methods for analyzing an unknown geological sample are disclosed. The system may include at least two analytical subsystems, and each of the at least two analytical subsystems provides different information about the geological sample. The data sets from various analytic subsystems are combined for further analysis, and the system includes a chemometric calibration model that relates geological attributes from analytical data previously obtained from at least two analytical techniques. A prediction engine applies the chemometric calibration model to the combined analytical information from the geological sample to predict specific geological attributes in the unknown geological sample.

Radiometric measuring arrangement for measuring and/or monitoring a measured variable, especially a fill level or a density, of a fill substance located in a container and a method executable therewith for detection of accretion formation in the container. The variable to be measured is measured by means of a measuring system, which during operation sends radioactive radiation along a measuring path through the container, and measures radiation intensity emerging from the container along the measuring path, and by means of a comparison measuring system, which sends radioactive radiation along a comparison path through the container and measures radiation intensity emerging from the container along the comparison path. The comparison path extends in such a manner through the container that in the case of the presence of an accretion layer on the inner walls of the container a ratio of a sum of the two segments of the measuring path extending through the accretion layer to the length of an additional segment of the measuring path (A, A) extending between these two segments is different from the ratio formed in the same manner for the comparison path, and an accretion formation occurring in ongoing operation is detected based on deviations ascertained in ongoing operation between the measurement results of the measuring system and the measurement results of the comparison measuring system.

A system for X-ray analysis, includes: (a) an X-ray analysis assembly configured to (i) direct an X-ray beam to impinge on a surface of a sample, and (ii) receive fluorescence radiation excited from the sample in response to the impinged X-ray beam, (b) a target assembly including measurement targets: placed in an optical path between the X-ray analysis assembly and the sample, and configured to move between (i) one or more first positions in which one or more of the measurement targets are positioned in the X-ray beam, and (ii) one or more second positions in which the optical path is unobstructed by the target assembly, and (c) a processor, configured to control movement of the target assembly between the first and second positions, for alternately, (i) monitoring properties of the X-ray beam using the measurement targets, and (ii) performing the X-ray analysis at a measurement site of the sample.

A device for measuring short-wavelength characteristic X-ray diffraction based on array detection, and a measurement and analysis method based on the device are provided. An array detector of the device only detects and receives a diffraction ray which is diffracted by a material of a to-be-measured part inside a sample and passes through a through hole of a receiving collimator, and rays passing through a positioning hole. The to-be-measured part inside the sample is placed at the center of the diffractometer circle of the device. The method is performed with the device. With the present disclosure, a diffraction pattern of a part inside the sample with a centimeter thickness, i.e. Debye rings, can be rapidly and non-destructively measured, thereby rapidly and non-destructively measuring and analyzing crystal structures, and its crystal structural change of the part inside the sample, such as phase, texture, and stress.

The invention relates to the field of analytical chemistry and physical methods of analysis, and can be used to determine the hafnium content in metallic zirconium and alloys based thereon. The problem addressed by the proposed invention is to separate the overlapping lines of zirconium in the second order of reflection and hafnium. The proposed method includes plotting a calibration curve for the dependence of the fluorescence intensity of lines of hafnium on its concentration in samples with established hafnium content, preparing samples to a template, the dimensions of which correspond to the sample receptacle of a spectrometer, collimating the emission with a fine collimator with an angular divergence of 14-17 degrees, and separating the spectral range of the hafnium line using an LiF220 crystal analyzer so as to establish thresholds of an amplitude discriminator in a narrow range sufficient for cutting off impulses with high voltage generated by more high-energy zirconium quanta.

A method of fabricating a reference blade for calibrating non-destructive inspection by tomography of real blades of similar shapes and dimensions, including making a three-dimensional blank out of resin, creating housings in the thickness of the blank at predetermined locations, and introducing in each of the housings a cylinder including an artificial defect or a real defect in order to obtain the reference blade.

An X-ray fluorescence spectrometer includes: an X-ray source (3) to irradiate, with primary X-rays (6), a sample (1) that is multiple nanoparticles placed on a substrate (10); an irradiation angle adjustment unit (5) to adjust an irradiation angle at which a surface (10a) of the substrate is irradiated; a detection unit (8) to measure an intensity of fluorescent X-rays (7) from the sample (1); a peak position calculation unit (11) to generate a sample profile representing change of the intensity of the fluorescent X-rays (7) against change of the irradiation angle, and to calculate a peak irradiation angle position; a particle diameter calibration curve generation unit (21) to generate a calibration curve; and a particle diameter calculation unit (22) to calculate a particle diameter of nanoparticles of an unknown sample (1) by applying the peak irradiation angle position of the unknown sample (1) to the calibration curve.