Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The x-ray backscatter apparatus includes an x-ray source and an x-ray collimator. The x-ray collimator includes a plurality of emission apertures and a detection aperture. The x-ray backscatter apparatus further includes an x-ray intensity sensor that is fixed to the x-ray collimator over the detection aperture such that at least a portion of an uncollimated x-ray emission, collimated into the detection aperture, is detected by the x-ray intensity sensor. The x-ray backscatter apparatus additionally includes an emission alignment adjuster that is operable to adjust a position of the uncollimated x-ray emission relative to the plurality of emission apertures and the detection aperture in response to the at least the portion of the uncollimated x-ray emission detected by the x-ray intensity sensor.

A testing apparatus comprises an X-ray source, a linear array detector and a carrying platform. The linear array detector is opposite an emission port of the X-ray source, the carrying platform can move in a first direction Y, a movement trajectory of the carrying platform passes between the X-ray source and the linear array detector, and the carrying platform is configured to carry a battery to be tested. The linear array detector comprises a plurality of columns of sensing regions, which are arranged in the first direction Y.

Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The x-ray backscatter apparatus includes an x-ray source and an x-ray collimator. The x-ray collimator includes a plurality of emission apertures and a detection aperture. The x-ray backscatter apparatus further includes an x-ray intensity sensor that is fixed to the x-ray collimator over the detection aperture such that at least a portion of an uncollimated x-ray emission, collimated into the detection aperture, is detected by the x-ray intensity sensor. The x-ray backscatter apparatus additionally includes an emission alignment adjuster that is operable to adjust a position of the uncollimated x-ray emission relative to the plurality of emission apertures and the detection aperture in response to the at least the portion of the uncollimated x-ray emission detected by the x-ray intensity sensor.

A control device includes an acquisition unit configured to acquire X-ray transmission images of a jig and a target object using an image acquisition device that radiates X-rays to the target object and captures an image of the X-rays passing through the target object to acquire an X-ray transmission image, a specification unit configured to specify image characteristics of the X-ray transmission image of the jig, a selection unit configured to select a trained model on the basis of the image characteristics from a plurality of trained models constructed through machine training in advance using image data, and a processing unit configured to execute image processing for removing noise from the X-ray transmission image of the target object using the selected trained model.

A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.

A system for inspecting an object, includes: a source of X-ray radiation; a horizontal array of detectors, wherein the source and the array of detectors are positioned substantially on a first plane; a platform configured to rotate as well as translate in a vertical trajectory, wherein the platform is positioned on a second plane between the source and the array of detectors, and wherein the object is disposed on the platform; and a computing device configured to: cause the source to fire a substantially horizontal fan beam in a third plane, wherein the third plane is above a top of the object; acquire calibration data from the array of detectors while the third plane is above the top of the object; cause the platform to simultaneously rotate and raise the object vertically upwards; acquire scan data of the object; and generate a three dimensional scan image of the object.