An X-ray inspection device includes a conveyor, an X-ray irradiation unit, an X-ray detection unit, an inspection unit configured to inspect an article on the basis of an X-ray transmission image, a housing accommodating the X-ray irradiation unit and the X-ray detection unit, a cool air blower configured to cool air inside the housing and guide cool air to the X-ray detection unit via a duct, a monitoring unit configured to monitor a state of the cool air blower, and a control unit configured to stop the flow of air to the X-ray detection unit when an anomaly of the cool air blower is detected by the monitoring unit.

Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.

Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.

An X-ray inspection apparatus includes: a conveyance unit; an X-ray irradiation unit that irradiates an article conveyed by the conveyance unit with an X-ray; an X-ray detection unit that detects the X-ray that has transmitted through the article; an inspection unit that generates an X-ray transmission image from the X-ray detected by the X-ray detection unit and inspects the article on the basis of the X-ray transmission image; a housing that houses the X-ray irradiation unit and the X-ray detection unit; a cold air blower that cools air in the housing and guides cold air to the X-ray detection unit via a duct; a monitoring unit that monitors a state of the cold air blower; and a control unit that stops the supply of electric power to the X-ray detection unit in a case where an abnormality in the cold air blower is detected in the monitoring unit.

Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.

A radiation imaging system stabilizes a change in temperature of a radiation imaging apparatus, obtains a radiation image of an object based on radiation applied from a radiation source and reaching through the object, obtains a correction image by performing imaging without irradiation with the radiation from the radiation source, performs, using the correction image, image processing for correcting an offset component appearing in the radiation image on the radiation image, and determines whether stabilization of a change in temperature of the radiation imaging apparatus is effectively functioning. The radiation imaging system switches modes of obtaining the correction image based on determination.

Cooling systems of a CT system and methods of cooling the CT system are disclosed. The CT system includes a gantry and a table that moves an object into a bore of the gantry, wherein the gantry includes a cover having a front surface in which at least an inlet slot is formed and a rear surface in which exhaust holes are formed along with exhaust fans in the rear surface of the cover of the gantry. Fans for the in-take and exhaustion of air are not required to be formed on the front surface of the cover of the gantry. A hole through which external air is taken in through the inlet slot is moved in a rotor of the gantry.

An X-ray analyzer includes: an excitation source for exciting a sample to radiate a characteristic X-ray; an X-ray detector that detects the characteristic X-ray; a collimator; at least one window that is provided between the sample and the X-ray detector and allows the characteristic X-ray to pass through; and a cooling unit that cools the window, wherein the window is laminated with one or more layer of an aluminum film and one or more layer of an insulating film, wherein a total thickness of the aluminum film of the at least one window is equal to or greater than 150 nm and is less than 300 nm, and wherein a size of the collimator is set such that a quantity of radiant heat to the X-ray detector of the atmospheric temperature when the window is not present is equal to or less than 10 W.

This invention is intended to allow an experimenter to work at amenable temperatures while viewing and/or manipulating aqueous protein crystals or other specimens under a dissection microscope at close to 4 C. or other controlled temperatures. The invention provides a specimen stage chamber large enough to fit a multi-well plate containing the specimens. The temperature of this specimen stage chamber is controlled by transparent coolant circulated through its walls and through a transparent chamber beneath the specimen stage chamber, without blocking the light path of the microscope. An additional chamber cools the air above the specimen stage chamber. In one version of this apparatus, circulation of most coolants is replaced by an array of Peltier coolers. The apparatus is open to the air above, giving the experimenter direct access to the crystals for manipulation. The invention may have wider application for manipulation of other specimens under a microscope.

A method for scanning at least one component includes placing the at least one component inside a storage vessel; filling the storage vessel with a cryogenic material; cooling the at least one component; placing the storage vessel between an x-ray source and a detector of a CT scanner; generating, via the x-ray source, an x-ray cone beam after cooling of the component that passes through the storage vessel while the at least one component is disposed within the storage vessel; receiving the x-ray cone beam at the detector; and generating an x-ray image of the at least one component.