Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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2223/00
Investigating materials by wave or particle radiation
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G01N2223/30
Accessories, mechanical or electrical features
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G01N2223/33
scanning, i.e. relative motion for measurement of successive object-parts
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G01N2223/3303
object fixed; source and detector move
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