An X-ray imaging inspection system for inspecting items comprises an X-ray source 10 extending around an imaging volume 16, and defining a plurality of source points 14 from which X-rays can be directed through the imaging volume. An X-ray detector array 12 also extends around the imaging volume 16 and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor 20 is arranged to convey the items through the imaging volume 16.

An X-ray imaging inspection system for inspecting items comprises an X-ray source 10 extending around an imaging volume 16, and defining a plurality of source points 14 from which X-rays can be directed through the imaging volume. An X-ray detector array 12 also extends around the imaging volume 16 and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor 20 is arranged to convey the items through the imaging volume 16.

A simultaneous multi-elements analysis type X-ray fluorescence spectrometer according to the present invention includes: a sample table (2) on which a sample (1) is placed and a conveyance arm (22) for the sample (1). The sample table (2) has a cutout (2e) formed therein, through which the conveyance arm (22) is allowed to pass in a vertical direction. Regarding respective measurement points (Pn) on a blank wafer (1b), a background correction unit (21) previously stores, as background intensities at the measurement points (Pn), intensities obtained by subtracting a measured intensity at a reference measurement point (P0) located above the cutout (2e) from each of measured intensities at the measurement points (Pn), and regarding respective measurement points (Pn) on an analytical sample (1a), the background correction unit (21) subtracts the background intensities at the measurement points (Pn) from measured intensities at the measurement points (Pn), thereby correcting background.

In this X-ray phase imaging apparatus, at least one of a plurality of gratings is composed of a plurality of grating portions arranged along a third direction perpendicular to a first direction along which a subject or an imaging system is moved by a moving mechanism and a second direction along which an X-ray source, a detection unit, and a plurality of grating portions are arranged. The plurality of grating portions are arranged such that adjacent grating portions overlap each other when viewed in the first direction.

The X-ray inspection device includes a radiation source that irradiates X-rays toward a specimen that is rotated; a detector that detects transmitted X-rays irradiated by the radiation source, and passed through the specimen, and output a plurality of detection data for each angle of rotation; and a region extracting unit that extracts a region where the specimen is projected onto the detector, using the plurality of detection data.

The present disclosure relates to an imaging device for use in vehicle security check and a method therefor, and belongs to the field of security check. The imaging device for use in vehicle security check includes: a radiation source device including a first ray unit configured to emit a first ray beam by a first predetermined spread angle to allow the first ray beam to penetrate a first part of a vehicle to be inspected passing through an inspection lane at a preset speed; and a detector device including a first detector unit arranged corresponding to the first ray unit, and configured to receive the first ray beam. The radiation source device is at least partially arranged on the road surface of the inspection lane, and the first detector unit is arranged at a first side of the inspection lane.

This X-ray phase imaging apparatus (100) includes a controller (5) that generates a dark field image (Iv) with respect to each of a plurality of relative positions between a subject (S) and an imaging grating (G1) changed by an adjustment mechanism (3) to acquire a contrast of a region of interest (ROI) in the dark field image (Iv), and controls the adjustment mechanism (3) to adjust a relative position between the subject (S) and the imaging grating (G1) based on the acquired contrast.

An inspection device includes a ray source that irradiates an object to be inspected with energy rays, a detection unit that detects energy rays that have passed through the object to be inspected, a displacement mechanism that sets a relative position of the object to be inspected and the ray source by displacing at least one of the object to be inspected and the ray source in relation to the other, an internal image generation unit that generates an internal image of the object to be inspected based on a detection amount distribution of the energy rays detected by the detection unit, and a control unit that controls the displacement mechanism based on the detection amount distribution of the energy rays detected by the detection unit.

An electron diffraction imaging system for imaging the three-dimensional structure of a single target molecule of a sample uses an electron source that emits a beam of electrons toward the sample, and a two-dimensional detector that detects electrons diffracted by the sample and generates an output indicative of their spatial distribution. A sample support is transparent to electrons in a region in which the sample is located, and is rotatable and translatable in at least two perpendicular directions. The electron beam has an operating energy between 5 keV and 30 keV, and beam optics block highly divergent electrons to limit the beam diameter to no more than three times the size of the sample molecule and provide a lateral coherence length of at least 15 nm. An adjustment system adjusts the sample support position in response to the detector output to center the target molecule in the beam.

In some embodiments, a spectrometer analysis system may include a spectrometer having an X-ray assembly with one or more X-ray sources and one or more X-ray detectors. The spectrometer may have an electronic evaluation unit communicatively coupled to the X-ray assembly. The spectrometer analysis system may include a computing device communicatively coupled to the X-ray assembly and the electronic evaluation unit. The computing device may be configured to compare at least one of a plurality of features of a pixel spectrum received at a first time to at least one of the plurality of features of the pixel spectrum received at a second time. The spectrometer analysis system may include one or more motors communicatively coupled to the computing device and configured to adjust a distance between a sample and the spectrometer based at least in part on the comparing by the computing device.