A transmission type small-angle scattering device of the present invention includes a goniometer 10 including a rotation arm 11. The rotation arm 11 is freely turnable around a θ-axis extending in a horizontal direction from an origin with a vertical arrangement state of the rotation arm being defined as the origin, and has a vertical arrangement structure in which an X-ray irradiation unit 20 is installed on a lower-side end portion of the rotation arm 11, and a two-dimensional X-ray detector 30 is installed on an upper-side end portion of the rotation arm 11 to form a vertical arrangement structure.

An X-ray inspection device includes a casing including an entrance of an object to be inspected, and a door for opening and closing the entrance; an X-ray detector accommodated inside the casing, and configured to detect a stage on which the object is placed, an X-ray source configured to emit an X-ray, and the X-ray that has been emitted from the X-ray source and transmitted through the object placed on the stage; and a driving system including a moving mechanism of the stage; a communication unit connectable with a communication network; a data acquisition unit configured to acquire consumption determination data including at least one of data indicating an operating situation of the driving system or data indicating the number of times of opening and closing the door; and a data transmission unit configured to output the consumption determination data that has been acquired by the data acquisition unit to the communication network via the communication unit.

An analysis apparatus comprises: a moveable stage assembly; a sample holder on a top surface of the stage assembly; a first photon source and a first photon detector or detector array, the first photon source being configured to emit a first beam of photons that intercepts the surface of a sample at a first location on the sample and the first photon detector or detector array being configured to detect photons that are emitted from the first location; and a second photon source and a second photon detector or detector array, the second photon source being configured to emit a second beam of photons that intercepts the surface of the sample at a second location on the sample, the second location being spaced apart from the first location, and the second photon detector or detector array being configured to detect photons that are emitted from the second location.

A spectroscopic element and a detector are disposed along a circumference of one Rowland circle. The spectroscopic element has a spectral surface whose length, measured along the Rowland circle, is shorter than a length in the Rowland circle plane, of an irradiation surface irradiated with excitation beams emitted to a sample holder. The spectroscopic element and the sample holder are disposed to separate a group of characteristic X-rays within a common spectral range of the spectroscopic element.

A fast industrial CT scanning system and a method are provided. The scanning system includes X-ray sources, detectors, a rotating table, control boxes, and a control unit. The X-ray sources, the detectors, the rotating table, and the control boxes are all connected to the control unit. The rotating table is used for placing a specimen detected. Three X-ray sources are annularly and uniformly arranged at an interval of 120° by taking an axis of the rotating table as a center. Distances from the three X-ray sources to the specimen detected are equal. Each X-ray source is mounted in a corresponding control box. Three detectors are annularly and uniformly arranged at an interval of 120° by taking the axis of the rotating table as a center. Distances from the three detectors to the specimen detected are equal.

A transmission type small-angle scattering device of the present invention includes a goniometer 10 including a rotation arm 11. The rotation arm 11 is freely turnable around a θ-axis extending in a horizontal direction from an origin with a vertical arrangement state of the rotation arm 11 being defined as the origin, and has a vertical arrangement structure in which an X-ray irradiation unit 20 is installed on a lower-side end portion of the rotation arm 11, and a two-dimensional X-ray detector 30 is installed on an upper-side end portion of the rotation arm 11 to form a vertical arrangement structure.

A transmission type small-angle scattering device of the present invention includes a goniometer 10 including a rotation arm 11. The rotation arm 11 is freely turnable around a θ-axis extending in a horizontal direction from an origin with a vertical arrangement state of the rotation arm 11 being defined as the origin, and has a vertical arrangement structure in which an X-ray irradiation unit 20 is installed on a lower-side end portion of the rotation arm 11, and a two-dimensional X-ray detector 30 is installed on an upper-side end portion of the rotation arm 11 to form a vertical arrangement structure.

An imaging system that is configured to automatically obtain and provide two and three-dimensional digital images of various types of objects (e.g., tissue specimens, animals, electrical devices, etc.) for use in analysis thereof in a manner free of manual repositioning of the objects between images and free of movement of an electromagnetic radiation source and detector within or relative to a cabinet housing of the system.

An image acquisition system includes a radiation source configured to output radiation toward an object, a rotating stage configured to rotate the object around a rotation axis, a radiation camera having an input surface to which the radiation transmitted through the object is input and an image sensor capable of TDI control, and an image processing apparatus configured to generate a radiographic image of the object at an imaging plane P based on the image data. The angle formed between the rotation axis of the rotating stage and the input surface of the radiation camera is set in accordance with the FOD which is the distance between the radiation source and an imaging plane in the object. The radiation camera is configured to perform TDI control in the image sensor in synchronization with the rotational speed of the object rotated by the rotating stage.

An apparatus comprises a base plate, a first fixed post, a second fixed post, a first actuator, a second actuator, a third actuator, a first test sample grip, and a second test sample grip. The first fixed post and the second fixed post are coupled to the base plate at one side thereof. The first actuator, coupled to the first fixed post and the second fixed post, rotates a test sample along an axis that runs parallel to and halfway between the first fixed post and the second fixed post. The second actuator, coupled to the first fixed post and the second fixed post, displaces the test sample along the axis that runs parallel to and halfway between the first fixed post and the second fixed post. The third actuator, coupled to the first fixed post and the second fixed post, rotates the test sample along the axis that runs parallel to and halfway between the first fixed post and the second fixed post.