Patent classifications
G01N2223/3301
BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM
The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.
SYSTEMS, DEVICES AND METHODS FOR A PENCIL BEAM X-RAY SCANNER
A multi-channel X-ray detector can include a first detector channel and a second detector channel. The first detector channel can include a first scintillation light guide component and a second scintillation light guide component arranged transverse to the first scintillation light guide component. The first and second scintillation light guide components can be mechanically and optically coupled to one another. The second detector channel can include a third scintillation light guide component adjoining the first scintillation light guide component, and a fourth scintillation light guide component arranged transverse to the third scintillation light guide component and adjoining the second scintillation light guide component. The third and fourth scintillation light guide components can be mechanically and optically coupled to one another.
X-RAY TOMOGRAPHY
An x-ray tomography system which can generate a qualitative 3D image of a region of interest using a an x-ray source, the x-ray source configured to emit x-ray radiation at the region of interest. The x-ray radiation or the x-ray source or the relative position of the x ray source configured to be moved in a two dimensional plane. An x-ray detector including a plurality of detector elements arranged in a two dimensional plane opposite the x-ray source, the x-ray detector configured to detect x-ray radiation after attenuation by the subject and provide an indication of the detected x-rays. And a processor configured to receive the indication of the detected x-rays and resolve the detected x-ray radiation into a three dimensional image. The three dimensional image is qualitative in nature.
Electron Microscope and Aberration Measurement Method
An electron microscope includes an irradiation optical system that focuses electron beams and scans a specimen with the focused electron beams; a deflector that deflects the electron beams transmitted through the specimen; a detector that detects the electron beams transmitted through the specimen; and a control unit that controls the irradiation optical system and the deflector The control unit causes the irradiation optical system to scan the specimen with the electron beams so that the electron beams have a plurality of irradiation positions on the specimen. The control unit causes the deflector to repeatedly deflect the electron beams transmitted through each of the irradiation positions, so that a plurality of electron beams which have the same irradiation position and different incident angle ranges with respect to the specimen are caused to sequentially enter the detector.
Methods and systems for acquiring three-dimensional electron diffraction data
Crystallographic information of crystalline sample can be determined from one or more three-dimensional diffraction pattern datasets generated based on diffraction patterns collected from multiple crystals. The crystals for diffraction pattern acquisition may be selected based on a sample image. At a location of each selected crystal, multiple diffraction patterns of the crystal are acquired at different angles of incidence by tilting the electron beam, wherein the sample is not rotated while the electron beam is directed at the selected crystal.
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL COMPUTED TOMOGRAPHY
A multisource volumetric spectral computed tomography imaging device includes an x-ray source array with multiple spatially distributed x-ray focal spots, an x-ray beam collimator with an array of apertures, each confining the radiation from a corresponding x-ray focal spot to illuminate a corresponding segment of an object, a digital area x-ray detector, and a gantry to rotate the x-ray source array and the detector around the object. An electronic control unit activates the radiations from the x-ray focal spots to scan the object multiple times as the gantry rotates around the object. The images are used to reconstruct a volumetric CT image of the object with reduced scattered radiation. For dual energy and multi energy imaging, radiation from each focal spot is filtered by a corresponding spectral filter to optimize its energy spectrum.
METHOD FOR IMAGING A SAMPLE
A method for imaging a sample by means of an X-ray detector is disclosed, including providing an electron beam interacting with a target to generate X-ray radiation emitted from an X-ray spot on the target, moving the sample relative to the target, deflecting the electron beam such that the X-ray spot is moved over the target simultaneously and in accordance with the movement of the sample, and detecting X-ray radiation emitted from the X-ray spot and interacting with the sample.
METHOD AND DEVICE FOR TESTING PREFORMS
A device and method tests preforms that are rotationally symmetrical with respect to an axis of rotation during their conveyance along a conveyance path. The device and method tests only a statistically relevant number of produced preforms, thus allowing substantial reduction in the constructive complexity required for aligning the preforms prior to being tested. A certain number of preforms that have not been correctly aligned are allowed to continue along the conveyance path without being tested.
System, kit, and method for x-ray imaging with removably attachable detector assembly
An x-ray imaging system, and a corresponding kit and method, includes a movable x-ray imager that includes a first backscatter x-ray detector assembly. The system also includes a second backscatter x-ray detector assembly that is removably attachable with the movable x-ray imager. The movable x-ray imager and the second backscatter x-ray detector include complementary attachment features configured to secure, removably, the second backscatter x-ray detector assembly with the movable x-ray imager to form an attached arrangement having the second and first backscatter x-ray detectors fixedly oriented with respect to each other. The second backscatter x-ray detector assembly forms an outer loop defining an inner opening at which the movable x-ray imager is configured to be received for attachment of the second backscatter x-ray detector assembly with the movable x-ray imager to form the attached arrangement.
Imaging device
An object of the invention is to easily acquire images of a position corresponding among a plurality of sample sections in an imaging device that acquires images of the plurality of sample sections. The imaging device according to the invention generates a cursor for specifying a first observation region and a contour portion of a first sample section, and superimposes the cursor on a contour portion of a second sample section so as to calculate coordinates of a second observation region of the second sample section.