Embodiments of the disclosure include an extended length core sample scanning apparatus that enables the imaging of extended length core samples using medical-type CT scanners. The extended length core sample scanning apparatus has a frame that defines a U-shaped receptacle that receives core housing containing the core sample when the core sample is placed in a CT scanner. The extended length core sample scanning apparatus may have two or more rollers located in the U-shaped receptacle to enable translation of the extended length core sample through a CT scanner during scanning. The rollers may also provide for a minimum clearance between the core housing and the walls of the U-shaped receptacle. Methods of imaging an extended length core sample are also provided.

A method of detecting an anomaly in a crystallographic structure, the method comprising: illuminating the structure with x-ray radiation in a known direction relative to the crystallographic orientation; positioning the structure such that its crystallographic orientation is known; detecting a pattern of the diffracted x-ray radiation transmitted through the structure; generating the simulated pattern based on the known direction relative to the crystallographic orientation; comparing the detected pattern to a simulated pattern for x-ray radiation illuminating in the known direction; and, detecting the anomaly in the crystallographic structure based on the comparison.

An X-ray detector device for a device for the X-ray inspection of products includes a first line detector with a first discrete spatial resolution, a second line detector with the same or lesser second discrete spatial resolution, and an evaluation and control unit. The first line detector is operable to capture X-radiation in a non-spectrally resolved fashion along a first capture line transverse to a product movement direction to generate first image data. The second line detector is operable to capture the X-radiation in a spectrally resolved fashion along a second capture line parallel to the first capture line to generate second image data. The evaluation and control unit is operable to evaluate the first and second image data to detect at least one predefined feature of the product with the first discrete spatial resolution by combining the items of information contained in the first and second image data.

An X-ray inspection device of the present invention includes a sample placement unit 11 for placing a sample as an inspection target therein, a sample placement unit positioning mechanism 30 for moving the sample placement unit 11, a goniometer 20 including first and second rotation members 22, 23 that rotate independently of each other, an X-ray irradiation unit 40 installed on the first rotation member 22, and a two-dimensional X-ray detector 50 installed on the second rotation member 23. The sample placement unit positioning mechanism 30 includes a χ rotation mechanism 35 for rotating the sample placement unit 11 and a ϕ-axis about a χ-axis that is orthogonal to a θs-axis and a θd-axis at a measurement point P and extends horizontally.

The X-ray imaging device (100) is provided with an X-ray source (1), a plurality of gratings, a moving mechanism (8), and an image processing unit (6). The image processing unit (6) is configured to generate a phase-contrast image (16) by associating a pixel value in each pixel of a subject (T) in a plurality of subject images (10) with phase values of a Moire fringe (30) at each pixel and aligning the pixel of the subject of the same position in the plurality of subject images.

An X-ray transmission inspection apparatus includes an X-ray source for irradiating a sample with X-rays, a two-dimensional sensor for detecting transmission X-rays passing through the sample, a sample moving mechanism for moving the sample, a calculation unit for processing an image of the transmission X-rays detected by the two-dimensional sensor, and a display unit for displaying a cross-sectional image. When V1 is a speed at which the sample moves, F is a frame rate of the two-dimensional sensor, A is a sample pitch of the two-dimensional sensor, and LS is a distance between the X-ray source and the two-dimensional sensor, the calculation unit creates a cross-sectional image taken at a distance L from the X-ray source by adding the images of the pixels positioned at an interval of [(LS×V2)/(L×F×A)] in a direction in which the sample moves.

Scanning systems may include a stator, a rotor supporting at least one radiation source and at least one radiation detector rotatable with the rotor, and a motivator operatively connected to the rotor. The stator, the rotor, the at least one radiation source, and the at least one radiation detector may be located within a housing. A conveyor system may extend through the housing and the rotor. A shielding system including a series of independently movable energy shields sized, shaped, and positioned to at least partially occlude a pathway along which the conveyor system extends may extend from an entrance to the housing, through the rotor, to an exit from the housing. A control system may be configured to cause the shielding system to automatically and dynamically move individual energy shields in response to advancement of one or more objects supported on the conveyor system.

System and method for nanoscale X-ray imaging. The imaging system comprises an electron source configured to generate an electron beam along a first direction; an X-ray source comprising a thin film anode configured to receive the electron beam at an electron beam spot on the thin film anode, and to emit an X-ray beam substantially along the first direction from a portion of the thin film anode proximate the electron beam spot, such that the X-ray beam passes through the sample specimen. The imaging apparatus further comprises an X-ray detector configured to receive the X-ray beam that passes through the sample specimen. Some embodiments are directed to an electron source that is an electron column of a scanning electron microscope (SEM) and is configured to focus the electron beam at the electron beam spot.

Scanning systems and related methods are provided. The scanning systems and methods may be computed tomography (CT) based scanning systems and methods. According to some aspects, the scanning systems have a reduced size compared to conventional scanning systems and may have similar throughput to some conventional scanning systems. According to some aspects, the scanning systems are reconfigurable into at least two scanning arrangements. Reduced size and/or reconfigurable scanning systems can allow an operator to dispose a scanning system in an environment that would not accommodate a conventional scanning system. Accordingly, the scanning systems described herein can provide enhanced security in some environments.

An X-ray imaging inspection system for inspecting items comprises an X-ray source 10 extending around an imaging volume 16, and defining a plurality of source points 14 from which X-rays can be directed through the imaging volume. An X-ray detector array 12 also extends around the imaging volume 16 and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor 20 is arranged to convey the items through the imaging volume 16.