A method and system for determining a location of artefacts and/or inclusions in a gemstone, mineral or sample thereof, the method comprising: surface mapping a gemstone, mineral or sample thereof to determine surface geometry associated with at least a portion of a surface of the gemstone, mineral or sample thereof; sub-surface mapping the gemstone, mineral or sample thereof using an optical beam that is directed at the surface along an optical beam path, wherein the optical beam is generated by an optical source using an optical tomography process; determining a surface normal at the surface at an intersection point between the optical beam path and the determined surface geometry; determining relative positioning between the surface normal and the optical beam path; and determining the location of artefacts and/or inclusions in the gemstone, mineral or sample thereof based on the sub-surface mapping step and the determined relative positioning.

A method, a system, and an apparatus for scanning an elongate structure. A scanner in a scanning system is moved on a helical path around the elongate structure. The scanner is moved on the helical path around the elongate structure using a helical track system attached to the elongate structure using a translating structure. An x-ray beam is emitted from the scanner while the scanner moves on the helical path. Backscatter is detected from the x-ray beam encountering the elongate structure.

A detector system for an x-ray imaging device includes a detector chassis, a plurality of sub-assemblies mounted to the detector chassis and within an interior housing of the chassis, the sub-assemblies defining a detector surface, where each sub-assembly includes a thermally-conductive support mounted to the detector chassis, a detector module having an array of x-ray sensitive detector elements mounted to a first surface of the support, an electronics board mounted to a second surface of the support opposite the first surface, at least one electrical connector that connects the detector module to the electronics board, where the electronics board provides power to the detector module and receives digital x-ray image data from the detector module via the at least one electrical connector. Further embodiments include x-ray imaging systems, external beam radiation treatment systems having an integrated x-ray imaging system, and methods therefor.

A detector system for an x-ray imaging device includes a detector chassis, a plurality of sub-assemblies mounted to the detector chassis and within an interior housing of the chassis, the sub-assemblies defining a detector surface, where each sub-assembly includes a thermally-conductive support mounted to the detector chassis, a detector module having an array of x-ray sensitive detector elements mounted to a first surface of the support, an electronics board mounted to a second surface of the support opposite the first surface, at least one electrical connector that connects the detector module to the electronics board, where the electronics board provides power to the detector module and receives digital x-ray image data from the detector module via the at least one electrical connector. Further embodiments include x-ray imaging systems, external beam radiation treatment systems having an integrated x-ray imaging system, and methods therefor.

An X-ray imaging inspection system for inspecting items comprises an X-ray source 10 extending around an imaging volume 16, and defining a plurality of source points 14 from which X-rays can be directed through the imaging volume. An X-ray detector array 12 also extends around the imaging volume 16 and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor 20 is arranged to convey the items through the imaging volume 16.

Among other things, a tire inspection system and method are provided. A radiation source and a detector array are configured to rotate about an axis of rotation. During a first examination of a tire, the tire has a first orientation relative to the axis of rotation, and during a second examination, the tire has a second orientation relative to the axis of rotation. For example, between the first examination and the second examination, the tire is at least one of shifted with respect to the axis of rotation or rotated about a tire rotation axis (e.g., perpendicular to the axis of rotation) to change the orientation of the tire relative to the axis of rotation. In this manner, imagery of the tire may be developed, which can be inspected to identify irregularities, etc., in the tire, for example.

An anatomical imaging system comprising: a CT machine; and a transport mechanism mounted to the base of the CT machine, wherein the transport mechanism comprises a fine movement mechanism for moving the CT machine precisely, relative to the patient, during scanning.

An anatomical imaging system comprising: a CT machine; and a transport mechanism mounted to the base of the CT machine, wherein the transport mechanism comprises: a gross movement mechanism for transporting the CT machine relatively quickly across room distances; and a fine movement mechanism for moving the CT machine precisely, relative to the patient, during scanning.

An imaging system comprising: a scanner; and a transport mechanism mounted to the base of the scanner, wherein the transport mechanism comprises: a gross movement mechanism for transporting the scanner relatively quickly across room distances; and a fine movement mechanism for moving the scanner precisely, relative to the object being scanned, during scanning.

A method for scanning a patient comprising: providing an anatomical imaging system, the system comprising: a CT machine; and a transport mechanism mounted to the base of the CT machine, wherein the transport mechanism comprises: a gross movement mechanism for transporting the CT machine relatively quickly across room distances; and a fine movement mechanism for moving the CT machine precisely, relative to the patient, during scanning; transporting the CT machine to the patient, across room distances, using the gross movement mechanism; and scanning the patient while moving the CT machine precisely, relative to the patient, with the fine movement mechanism.

A method for scanning a patient, comprising: moving a CT machine across room distances to the patient; and scanning the patient while moving the CT machine precisely relative to the patient during scanning.

A method for scanning an object, comprising: moving a scanner across room distances to the object; and scanning the object while moving the scanner precisely relative to the object during scanning.

Among other things, a tire inspection system (100) and method are provided. A radiation source (116) and a detector array (118) are configured to rotate about an axis of rotation. During a first examination of a tire (104), the tire (104) has a first orientation relative to the axis of rotation, and during a second examination, the tire (104) has a second orientation relative to the axis of rotation. For example, between the first examination and the second examination, the tire (104) is at least one of shifted with respect to the axis of rotation or rotated about a tire rotation axis (e.g., perpendicular to the axis of rotation) to change the orientation of the tire relative to the axis of rotation. Such rotation and translation of the tire (104) are carried out by using a conveyer belt (114) and a robotic arm (602). In this manner, imagery of the tire (104) may be developed, which can be inspected to identify irregularities, etc. in the tire (104), for example.

A method and system for determining a location of artefacts and/or inclusions in a gemstone, mineral or sample thereof, the method comprising: surface mapping a gemstone, mineral or sample thereof to determine surface geometry associated with at least a portion of a surface of the gemstone, mineral or sample thereof; sub-surface mapping the gemstone, mineral or sample thereof using an optical beam that is directed at the surface along an optical beam path, wherein the optical beam is generated by an optical source using an optical tomography process; determining a surface normal at the surface at an intersection point between the optical beam path and the determined surface geometry; determining relative positioning between the surface normal and the optical beam path; and determining the location of artefacts and/or inclusions in the gemstone, mineral or sample thereof based on the sub-surface mapping step and the determined relative positioning.

Described herein are a computed tomography scanning system for inspecting an object and methods incorporating the same. The system includes an imaging assembly including a frame positioned within an underground chamber below a ground surface, a platform coupled to and translatable with respect to the frame, and a stage coupled to and rotatable with respect to the platform. The platform is translatable to raise the object above the ground surface and lower the object below the ground surface when the object is on the stage. The imaging assembly also includes an X-ray source fixed with respect to the frame and configured to emit radiation that is attenuated by the object as the platform translates and the stage rotates, and an X-ray detector fixed with respect to the frame, the X-ray detector configured to detect the radiation transmitted through the object and generate a signal representative of the transmitted radiation.