An optical sensor having one or more sensing interference elements is disclosed. A first detector function generates a coarse optical path difference signal for example using a discrete Fourier transform of a detected interference spectrum, and a second detector function generates a refined optical path difference signal using the coarse optical path difference signal and for example a cross correlation of the interference spectrum with one or more sets of periodic transfer functions.

Disclosed is a multi-axis atom interferometer system, including a source of cold atoms, a laser source generating a first light pulse configured in such a way as to spatially split the source of cold atoms into a first cloud of atoms propagating along a first trajectory along a first axis and a second cloud of atoms propagating along a second trajectory along a second axis, a second light pulse adapted to spatially deflect the first trajectory along the second axis and simultaneously the second trajectory along the first axis towards a first point and a last light pulse adapted to recombine the at least one part of the first cloud of atoms and the at least one part of the second cloud of atoms at the first point, and a detection system measuring an interferometric phase-shift accumulated between the first light pulse and the last light pulse.

Disclosed is a multi-axis atom interferometer system, including a source of cold atoms, a laser source generating a first light pulse configured in such a way as to spatially split the source of cold atoms into a first cloud of atoms propagating along a first trajectory along a first axis and a second cloud of atoms propagating along a second trajectory along a second axis, a second light pulse adapted to spatially deflect the first trajectory along the second axis and simultaneously the second trajectory along the first axis towards a first point and a last light pulse adapted to recombine the at least one part of the first cloud of atoms and the at least one part of the second cloud of atoms at the first point, and a detection system measuring an interferometric phase-shift accumulated between the first light pulse and the last light pulse.

Atom-scale particles, e.g., neutral and charged atoms and molecules, are pre-cooled, e.g., using magneto-optical traps (MOTs), to below 100 μK to yield cold particles. The cold particles are transported to a sensor cell which cools the cold particles to below 1 μK using an optical trap; these particles are stored in a reservoir within an optical trap within the sensor cell so that they are readily available to replenish a sensor population of particles in quantum superposition. A baffle is disposed between the MOTs and the sensor cell to prevent near-resonant light leaking from the MOTs from entering the sensor cell (and exciting the ultra-cold particles in the reservoir). The transporting from the MOTs to the sensor cell is effected by moving optical fringes of optical lattices and guiding the cold particles attached to the fringes along a meandering path through the baffle and into the sensor cell.

An optomechanical device optomechanical device for stabilizing an optomechanical resonator comprising a circuit configured to generate a first optical signal and a second optical signal, modulate the first optical signal, modulate the second optical signal, and combine the first optical signal and the second optical signal into a combined optical signal to direct the combined optical signal into an assembly. An inner sidewall of a first beam structure of the assembly has a first inner spatial frequency correspond to a second inner spatial frequency of an inner sidewall of a second beam structure of the assembly and an outer sidewall of the first beam structure has a first outer spatial frequency correspond to a second outer spatial frequency of an outer sidewall of the second beam structure.

An optomechanical device optomechanical device for stabilizing an optomechanical resonator comprising a circuit configured to generate a first optical signal and a second optical signal, modulate the first optical signal, modulate the second optical signal, and combine the first optical signal and the second optical signal into a combined optical signal to direct the combined optical signal into an assembly. An inner sidewall of a first beam structure of the assembly has a first inner spatial frequency correspond to a second inner spatial frequency of an inner sidewall of a second beam structure of the assembly and an outer sidewall of the first beam structure has a first outer spatial frequency correspond to a second outer spatial frequency of an outer sidewall of the second beam structure.

An optomechanical inertial reference minor combines an optomechanical resonator with a reflector that serves as an inertial reference for an atom interferometer. The optomechanical resonator is optically monitored to obtain a first inertial measurement of the reflector that features high bandwidth and high dynamic range. The atom interferometer generates a second inertial measurement of the reflector that features high accuracy and stability. The second inertial measurement corrects for drift of the first inertial measurement, thereby resulting in a single inertial measurement of the reflector having high bandwidth, high dynamic range, excellent long-term stability, and high accuracy. The reflector may be bonded to the resonator, or formed directly onto a test mass of the resonator. With a volume of less than one cubic centimeter, the optomechanical inertial reference minor is particularly advantageous for portable atomic-based sensors and systems.

An optomechanical inertial reference minor combines an optomechanical resonator with a reflector that serves as an inertial reference for an atom interferometer. The optomechanical resonator is optically monitored to obtain a first inertial measurement of the reflector that features high bandwidth and high dynamic range. The atom interferometer generates a second inertial measurement of the reflector that features high accuracy and stability. The second inertial measurement corrects for drift of the first inertial measurement, thereby resulting in a single inertial measurement of the reflector having high bandwidth, high dynamic range, excellent long-term stability, and high accuracy. The reflector may be bonded to the resonator, or formed directly onto a test mass of the resonator. With a volume of less than one cubic centimeter, the optomechanical inertial reference minor is particularly advantageous for portable atomic-based sensors and systems.

An acceleration measuring device includes a housing with an inner cavity, a reference substance disposed in the inner cavity, an elastic supporting member connected between the bottom portion of the inner cavity and the reference substance, a light source secured to a side of the reference substance, a lens secured to the reference substance that is positioned at a side of the light source away from the reference substance, an image sensor at a top portion of the inner cavity and located at a side of the lens away from the reference substance for receiving light emitted by the light source and scattered by the lens, and a processor configured to calculate displacement information of the reference substance in a vertical direction according to light received by the image sensor, and calculate an acceleration of the reference substance according to the displacement information.

An acceleration measuring device includes a housing with an inner cavity, a reference substance disposed in the inner cavity, an elastic supporting member connected between the bottom portion of the inner cavity and the reference substance, a light source secured to a side of the reference substance, a lens secured to the reference substance that is positioned at a side of the light source away from the reference substance, an image sensor at a top portion of the inner cavity and located at a side of the lens away from the reference substance for receiving light emitted by the light source and scattered by the lens, and a processor configured to calculate displacement information of the reference substance in a vertical direction according to light received by the image sensor, and calculate an acceleration of the reference substance according to the displacement information.