G01N2223/3106

X-ray imaging system containing X-ray apparatus having gratings and object housing for setting environmental condition independent of external environment

An X-ray imaging system including: an X-ray Talbot imaging apparatus which is provided with an object table, an X-ray source, a plurality of gratings, and an X-ray detector side by side in a direction of an X-ray radiation axis, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to obtain a moire image required for forming a reconstruction image of the object; and an object housing inside which the object is housed and an environmental condition independent of an external environment is set, wherein the object housing is provided detachably with respect to the object table.

Device For Clamping And Controlling The Temperature Of Planar Samples For X-Ray Diffractometry
20200150061 · 2020-05-14 ·

The invention relates to an apparatus (1) for clamping flat samples (6), in particular pouch battery cells, for x-ray diffractometry, wherein the apparatus has a housing (2) having a sample holder (4), which has holding elements (5) that are able to be tensioned in relation to one another for clamping the sample (6), at least two x-ray windows (11a, 11b, 12) for letting in and out x-rays, and at least one first temperature control device (7) for controlling the temperature of the sample (6). At least one first temperature control device (7) is in each case attached to the holding elements (5), wherein the first temperature control devices (7) are thermally coupled to the housing (2), and the apparatus has at least one second temperature control device (9), which is configured to dissipate heat, which is output by the first temperature control device (7) to the housing (2), out of the housing (3) to the outside and/or to introduce heat from the outside into the housing (2).

Structure for pressurization analysis, X-ray diffraction apparatus and pressurization analysis system
11913891 · 2024-02-27 · ·

A structure for pressurization analysis includes a sample accommodating unit (10) for accommodating an all-solid-state battery (S) therein, and a pressurizing unit (30) having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is pressurized inside the sample accommodating unit (10) while being sandwiched between a pressure receiving member (21) and a pressing member (22). Further, an X-ray window (14) is provided in an outer radial direction orthogonal to an acting direction of the pressure from the pressurizing unit (30), and reflection type X-ray diffraction measurement can be performed through the X-ray window (14).

X-RAY IMAGING SYSTEM
20190170668 · 2019-06-06 ·

An X-ray imaging system including: an X-ray Talbot imaging apparatus which is provided with an object table, an X-ray source, a plurality of gratings, and an X-ray detector side by side in a direction of an X-ray radiation axis, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to obtain a moire image required for forming a reconstruction image of the object; and an object housing inside which the object is housed and an environmental condition independent of an external environment is set, wherein the object housing is provided detachably with respect to the object table.

Multiple Heaters in a MEMS Device for Drift-Free HREM with High Temperature Changes
20180376537 · 2018-12-27 ·

The use of MEMS-based micro heaters for heating experiments in electron microscopy is known. Heating of a sample typically relates to a temperature increase or decrease of at least 50 K, and often at least 200 K. The present invention provides an improved heating system for use in an observation tool requiring low drift of <0.2 nm/sec, such as an electron microscope, comprising two cooperating and integrated MEMS-based micro heaters (21,22) spaced apart at a mutual distance of less than 10 mm. A first heater is a master heater (21) and capable of receiving a first amount of power, a second heater is a slave heater (22) and capable of receiving a second amount of power, wherein the first and second amounts of power are in a range from 0 mW to the total amount of power. A thermometer is measuring the temperature of the master heater in use with an accuracy of better than 10 mK, and a power controller prevents variation in the total amount of power received by keeping the total amount of power constant with an accuracy of better than 5 pW and divides the total amount of power over the at least two heaters.

Furnace for transmission mode X-ray diffractometer and transmission mode X-ray diffractometer using thereof

Provided is a furnace for a transmission mode X-ray diffractometer and a transmission mode X-ray diffractometer using the same. The furnace for a transmission mode X-ray diffractometer includes a sample heating unit disposed adjacent to a quartz capillary accommodating a sample to heat the sample, and a main body disposed to surround the quartz capillary and the sample heating unit and having an insulating function for allowing the heated sample to maintain a thermal equilibrium state.

X-ray fluorescence analyzer
12135299 · 2024-11-05 · ·

An X-ray fluorescence analyzer is provided inside an analysis chamber covered with a housing with: an X-ray tube; an analyzing crystal for spectrally dispersing X-ray fluorescence emitted from a sample; an X-ray detector for detecting the X-ray fluorescence spectrally dispersed by the analyzing crystal; a warm air generator for generating warm air to maintain a temperature of the analyzing crystal at a target temperature; and a Peltier element for cooling the X-ray detector.

FURNACE FOR TRANSMISSION MODE X-RAY DIFFRACTOMETER AND TRANSMISSION MODE X-RAY DIFFRACTOMETER USING THEREOF

Provided is a furnace for a transmission mode X-ray diffractometer and a transmission mode X-ray diffractometer using the same. The furnace for a transmission mode X-ray diffractometer includes a sample heating unit disposed adjacent to a quartz capillary accommodating a sample to heat the sample, and a main body disposed to surround the quartz capillary and the sample heating unit and having an insulating function for allowing the heated sample to maintain a thermal equilibrium state.

Apparatus for real-time monitoring of organic matter porosity evolution using selective photo-thermal laser as a heat source to target organic matter only
12222273 · 2025-02-11 · ·

A rock testing system includes a rock sample having organic matter provided on a stand in a testing device and a photothermal laser that emits a selected wavelength corresponding to an absorption peak of the organic matter. Methods for testing the rock sample include irradiating the rock sample with the photothermal laser to selectively heat the organic matter and monitoring porosity of the rock sample as the organic matter is heated.

Systems and Methods for Elemental Soil Content Determination Utilizing Inelastic Neutron Scattering and Accounting for Moisture Content and Ambient Temperature

Systems and methods for measuring the content of an element in a soil comprises: a neutron source for irradiating the soil with neutrons; a detector assembly configured to detect an INS gamma spectrum of the soil; an instrument for measuring a moisture content of the soil; and a processor in communication with the detector assembly, the processor configured to: apply a moisture calibration coefficient to calculate a net peak area of a characteristic peak of the element in the INS gamma spectrum, the moisture calibration coefficient calculated to account for the moderation of fast neutrons by hydrogen atoms of water present in the irradiated soil at the location under analysis; and generate a concentration of the element in the soil. The instrument for measuring a moisture content of the soil may comprise the detector assembly. Systems and methods incorporating a temperature-controlled housing for the gamma detector assembly are also provided.