CT scanner comprising a scanning conveyor (9) mounted on a supporting structure and configured to move an object (3) for CT examination forward through a scanning area (8), an input conveyor (10) configured to convey the object until the scanning chamber (2), and an output conveyor (11) configured to convey an object (3) out of the scanning chamber (2), wherein the input conveyor (10), the scanning conveyor (9) and the output conveyor (11) are configured to move forward the object (3) placed on a supporting unit (19) mechanically detached therefore, and wherein the scanning conveyor (9) is configured to rotate the supporting unit (19) and the object (3) on themselves as they travel through the scanning area (8). The input conveyor (10) and the output conveyor (11) are fitted with shields configured in such a way as to intercept all x-rays emitted from the scanning area (8) which escape from the scanning chamber (2) towards the conveyors.

Described herein are examples of industrial radiography systems that may control, or recommend, certain parameter values of a high resolution, continuous rotation, radiographic imaging process. By controlling, or recommending, the particular parameter values, it may be possible to mitigate certain synchronization issues that occur during the high resolution, continuous rotation, radiographic imaging process. With the synchronization issues mitigated, a user may be able to perform the high resolution, continuous rotation, radiographic imaging process at a high speed, without the loss of detail and/or blur that sometimes occurs due to the synchronization issues.

A cabinet x-ray device for imaging seeds includes an x-ray source configured to transmit an x-ray beam along a beam path. A seed holder is configured to hold seeds and be selectively positioned in the x-ray device such that the beam path crosses the seed holder and the x-ray beam passes through at least some of the seeds. An x-ray detector is configured to detect the x-ray beam after passing through the seeds such that one or more x-ray images of the seeds can be formed. Self-supporting x-ray shielding can extend circumferentially around the x-ray beam to mitigate x-ray transmission outside the device. A drive mechanism can automatically move the seed holder so that discrete x-ray images of subsets of seeds are taken in an automatic seed imaging operation. Various seed evaluations and seed process evaluations can be made using the device.

An X-ray radiation imaging system is for imaging a tubular object. The X-ray radiation imaging system may include an enclosure, a motorized base to be positioned within the enclosure and configured to rotate the tubular object, and a gantry within the enclosure. The X-ray radiation imaging system may further include an X-ray source coupled to the gantry and being adjacent the motorized base. The X-ray source may be configured to irradiate the tubular object with X-ray radiation while the motorized base rotates the tubular object. The X-ray radiation imaging system may also include an X-ray detector coupled to the gantry and being adjacent the tubular object, and the X-ray detector may receive the X-ray radiation from the tubular object. The X-ray radiation imaging system may include a processor coupled to the X-ray source and the X-ray detector and configured to generate an image of the tubular object.

A system for computed tomography inspection can include a stage, a stationary radiation source, a stationary radiation detector, and a controller. The stage can secure a target thereon and rotate about a rotation axis. The radiation source can emit a beam of penetrating radiation from a focal point that is directed upon a portion of the target. The radiation detector can include a sensing face configured to acquire measurements of radiation beam intensity incident thereon as a function of position. The controller can command the stage to translate from a first position to a second position in a direction transverse to a central axis of the radiation beam. A magnification of the target at the first and second positions can be approximately equal. The stage does not translate transverse to the central axis of the radiation beam during measurement of the radiation beam intensity by the detector.

A mineral characterization method for an x-ray CT system comprises generating one or more volume datasets of a sample and identifying phases in the sample by correcting the datasets based on simulations. This can be employed with a polychromatic x-ray simulation and a highly controlled and well scaled implementation of analytical reconstruction to index materials of known composition to reconstructed grayscale intensities. An example of an application of this technology is in the field of mineral characterization on geoscience samples, where a single sample may consist of many individual mineral phases, of unknown distribution. Also addressed is a workflow for data correction and calibration such that acquisition related uncertainties are minimized and reconstructed intensity robustness maximized. This is achieved when some material of known transmission is in the field of view for every projection to create a reference path.

A multi scale material segmentation method is provided that creates markers to identify unique particles, for small and large particles independently, and then separately processes those markers.

An inspection device includes a ray source that irradiates an object to be inspected with energy rays, a detection unit that detects energy rays that have passed through the object to be inspected, a displacement mechanism that sets a relative position of the object to be inspected and the ray source by displacing at least one of the object to be inspected and the ray source in relation to the other, an internal image generation unit that generates an internal image of the object to be inspected based on a detection amount distribution of the energy rays detected by the detection unit, and a control unit that controls the displacement mechanism based on the detection amount distribution of the energy rays detected by the detection unit.

Methods and apparatus determine offcut angle of a crystalline sample using electron channeling patterns (ECPs), wherein backscattered electron intensity exhibits angular variation dependent on crystal orientation. A zone axis normal to a given crystal plane follows a circle as the sample is azimuthally rotated. On an ECP image presented with tilt angles as axes, the radius of the circle is the offcut angle of the sample. Large offcut angles are determined by a tilt technique that brings the zone axis into the ECP field of view. ECPs are produced with a scanning electron beam and a monolithic backscattered electron detector; or alternatively with a stationary electron beam and a pixelated electron backscatter diffraction detector. Applications include strain engineering, process monitoring, detecting spatial variations, and incoming wafer inspection. Methods are 40× faster than X-ray diffraction. 0.01-0.1° accuracy enables semiconductor applications.

A fluid pressure loading device applied to an industrial computed tomography scanning test system includes a body, a sample accommodating chamber and at least one fluid medium chamber being provided in the body. Each of the at least one fluid medium chamber is provided therein with a piston, the corresponding fluid medium chamber is separated into two chambers by the piston, one of the two chambers is in communication with an external hydraulic medium via oil lines provided in the body, the other of the two chambers is in communication with the sample accommodating chamber, and one end, facing towards the sample accommodating chamber, of the piston is extendable into the sample accommodating chamber. With the loading device, real-time loading of a test sample can be realized, thus improving a simulation accuracy of the system, and multi-directional loading of the sample can be realized.